Works (171)

2019 journal article

Combined interpolation, scale change, and noise reduction in spectral analysis

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 37(5).

By: V. Le, T. Kim, Y. Kim & D. Aspnes

Sources: Web Of Science, ORCID
Added: November 18, 2019

2019 journal article

Dielectric Functions and Critical Points of GaAsSb Alloys

JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 74(6), 595–599.

By: T. Kim, H. Park, J. Byun, V. Le, H. Nguyen, X. Nguyen, Y. Kim, J. Song, D. Aspnes

Sources: Web Of Science, ORCID
Added: April 9, 2019

2019 journal article

Linear and nonlinear filtering of spectra

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 37(5).

By: D. Aspnes, V. Le & Y. Kim

Sources: Web Of Science, ORCID
Added: November 18, 2019

2016 journal article

Liquid gallium and the eutectic gallium indium (EGaIn) alloy: Dielectric functions from 1.24 to 3.1 eV by electrochemical reduction of surface oxides

Applied Physics Letters, 109(9).

By: D. Morales, N. Stoute, Z. Yu, D. Aspnes & M. Dickey

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2015 conference paper

Bond models in linear and nonlinear optics

In Ultrafast nonlinear imaging and spectroscopy iii (Vol. 9584).

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2015 journal article

Exciton-dominated dielectric function of atomically thin MoS2 films

Scientific Reports, 5.

By: Y. Yu, Y. Yu, Y. Cai, W. Li, A. Gurarslan, H. Peelaers, D. Aspnes, C. Walle ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2015 article

Manuel Cardona Castro obituary

Physics Today.

By: J. Rowe, D. Aspnes, A. Pinczuk & P. Yu

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2014 journal article

Combined direct- and reciprocal-space approach for converting spectra to energy scales with negligible loss of information

Thin Solid Films, 571, 506–508.

By: D. Aspnes & S. Choi

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2014 journal article

Dielectric functions and interband transitions of InxAl1 (-) P-x alloys

Current Applied Physics, 14(9), 1273–1276.

By: T. Kim, S. Hwang, J. Byun, D. Aspnes, E. Lee, J. Song, C. Liang, Y. Chang ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2014 journal article

Parameterization of the dielectric functions of InGaSb alloys

Current Applied Physics, 14(5), 768–771.

By: T. Kim, J. Byun, S. Hwang, H. Park, Y. Kang, J. Park, Y. Kim, D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2014 journal article

Spectroscopic ellipsometry - Past, present, and future

Thin Solid Films, 571, 334–344.

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2013 journal article

Analytic representation of the dielectric functions of InAsxSb1-x alloys in the parametric model

Thin Solid Films, 547, 276–279.

By: S. Hwang, T. Kim, J. Byun, N. Barange, M. Diware, Y. Kim, D. Aspnes, J. Yoon, J. Song

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2013 journal article

Interband transitions and dielectric functions of InGaSb alloys

Applied Physics Letters, 102(10).

By: T. Kim, J. Yoon, J. Byun, S. Hwang, D. Aspnes, S. Shin, J. Song, C. Liang ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2013 journal article

Shallow acceptor complexes in p-type ZnO

Applied Physics Letters, 102(15).

By: J. Reynolds, C. Reynolds, A. Mohanta, J. Muth, J. Rowe, H. Everitt, D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2013 journal article

Spectroscopic ellipsometry-A perspective

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 31(5).

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2012 journal article

Control of the oxidation kinetics of H-terminated (111)Si by using the carrier concentration and the strain: a second-harmonic-generation investigation

Journal of the Korean Physical Society, 60(10), 1685–1689.

By: B. Gokce, K. Gundogdu & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2012 journal article

Optical and structural characterization of epitaxial graphene on vicinal 6H-SiC(0001)-Si by spectroscopic ellipsometry, Auger spectroscopy, and STM

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 30(4).

By: F. Nelson, A. Sandin, D. Dougherty, D. Aspnes, J. Rowe & A. Diebold

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2011 journal article

Above-band-gap dielectric functions of ZnGeAs2: Ellipsometric measurements and quasiparticle self-consistent GW calculations

Physical Review. B, Condensed Matter and Materials Physics, 83(23).

By: S. Choi, M. Schilfgaarde, D. Aspnes, A. Norman, J. Olson, T. Peshek, D. Levi

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2011 conference paper

Back-reflection second-harmonic generation of (111)Si: Theory and experiment

In Journal of the Korean Physical Society (Vol. 58, pp. 1237–1243).

By: B. Gokce, K. Gundogdu, E. Adles & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2011 journal article

Bond-specific reaction kinetics during the oxidation of (111) Si: Effect of n-type doping

Applied Physics Letters, 98(2).

By: B. Gokce, D. Aspnes, G. Lucovsky & K. Gundogdu

Source: NC State University Libraries
Added: August 6, 2018

2011 journal article

Effect of strain on bond-specific reaction kinetics during the oxidation of H-terminated (111) Si

Applied Physics Letters, 98(12).

By: B. Gokce, D. Aspnes & K. Gundogdu

Source: NC State University Libraries
Added: August 6, 2018

2011 conference paper

Measurement and control of in-plane surface chemistry during oxidation of H-terminated (111)Si

In Physics of semiconductors: 30th international conference on the physics of semiconductors (Vol. 1399).

By: B. Gokce, E. Adles, D. Aspnes & K. Gundogdu

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2011 conference paper

Plasmonics and effective-medium theories

In Thin Solid Films (Vol. 519, pp. 2571–2574).

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2011 conference paper

Roughness analysis of the critical dimension by using spectroscopic ellipsometry

In Journal of the Korean Physical Society (Vol. 58, pp. 1426–1428).

By: T. Ghong, S. Han, J. Chung, J. Byun, Y. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2010 conference paper

Bond models in linear and nonlinear optics

In Physica Status Solidi. B, Basic Solid State Physics (Vol. 247, pp. 1873–1880).

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2010 conference paper

Chemical-etch-assisted growth of epitaxial zinc oxide

In Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films (Vol. 28, pp. 689–692).

By: E. Adles & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2010 journal article

Dielectric functions and interband transitions of In1-xAlxSb alloys

Applied Physics Letters, 97(11).

By: J. Yoon, T. Kim, Y. Jung, D. Aspnes, Y. Kim, H. Kim, Y. Chang, S. Shin, J. Song

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2010 journal article

Ellipsometric study of single-crystal gamma-InSe from 1.5 to 9.2 eV

Applied Physics Letters, 96(18).

By: S. Choi, D. Aspnes, A. Fuchser, C. Martinez-Tomas, V. Sanjose & D. Levi

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2010 journal article

Measurement and control of in-plane surface chemistry during the oxidation of H-terminated (111) Si

Proceedings of the National Academy of Sciences, 107(41), 17503–17508.

By: B. Gokce, E. Adles, D. Aspnes & K. Gundogdu

Sources: NC State University Libraries, Crossref, ORCID
Added: August 6, 2018

2010 journal article

Nondestructive analysis of coated periodic nanostructures from optical data

Optics Letters, 35(5), 733–735.

By: T. Ghong, S. Han, J. Chung, J. Byun, T. Kim, D. Aspnes, Y. Kim, I. Park, Y. Kim

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2010 journal article

Thickness inhomogeneities and growth mechanisms of GaP heteroepitaxy by organometallic chemical vapor deposition

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 28(4), 583–589.

By: X. Liu & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2009 journal article

Follow the light: Ellipsometry and polarimetry

Physics Today, 62(5), 70–71.

By: H. Arwin & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2009 journal article

Interband transitions of InAsxSb1-x alloy films

Applied Physics Letters, 95(11).

By: T. Kim, J. Yoon, S. Hwang, D. Aspnes, Y. Kim, H. Kim, Y. Chang, J. Song

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2009 journal article

Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films

Optics Letters, 34(18), 2867–2869.

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 journal article

Analysis of interface layers by spectroscopic ellipsometry

Applied Surface Science, 255(3), 640–642.

By: T. Kim, J. Yoon, Y. Kim, D. Aspnes, M. Klein, D. Ko, Y. Kim, V. Elarde, J. Coleman

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 journal article

Application of the anisotropic bond model to second-harmonic generation from amorphous media

Physical Review. B, Condensed Matter and Materials Physics, 77(16).

By: E. Adles & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 journal article

Dependence of plasmon polaritons on the thickness of indium tin oxide thin films

Journal of Applied Physics, 103(9).

Source: NC State University Libraries
Added: August 6, 2018

2008 journal article

Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters

Physica Status Solidi. A, Applications and Materials Science, 205(4), 884–887.

By: S. Choi, D. Aspnes, N. Stoute, Y. Kim, H. Kim, Y. Chang, C. Palmstrom

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 journal article

Model dielectric functions for AlxGa1-xAs alloys of arbitrary compositions

Journal of Applied Physics, 104(1).

By: Y. Jung, T. Kim, J. Yoon, Y. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 patent

Normal incidence rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2008 journal article

Optical properties of InxAl1-xAs alloy films

Applied Physics Letters, 92(15).

By: J. Yoon, T. Ghong, J. Byun, Y. Kim, D. Aspnes, H. Kim, Y. Chang, J. Song

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 journal article

Overlayer effects in the critical-point analysis of ellipsometric spectra: Application to InxGa1-xAs alloys

Journal of Applied Physics, 103(7).

By: T. Ghong, T. Kim, Y. Jung, Y. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 journal article

The anisotropic bond model of nonlinear optics

Physica Status Solidi (a), 205(4), 728–731.

By: E. Adles & D. Aspnes

Sources: NC State University Libraries, Crossref, ORCID
Added: August 6, 2018

2008 journal article

The nearly aligned rotating-monoplate compensator

Physica Status Solidi. A, Applications and Materials Science, 205(4), 739–742.

By: M. Asar & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 journal article

Thickness inhomogenities in the organometallic chemical vapor deposition of GaP

Applied Physics Letters, 93(20).

By: X. Liu & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2007 journal article

Analytic determination of n, k, and d of an absorbing film from polarimetric data in the thin-film limit

Journal of Applied Physics, 101(3).

By: I. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2007 journal article

Dielectric functions and electronic structure of InAsxP1-x films on InP

Applied Physics Letters, 91(4).

By: S. Choi, C. Palmstrom, Y. Kim, D. Aspnes, H. Kim & Y. Chang

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2007 journal article

Effect of overlayers on critical-point parameters in the analysis of ellipsometric spectra

Applied Physics Letters, 91(12).

By: Y. Jung, T. Ghong, Y. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2007 journal article

Initial stages of GaP heteroepitaxy on nanoscopically roughened (001)SI

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 25(4), 1448–1452.

By: X. Liu, I. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2007 journal article

Investigation of effective-medium approximation, alloy, average-composition, and graded-composition models for interface analysis by spectroscopic ellipsometry

Journal of Applied Physics, 102(6).

By: T. Kim, T. Ghong, Y. Kim, D. Aspnes, M. Klein, D. Ko, Y. Kim, V. Elarde, J. Coleman

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2007 patent

Normal incidence rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2007 article

Suppression of Jahn-Teller term-split band edge states in the X-ray absorption spectra of non-crystalline Zr silicates and Si oxynitride alloys, and alloys of ZrO2 with Y2O3 (vol 75, pg 1591, 2006)

Radiation Physics and Chemistry.

By: G. Lucovsky, C. Fulton, B. Ju, N. Stoute, H. Seo, D. Aspnes, J. Luning

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2006 journal article

Interface analysis of an AlGaAs multilayer system by using spectroscopic ellipsometry

Journal of the Korean Physical Society, 48(6), 1601–1605.

By: T. Ghong, Y. Kim, D. Aspnes, M. Klein, D. Ko, Y. Kim, V. Elarde, J. Coleman

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

Systematic approach for analyzing reflectance-difference spectra: Application to silicon-dielectric interfaces

Applied Physics Letters, 88(20).

By: M. Brinkley, G. Powell & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2006 journal article

Toward n kappa d spectroscopy: Analytic solution of the three-phase model of polarimetry in the thin-film limit

Applied Physics Letters, 88(20).

By: I. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2005 journal article

Conduction band states of transition metal (TM) high-k gate dielectrics as determined from X-ray absorption spectra

Microelectronics Reliability, 45(06-May), 827–830.

By: G. Lucovsky, J. Hong, C. Fulton, N. Stoute, Y. Zou, R. Nemanich, D. Aspnes, H. Ade, D. Schlom

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2005 journal article

Dielectric functions of AlxGa1-xSb (0.00 <= x <= 0.39) alloys from 1.5 to 6.0 eV

Journal of Applied Physics, 98(10).

By: S. Choi, C. Palmstrom, Y. Kim, S. Cooper & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2005 journal article

Dipole-radiation model for terahertz radiation from semiconductors

Applied Physics Letters, 86(21).

By: H. Peng & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2005 journal article

Optical properties of (GaSb)(3n)(AlSb)(n) (1 <= n <= 5) superlattices

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 23(3), 1149–1153.

By: S. Choi, S. Srivastava, C. Palmstrom, Y. Kim, S. Cooper & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2005 article

Real-time diagnostics for metalorganic vapor phase epitaxy

Physica Status Solidi. B, Basic Solid State Physics.

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2005 journal article

Relative bulk and interface contributions to optical second-harmonic generation in silicon

Physical Review. B, Condensed Matter and Materials Physics, 72(20).

By: H. Peng, E. Adles, J. Wang & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 journal article

Biplate artifacts in rotating-compensator ellipsometers

Thin Solid Films, 455-56(2004 May 1), 779–783.

By: K. Ebert & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Calculation of bulk third-harmonic generation from crystalline Si with the simplified bond hyperpolarizability model

Physical Review. B, Condensed Matter and Materials Physics, 70(16).

By: H. Peng & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 journal article

Comparison of the capabilities of rotating-analyzer and rotating-compensator ellipsometers by measurements on a single system

Thin Solid Films, 455-56(2004 May 1), 33–38.

By: T. Mori & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 journal article

Expanding horizons: new developments in ellipsometry and polarimetry

Thin Solid Films, 455-56(2004 May 1), 13-.

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 journal article

Integrated rotating-compensator polarimeter for real-time measurements and analysis of organometallic chemical vapor deposition

Thin Solid Films, 455-56(2004 May 1), 639–644.

By: K. Flock, S. Kim, M. Asar, I. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 journal article

Optical anisotropy relevant to rotating-compensator polarimeters: application to the monoplate retarder

Thin Solid Films, 455-56(2004 May 1), 50–53.

By: M. Asar & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 journal article

Optical properties of Cd1-xMgxTe (x=0.00, 0.23, 0.31, and 0.43) alloy films

Applied Physics Letters, 84(5), 693–695.

By: Y. Ihn, T. Kim, Y. Kim, D. Aspnes & J. Kossut

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 journal article

Optimizing precision of rotating-analyzer and rotating-compensator-ellipsometers

Journal of the Optical Society of America. A, Optics, Image Science, and Vision, 21(3), 403–410.

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 journal article

Parametric modeling of the dielectric functions of Cd1-xMgxTe alloy films

Thin Solid Films, 455-56(2004 May 1), 222–227.

By: Y. Ihn, T. Kim, T. Ghong, Y. Kim, D. Aspnes & J. Kossut

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 journal article

Real-time characterization of GaSb homo- and heteroepitaxy

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 22(4), 2233–2239.

By: S. Kim, K. Flock, M. Asar, I. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 journal article

Spectroscopic ellipsometric analysis of interfaces: Comparison of alloy and effective-medium-approximation approaches to a CdMgTe multilayer system

Applied Physics Letters, 85(6), 946–948.

By: T. Ghong, T. Kim, Y. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2003 journal article

Application of the simplified bond-hyperpolarizability model to fourth-harmonic generation

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 21(4), 1798–1803.

By: J. Hansen, H. Peng & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2003 patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Dielectric functions of Cd1-xMgxTe alloy films by uusing spectroscopic ellipsometry

Journal of the Korean Physical Society, 43(4), 634–637.

By: Y. Ihn, T. Kim, Y. Kim, D. Aspnes & J. Kossut

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Dielectric functions of InxGa1-xAs alloys

Physical Review. B, Condensed Matter and Materials Physics, 68(11).

By: T. Kim, T. Ghong, Y. Kim, S. Kim, D. Aspnes, T. Mori, T. Yao, B. Koo

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2003 journal article

Optical properties of InGaAs alloy films in the E-2 region by spectroscopic ellipsometry

Journal of the Korean Physical Society, 42(2003 Feb), S242–245.

By: Y. Ihn, T. Ghong, Y. Kim, S. Kim, D. Aspnes, T. Yao, B. Koo

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Simplified bond-hyperpolarizability model of second- and fourth-harmonic generation: application to Si-SiO2 interfaces

Physica Status Solidi. B, Basic Solid State Physics, 240(3), 509–517.

By: D. Aspnes, J. Hansen, H. Peng, G. Powell & J. Wang

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2003 journal article

Study of the dielectric function of ZnS by spectroscopic ellipsometry

Journal of the Korean Physical Society, 42(2003 Feb), S238–241.

By: T. Ghong, T. Kim, Y. Kim, S. Kim, D. Aspnes, Y. Choi, Y. Yu

Source: NC State University Libraries
Added: August 6, 2018

2002 patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Pseudodielectric function of ZnGeP2 from 1.5 to 6 eV

Applied Physics Letters, 81(4), 628–630.

By: V. Blickle, K. Flock, N. Dietz & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2002 journal article

Pseudodielectric functions of InGaAs alloy films grown on InP

Applied Physics Letters, 81(13), 2367–2369.

By: T. Kim, Y. Ihn, Y. Kim, S. Kim, D. Aspnes, T. Yao, K. Shim, B. Koo

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2002 journal article

Simplified bond-hyperpolarizability model of second harmonic generation

Physical Review. B, Condensed Matter and Materials Physics, 65(20), 205320–1.

By: G. Powell, J. Wang & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2002 journal article

Simplified bond-hyperpolarizability model of second harmonic generation: Application to Si-dielectric interfaces

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1699–1705.

By: J. Wang, G. Powell, R. Johnson, G. Lucovsky & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2002 patent

Thin film optical measurement system and method with calibrating ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, J. Opsal & J. Faton

Source: NC State University Libraries
Added: August 6, 2018

2001 journal article

Above bandgap optical properties of ZnS and ZnS1-xTex alloys grown by using hot-wall epitaxy

Journal of the Korean Physical Society, 39(3), 462–465.

By: C. Bang, M. Lee, T. Kim, Y. Kim, D. Aspnes, Y. Yu, B. O, Y. Choi

Source: NC State University Libraries
Added: August 6, 2018

2001 patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2001 journal article

Elimination of endpoint-discontinuity artifacts in the analysis of spectra in reciprocal space

Journal of Applied Physics, 89(12), 8183–8192.

By: S. Yoo & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2001 patent

Ellipsometer and polarimeter with zero-order plate compensator

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Law

Source: NC State University Libraries
Added: August 6, 2018

2001 journal article

Investigation and control of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Physica Status Solidi. A, Applications and Materials Science, 184(1), 79–87.

By: M. Ebert, K. Bell, K. Flock & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2001 journal article

Investigation of noise in a spectrometer system using a short-arc source

Review of Scientific Instruments, 72(8), 3477–3479.

By: M. Ebert & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2001 journal article

Linear and nonlinear optical spectroscopy of surfaces and interfaces

Physica Status Solidi. A, Applications and Materials Science, 188(4), 1353–1360.

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2001 article

Nondestructive measurement of a glass transition temperature at spin-cast semicrystalline polymer surfaces

Macromolecules.

By: J. Hyun, D. Aspnes & J. Cuomo

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2001 journal article

Ordinary and extraordinary dielectric functions of 4H-and 6H-SiC from 3.5 to 9.0 eV

Applied Physics Letters, 78(18), 2715–2717.

By: O. Lindquist, K. Jarrendahl, S. Peters, J. Zettler, C. Cobet, N. Esser, D. Aspnes, A. Henry, N. Edwards

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2001 journal article

Spectroscopic ellipsometric study of the dielectric function of ZnSe and its overlayer

Journal of the Korean Physical Society, 39(2001 Dec), S372–375.

By: T. Kim, M. Koo, M. Lee, Y. Kim, D. Aspnes & B. Jonker

Source: NC State University Libraries
Added: August 6, 2018

2001 journal article

Spectroscopic ellipsometry study of InGaAs alloy films grown on InP

Journal of the Korean Physical Society, 39(2001 Dec), S389–392.

By: G. Seong, C. Bang, Y. Kim, J. Wang, D. Aspnes, B. Koo, T. Yao

Source: NC State University Libraries
Added: August 6, 2018

2001 patent

Thin film optical measurement system and method with calibrating ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, J. Opsal & J. Faton

Source: NC State University Libraries
Added: August 6, 2018

2000 patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Characterization of AlxGa1-xN-compound layers by reflectance difference spectroscopy

Physica Status Solidi. A, Applications and Materials Science, 177(1), 157–163.

By: U. Rossow & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

Coherence effects and time dependences of the optical response of surfaces and interfaces of optically absorbing materials

Physica Status Solidi. B, Basic Solid State Physics, 220(1), 709–715.

By: D. Aspnes, L. Mantese, K. Bell & U. Rossow

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

Dielectric function and bowing parameter of Zn1-xMgxSe and Zn1- xBexSe alloys

Journal of the Korean Physical Society, 37(6), 1012–1016.

By: H. Lee, I. Kim, J. Powell, D. Aspnes, S. Lee, F. Peiris, J. Furdyna

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

Dielectric function of epitaxial ZnSe films

Applied Physics Letters, 77(21), 3364–3366.

By: M. Koo, T. Kim, M. Lee, M. Oh, Y. Kim, S. Yoo, D. Aspnes, B. Jonker

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

Effect of Ar+ ion beam in the process of plasma surface modification of PET films

Journal of Applied Polymer Science, 77(8), 1679–1683.

By: N. Libraries

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

High-resolution spectroscopy with reciprocal-space analysis: Application to isotopically pure Si

Physica Status Solidi. B, Basic Solid State Physics, 220(1), 117–125.

By: S. Yoo, D. Aspnes, L. Lastras-Martinez, T. Ruf, M. Konuma & M. Cardona

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Thin Solid Films, 364(1-2), 22–27.

By: M. Ebert, K. Bell, S. Yoo, K. Flock & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

Isotopic effects on the dielectric response of Si around the E- 1 gap

Physical Review. B, Condensed Matter and Materials Physics, 61(19), 12946–12951.

By: L. Lastras-Martinez, T. Ruf, M. Konuma, M. Cardona & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 patent

Method of reducing noise generated by arc lamps in optical systems employing slits

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & M. Ebert

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Optical characterization of wide bandgap semiconductors

Thin Solid Films, 364(1-2), 98–106.

By: N. Edwards, M. Bremser, A. Batchelor, I. Buyanova, L. Madsen, S. Yoo, T. Welhkamp, K. Wilmers ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

Optical properties of AlxGa1-xP (0 <= x <= 0.52) alloys

Journal of Applied Physics, 87(3), 1287–1290.

By: S. Choi, Y. Kim, S. Yoo, D. Aspnes, D. Woo & S. Kim

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

Real-time assessment of over layer removal on 4H-SiC surfaces: Techniques and relevance to contact formation

Materials Science Forum, 338(3), 1033–1036.

By: N. Edwards, L. Madsen, K. Robbie, G. Powell, K. Jarrendahl, C. Cobet, N. Esser, W. Richter, D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

Real-time assessment of selected surface preparation regimens for 4H-SiC surfaces using spectroscopic ellipsometry

Surface Science, 464(1), L703–707.

By: N. Edwards, K. Jarrendahl, D. Aspnes, K. Robbie, G. Powell, C. Cobet, N. Esser, W. Richter, L. Madsen

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 18(4), 1184–1189.

By: K. Bell, M. Ebert, S. Yoo, K. Flock & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor

Journal of Electronic Materials, 29(1), 106–111.

By: K. Bell, M. Ebert, S. Yoo, K. Flock & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

Surface-induced optical anisotropy of Si and Ge

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 18(4), 2229–2231.

By: U. Rossow, L. Mantese & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 journal article

Visible-near ultraviolet ellipsometric study of Zn1-xMgxSe and Zn1-xBexSe alloys

Journal of Applied Physics, 88(2), 878–882.

By: H. Lee, I. Kim, J. Powell, D. Aspnes, S. Lee, F. Peiris, J. Furdyna

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 journal article

Analysis of high-index Si(001) surfaces by reflectance difference spectroscopy

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 17(4), 1652–1656.

By: L. Mantese, Q. Xue, T. Sakurai & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Comment on 'Ab initio calculation of excitonic effects in the optical spectra of semiconductors'

Physical Review Letters, 83(19), 3970.

By: M. Cardona, L. Lastras-Martinez & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 journal article

Dielectric function of Cd0.57Mg0.43Te alloy film studied by ellipsometry

Journal of the Korean Physical Society, 34(1999 June), S496–498.

By: T. Kim, Y. Kim, S. Yoo, D. Aspnes & J. Kossut

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

High-resolution spectroscopy with reciprocal-space analysis

Physica Status Solidi. B, Basic Solid State Physics, 215(1), 715–723.

By: D. Aspnes & S. Yoo

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 journal article

Photon-induced localization in optically absorbing materials

Physics Letters. A, 253(1-2), 93–97.

By: L. Mantese, K. Bell, D. Aspnes & U. Rossow

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 journal article

Proximal electromagnetic shear forces

Journal of Microscopy, 196(1), 59–60.

By: E. Ayars, D. Aspnes, P. Moyer & M. Paesler

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 journal article

Relaxation phenomena in GaN/ AlN/ 6H-SiC heterostructures

MRS Internet Journal of Nitride Semiconductor Research, 4S1(G3.78).

By: N. Edwards, A. Batchelor, I. Buyanova, L. Madsen, M. Bremser, R. Davis, D. Aspnes, B. Monemar

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 patent

Thin film optical measurement system and method with calibrating ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, J. Opsal & J. Faton

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Analysis of optical spectra by Fourier methods

Thin Solid Films, 313(1998 Feb.), 143–148.

By: S. Yoo, N. Edwards & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 journal article

Analytic representations of the dielectric functions of crystalline and amorphous Si and crystalline Ge for very large scale integrated device and structural modeling

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 16(1998), 1654–1657.

By: J. Leng, J. Opsal, H. Chu, M. Senko & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 journal article

Analytic representations of the dielectric functions of materials for device and structural modeling

Thin Solid Films, 313-314(1998), 132–136.

By: J. Leng, J. Opsal, H. Chu, M. Senko & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 journal article

Broadband spectral operation of a rotating-compensator ellipsometer

Thin Solid Films, 313-314(1998), 58–62.

By: J. Opsal, J. Fanton, J. Chen, J. Leng, L. Wei, C. Uhrich, M. Senko, C. Zaiser, D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 journal article

Interpretation of critical point energy shifts in crystalline Si by near-surface localization of excited electronic states

Thin Solid Films, 313(1998 Feb.), 557–560.

By: L. Mantese, K. Bell, U. Rossow & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 journal article

Lineshapes of surface induced optical anisotropy spectra measured by RDS/RAS

Applied Surface Science, 123-124(1998 Jan.), 237–242.

By: U. Rossow, L. Mantese & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 journal article

Many-body and correlation effects in surface and interface spectra of optically absorbing materials

Physica Status Solidi. A, Applications and Materials Science, 170(2), 199–210.

By: D. Aspnes, L. Mantese, K. Bell & U. Rossow

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Optical approaches for controlling epitaxial growth

Applied Surface Science, 132(1998 June), 367–376.

By: D. Aspnes & N. Dietz

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 journal article

Optical characterization of GaAs/AlAs short period superlattices

Microelectronic Engineering, 43-4(1998 Aug.), 265–270.

By: D. Woo, I. Han, W. Choi, S. Lee, H. Kim, J. Lee, S. Kim, K. Kang ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 journal article

Photon-induced localization and final-state correlation effects in optically absorbing materials

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 16(4), 2367–2372.

By: D. Aspnes, L. Mantese, K. Bell & U. Rossow

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 journal article

Reflectance difference spectroscopy (RDS) spectra of clean (3 x 2), (2 x 1), and c(2 x 2) 3C-SiC(001) surfaces: New evidence for surface state contributions to optical anisotrospectra

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 16(4), 2355–2357.

By: U. Rossow, K. Lindner, M. Lubbe, D. Aspnes & D. Zahn

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 journal article

Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films

Thin Solid Films, 313(1998 Feb.), 187–192.

By: N. Edwards, S. Yoo, M. Bremser, M. Horton, N. Perkins, T. Weeks, H. Liu, R. Stall ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 journal article

Systematic differences among nominal reference dielectric function spectra for crystalline Si as determined by spectroscopic ellipsometry

Thin Solid Films, 313(1998 Feb.), 161–166.

By: K. Bell, L. Mantese, U. Rossow & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 patent

Thin film optical measurement system and method with calibrating ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, J. Opsal & J. Faton

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Trends in residual stress for GaN/AlN/6H-SiC heterostructures

Applied Physics Letters, 73(19), 2808–2810.

By: N. Edwards, M. Bremser, R. Davis, A. Batchelor, S. Yoo, C. Karan, D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 journal article

Above bandgap dielectric function of epitaxial ZnSe layers

Journal of the Korean Physical Society, 31(4), L553–555.

By: Y. Kim, Y. Ko, S. Choi, S. Yoo, D. Aspnes & B. Jonker

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Ellipsometric studies of Cd(1-x)Mg(x)Te (0 less than or equal to x less than or equal to 0.5) alloys

Applied Physics Letters, 71(2), 249–251.

By: S. Choi, Y. Kim, S. Yoo, A. Duk, M. David E., . I., A. Ramdas

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 journal article

Evidence of near-surface localization of excited electronic states in crystalline Si

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 15(4), 1196–1200.

By: L. Mantese, K. Bell, U. Rossow & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 journal article

Growth, doping and characterization of Al(x)Ga(1-x)N thin film alloys on 6H-SiC(0001) substrates

Diamond and Related Materials, 6(2-4), 196–201.

By: M. Bremser, W. Perry, T. Zheleva, N. Edwards, O. Nam, N. Parikh, D. Aspnes, R. Davis

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 conference paper

In-plane optical anisotropies of Al(x)Ga(1-x)N films in their regions of transparency

In III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society symposia proceedings ; v. 449) (pp. 835–840). Pittsburgh, Pa.: Materials Research Society.

By: U. Rossow, N. Edwards, M. Bremser, R. Kern, H. Liu, R. Davis, D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 conference paper

Low pH chemical etch route for smooth H-terminated Si(100) and study of subsequent chemical stability

In Environmental, safety, and health issues in IC production: Symposium held December 4-5, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society Symposium proceedings, no. 447) (pp. 191–196). Pittsburgh, PA: Materials Research Society.

By: B. Hinds, D. Aspenes & G. Lucovsky

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Molecular layer epitaxy by real-time optical process monitoring

Applied Surface Science, 112(1997 Mar.), 38–47.

By: K. Bachmann, C. Hopfner, N. Sukidi, A. Miller, C. Harris, D. Aspnes, N. Dietz, H. Tran ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 conference paper

Multilevel approaches toward monitoring and control of semiconductor epitaxy

In Control of semiconductor surfaces and interfaces: Symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society Symposium proceedings, no. 448) (pp. 451–462). Pittsburgh, PA: Materials Research Society.

By: D. Aspnes, N. Dietz, U. Rossow & K. Bachmann

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 journal article

Real-time optical analysis and control of semiconductor epitaxy: progress and opportunity

Solid State Communications, 101(2), 85–92.

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 journal article

Spectral analysis of above-, below-, and near-bandedge phenomena in GaN thin films

Materials Science & Engineering. B, Solid-State Materials for Advanced Technology, 50(1-3), 134–141.

By: N. Edwards, S. Yoo, M. Bremser, T. Zheleva, M. Horton, N. Perkins, T. Weeks, H. Liu ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 journal article

Spectroscopic ellipsometric characterization of undoped ZnTe films grown on GaAs

Applied Physics Letters, 70(5), 610–612.

By: Y. Kim, S. Choi, M. Klein, S. Yoo, D. Aspnes, S. Xin, J. Furdyna

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 journal article

Spectroscopic ellipsometric study of Zn(1-x)Mn(x)Te films grown on GaAs

Journal of the Korean Physical Society, 31(1), 202–205.

By: S. Choi, Y. Kim, M. Klein, S. Yoo, D. Aspnes, S. Xin, J. Furdyna

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Spectroscopic ellipsometry study of GaAs/AlAs superlattices and Al(0.5)Ga(0.5)As alloy

Journal of the Korean Physical Society, 30(suppl.), 108–112.

By: S. Choi, Y. Kim, S. Yoo, D. Aspnes, S. Rhee, J. Woo, D. Woo, S. Kim, K. Kang

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Surface and interface effects on ellipsometric spectra of crystalline Si

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 15(4), 1205–1211.

By: K. Bell, L. Mantese, U. Rossow & A. E.

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 journal article

Variation of GaN valence bands with biaxial stress and quantification of residual stress

Applied Physics Letters, 70(1997), 2001.

By: N. Edwards, M. Bremser, T. Weeks, O. Nam, R. Davis, H. Liu, R. Stall, M. Horton ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 conference paper

Variation of GaN valence bands with biaxial stress: quantification of residual stress and impact on fundamental band parameters

In III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society symposia proceedings ; v. 449) (pp. 781–786). Pittsburgh, Pa.: Materials Research Society.

By: N. Edwards, S. Yoo, M. Bremser, M. Horton, N. Perkins, T. Weeks, H. Liu, R. Stall ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1994 patent

Extraction of spatially varying dielectric function from ellipsometric data

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1993 journal article

Minimal-data approaches for determining outer-layer dielectric responses of films from kinetic reflectometric and ellipsometric measurements

Journal of the Optical Society of America A, 10(5), 974.

By: D. Aspnes

Sources: Crossref, ORCID
Added: June 30, 2019

1992 patent

Ellipsometric control of material growth

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & D. Quinn

Source: NC State University Libraries
Added: August 6, 2018

1992 journal article

Growth of AlxGa1−xAs parabolic quantum wells by real‐time feedback control of composition

Applied Physics Letters, 60(10), 1244–1246.

By: D. Aspnes, W. Quinn, M. Tamargo, M. Pudensi, S. Schwarz, M. Brasil, R. Nahory, S. Gregory

Sources: Crossref, ORCID
Added: June 30, 2019

1990 patent

Optical control of deposition of crystal monolayers

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, R. Bhat, E. Colas, L. Florez, J. Harbison & A. Studna

Source: NC State University Libraries
Added: August 6, 2018

1985 patent

Cylindrical grating monochromator for synchrotron radiation

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1983 journal article

Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV

Physical Review B, 27(2), 985–1009.

By: D. Aspnes & A. Studna

Sources: Crossref, ORCID
Added: June 30, 2019

1983 patent

Method of preparing semiconductor surfaces

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & A. Studna

Source: NC State University Libraries
Added: August 6, 2018

1982 journal article

Local‐field effects and effective‐medium theory: A microscopic perspective

American Journal of Physics, 50(8), 704–709.

By: D. Aspnes

Sources: Crossref, ORCID
Added: June 30, 2019

1982 patent

Method for optical monitoring in materials fabrication

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1982 patent

Method for producing devices comprising high density amorphous silicon or germanium layers by low pressure CVD technique

Washington, DC: U.S. Patent and Trademark Office.

By: A. Adams, D. Aspnes & B. Bagley

Source: NC State University Libraries
Added: August 6, 2018

1982 journal article

Optical properties of thin films

Thin Solid Films, 89(3), 249–262.

By: D. Aspnes

Sources: Crossref, ORCID
Added: June 30, 2019

1976 patent

Measurement of thin films by polarized light

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1975 journal article

High Precision Scanning Ellipsometer

Applied Optics, 14(1), 220.

By: D. Aspnes & A. Studna

Sources: Crossref, ORCID
Added: June 30, 2019

1966 journal article

Electric-Field Effects on Optical Absorption near Thresholds in Solids

Physical Review, 147(2), 554–566.

By: D. Aspnes

Sources: Crossref, ORCID
Added: June 30, 2019

Employment

1992 - present

North Carolina State University Raleigh, NC, US
Director of Graduate Programs/Distinguished University Professor Physics