Works (169)

2019 | journal article

Calculation of bulk third-harmonic generation from crystalline Si with the simplified bond hyperpolarizability model

Physical Review. B, Condensed Matter and Materials Physics, 70(16).

By: H. Peng & D. Aspnes

Sources: ORCID, NC State University Libraries
Added: August 6, 2018

2019 | journal article

Dielectric Functions and Critical Points of GaAsSb Alloys

JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 74(6), 595–599.

By: T. Kim, H. Park, J. Byun, V. Le, H. Nguyen, X. Nguyen, Y. Kim, J. Song, D. Aspnes

Sources: Web Of Science, ORCID
Added: April 9, 2019

2019 | article

Real-time diagnostics for metalorganic vapor phase epitaxy

Physica Status Solidi. B, Basic Solid State Physics.

By: D. Aspnes

Sources: ORCID, NC State University Libraries
Added: August 6, 2018

2019 | journal article

Relative bulk and interface contributions to optical second-harmonic generation in silicon

Physical Review. B, Condensed Matter and Materials Physics, 72(20).

By: H. Peng, E. Adles, J. Wang & D. Aspnes

Sources: ORCID, NC State University Libraries
Added: August 6, 2018

2016 | journal article

Liquid gallium and the eutectic gallium indium (EGaIn) alloy: Dielectric functions from 1.24 to 3.1 eV by electrochemical reduction of surface oxides

Applied Physics Letters, 109(9).

By: D. Morales, N. Stoute, Z. Yu, D. Aspnes & M. Dickey

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2015 | conference paper

Bond models in linear and nonlinear optics

In Ultrafast nonlinear imaging and spectroscopy iii (Vol. 9584).

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2015 | journal article

Exciton-dominated dielectric function of atomically thin MoS2 films

Scientific Reports, 5.

By: Y. Yu, Y. Yu, Y. Cai, W. Li, A. Gurarslan, H. Peelaers, D. Aspnes, C. Walle ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2015 | article

Manuel Cardona Castro obituary

Physics Today.

By: J. Rowe, D. Aspnes, A. Pinczuk & P. Yu

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2014 | journal article

Combined direct- and reciprocal-space approach for converting spectra to energy scales with negligible loss of information

Thin Solid Films, 571, 506–508.

By: D. Aspnes & S. Choi

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2014 | journal article

Dielectric functions and interband transitions of InxAl1 (-) P-x alloys

Current Applied Physics, 14(9), 1273–1276.

By: T. Kim, S. Hwang, J. Byun, D. Aspnes, E. Lee, J. Song, C. Liang, Y. Chang ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2014 | journal article

Parameterization of the dielectric functions of InGaSb alloys

Current Applied Physics, 14(5), 768–771.

By: T. Kim, J. Byun, S. Hwang, H. Park, Y. Kang, J. Park, Y. Kim, D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2014 | journal article

Spectroscopic ellipsometry - Past, present, and future

Thin Solid Films, 571, 334–344.

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2013 | journal article

Analytic representation of the dielectric functions of InAsxSb1-x alloys in the parametric model

Thin Solid Films, 547, 276–279.

By: S. Hwang, T. Kim, J. Byun, N. Barange, M. Diware, Y. Kim, D. Aspnes, J. Yoon, J. Song

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2013 | journal article

Interband transitions and dielectric functions of InGaSb alloys

Applied Physics Letters, 102(10).

By: T. Kim, J. Yoon, J. Byun, S. Hwang, D. Aspnes, S. Shin, J. Song, C. Liang ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2013 | journal article

Shallow acceptor complexes in p-type ZnO

Applied Physics Letters, 102(15).

By: J. Reynolds, C. Reynolds, A. Mohanta, J. Muth, J. Rowe, H. Everitt, D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2013 | journal article

Spectroscopic ellipsometry-A perspective

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 31(5).

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2012 | journal article

Control of the oxidation kinetics of H-terminated (111)Si by using the carrier concentration and the strain: a second-harmonic-generation investigation

Journal of the Korean Physical Society, 60(10), 1685–1689.

By: B. Gokce, . gundogdu & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2012 | journal article

Optical and structural characterization of epitaxial graphene on vicinal 6H-SiC(0001)-Si by spectroscopic ellipsometry, Auger spectroscopy, and STM

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 30(4).

By: F. Nelson, A. Sandin, D. Dougherty, D. Aspnes, J. Rowe & A. Diebold

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2011 | journal article

Above-band-gap dielectric functions of ZnGeAs2: Ellipsometric measurements and quasiparticle self-consistent GW calculations

Physical Review. B, Condensed Matter and Materials Physics, 83(23).

By: S. Choi, M. Schilfgaarde, D. Aspnes, A. Norman, J. Olson, T. Peshek, D. Levi

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2011 | conference paper

Back-reflection second-harmonic generation of (111)Si: Theory and experiment

In Journal of the Korean Physical Society (Vol. 58, pp. 1237–1243).

By: B. Gokce, . gundogdu, E. Adles & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2011 | journal article

Bond-specific reaction kinetics during the oxidation of (111) Si: Effect of n-type doping

Applied Physics Letters, 98(2).

By: B. Gokce, D. Aspnes, G. Lucovsky & K. Gundogdu

Source: NC State University Libraries
Added: August 6, 2018

2011 | journal article

Effect of strain on bond-specific reaction kinetics during the oxidation of H-terminated (111) Si

Applied Physics Letters, 98(12).

By: B. Gokce, D. Aspnes & K. Gundogdu

Source: NC State University Libraries
Added: August 6, 2018

2011 | conference paper

Measurement and control of in-plane surface chemistry during oxidation of H-terminated (111)Si

In Physics of semiconductors: 30th international conference on the physics of semiconductors (Vol. 1399).

By: B. Gokce, E. Adles, D. Aspnes & . gundogdu

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2011 | conference paper

Plasmonics and effective-medium theories

In Thin Solid Films (Vol. 519, pp. 2571–2574).

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2011 | conference paper

Roughness analysis of the critical dimension by using spectroscopic ellipsometry

In Journal of the Korean Physical Society (Vol. 58, pp. 1426–1428).

By: T. Ghong, S. Han, J. Chung, J. Byun, Y. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2010 | conference paper

Bond models in linear and nonlinear optics

In Physica Status Solidi. B, Basic Solid State Physics (Vol. 247, pp. 1873–1880).

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2010 | conference paper

Chemical-etch-assisted growth of epitaxial zinc oxide

In Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films (Vol. 28, pp. 689–692).

By: E. Adles & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2010 | journal article

Dielectric functions and interband transitions of In1-xAlxSb alloys

Applied Physics Letters, 97(11).

By: J. Yoon, T. Kim, Y. Jung, D. Aspnes, Y. Kim, H. Kim, Y. Chang, S. Shin, J. Song

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2010 | journal article

Ellipsometric study of single-crystal gamma-InSe from 1.5 to 9.2 eV

Applied Physics Letters, 96(18).

By: S. Choi, D. Aspnes, A. Fuchser, C. Martinez-Tomas, V. Sanjose & D. Levi

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2010 | journal article

Measurement and control of in-plane surface chemistry during the oxidation of H-terminated (111) Si

Proceedings of the National Academy of Sciences, 107(41), 17503–17508.

By: B. Gokce, E. Adles, D. Aspnes & K. Gundogdu

Sources: NC State University Libraries, Crossref, ORCID
Added: August 6, 2018

2010 | journal article

Nondestructive analysis of coated periodic nanostructures from optical data

Optics Letters, 35(5), 733–735.

By: T. Ghong, S. Han, J. Chung, J. Byun, T. Kim, D. Aspnes, Y. Kim, I. Park, Y. Kim

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2010 | journal article

Thickness inhomogeneities and growth mechanisms of GaP heteroepitaxy by organometallic chemical vapor deposition

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 28(4), 583–589.

By: X. Liu & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2009 | journal article

Follow the light: Ellipsometry and polarimetry

Physics Today, 62(5), 70–71.

By: H. Arwin & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2009 | journal article

Interband transitions of InAsxSb1-x alloy films

Applied Physics Letters, 95(11).

By: T. Kim, J. Yoon, S. Hwang, D. Aspnes, Y. Kim, H. Kim, Y. Chang, J. Song

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2009 | journal article

Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films

Optics Letters, 34(18), 2867–2869.

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 | journal article

Analysis of interface layers by spectroscopic ellipsometry

Applied Surface Science, 255(3), 640–642.

By: T. Kim, J. Yoon, Y. Kim, D. Aspnes, M. Klein, D. Ko, Y. Kim, V. Elarde, J. Coleman

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 | journal article

Application of the anisotropic bond model to second-harmonic generation from amorphous media

Physical Review. B, Condensed Matter and Materials Physics, 77(16).

By: E. Adles & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 | journal article

Dependence of plasmon polaritons on the thickness of indium tin oxide thin films

Journal of Applied Physics, 103(9).

Source: NC State University Libraries
Added: August 6, 2018

2008 | journal article

Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters

Physica Status Solidi. A, Applications and Materials Science, 205(4), 884–887.

By: S. Choi, D. Aspnes, N. Stoute, Y. Kim, H. Kim, Y. Chang, C. Palmstrom

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 | journal article

Model dielectric functions for AlxGa1-xAs alloys of arbitrary compositions

Journal of Applied Physics, 104(1).

By: Y. Jung, T. Kim, J. Yoon, Y. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 | patent

Normal incidence rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2008 | journal article

Optical properties of InxAl1-xAs alloy films

Applied Physics Letters, 92(15).

By: J. Yoon, T. Ghong, J. Byun, Y. Kim, D. Aspnes, H. Kim, Y. Chang, J. Song

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 | journal article

Overlayer effects in the critical-point analysis of ellipsometric spectra: Application to InxGa1-xAs alloys

Journal of Applied Physics, 103(7).

By: T. Ghong, T. Kim, Y. Jung, Y. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2008 | journal article

The anisotropic bond model of nonlinear optics

Physica Status Solidi (a), 205(4), 728–731.

By: E. Adles & D. Aspnes

Sources: Crossref, ORCID, NC State University Libraries
Added: August 6, 2018

2008 | journal article

The nearly aligned rotating-monoplate compensator

Physica Status Solidi. A, Applications and Materials Science, 205(4), 739–742.

By: M. Asar & D. Aspnes

Sources: ORCID, NC State University Libraries
Added: August 6, 2018

2008 | journal article

Thickness inhomogenities in the organometallic chemical vapor deposition of GaP

Applied Physics Letters, 93(20).

By: X. Liu & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2007 | journal article

Analytic determination of n, k, and d of an absorbing film from polarimetric data in the thin-film limit

Journal of Applied Physics, 101(3).

By: I. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2007 | journal article

Dielectric functions and electronic structure of InAsxP1-x films on InP

Applied Physics Letters, 91(4).

By: S. Choi, C. Palmstrom, Y. Kim, D. Aspnes, H. Kim & Y. Chang

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2007 | journal article

Effect of overlayers on critical-point parameters in the analysis of ellipsometric spectra

Applied Physics Letters, 91(12).

By: Y. Jung, T. Ghong, Y. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2007 | journal article

Initial stages of GaP heteroepitaxy on nanoscopically roughened (001)SI

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 25(4), 1448–1452.

By: X. Liu, I. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2007 | journal article

Investigation of effective-medium approximation, alloy, average-composition, and graded-composition models for interface analysis by spectroscopic ellipsometry

Journal of Applied Physics, 102(6).

By: T. Kim, T. Ghong, Y. Kim, D. Aspnes, M. Klein, D. Ko, Y. Kim, V. Elarde, J. Coleman

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2007 | patent

Normal incidence rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2007 | article

Suppression of Jahn-Teller term-split band edge states in the X-ray absorption spectra of non-crystalline Zr silicates and Si oxynitride alloys, and alloys of ZrO2 with Y2O3 (vol 75, pg 1591, 2006)

Radiation Physics and Chemistry.

By: G. Lucovsky, C. Fulton, B. Ju, N. Stoute, H. Seo, D. Aspnes, J. Luning

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2006 | journal article

Interface analysis of an AlGaAs multilayer system by using spectroscopic ellipsometry

Journal of the Korean Physical Society, 48(6), 1601–1605.

By: T. Ghong, Y. Kim, D. Aspnes, M. Klein, D. Ko, Y. Kim, V. Elarde, J. Coleman

Source: NC State University Libraries
Added: August 6, 2018

2006 | journal article

Systematic approach for analyzing reflectance-difference spectra: Application to silicon-dielectric interfaces

Applied Physics Letters, 88(20).

By: M. Brinkley, G. Powell & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2006 | journal article

Toward n kappa d spectroscopy: Analytic solution of the three-phase model of polarimetry in the thin-film limit

Applied Physics Letters, 88(20).

By: I. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2005 | journal article

Conduction band states of transition metal (TM) high-k gate dielectrics as determined from X-ray absorption spectra

Microelectronics Reliability, 45(06-May), 827–830.

By: G. Lucovsky, J. Hong, C. Fulton, N. Stoute, Y. Zou, R. Nemanich, D. Aspnes, H. Ade, D. Schlom

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2005 | journal article

Dielectric functions of AlxGa1-xSb (0.00 <= x <= 0.39) alloys from 1.5 to 6.0 eV

Journal of Applied Physics, 98(10).

By: S. Choi, C. Palmstrom, Y. Kim, S. Cooper & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2005 | journal article

Dipole-radiation model for terahertz radiation from semiconductors

Applied Physics Letters, 86(21).

By: H. Peng & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2005 | journal article

Optical properties of (GaSb)(3n)(AlSb)(n) (1 <= n <= 5) superlattices

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 23(3), 1149–1153.

By: S. Choi, S. Srivastava, C. Palmstrom, Y. Kim, S. Cooper & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 | journal article

Biplate artifacts in rotating-compensator ellipsometers

Thin Solid Films, 455-56(2004 May 1), 779–783.

By: K. Ebert & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 | patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2004 | journal article

Comparison of the capabilities of rotating-analyzer and rotating-compensator ellipsometers by measurements on a single system

Thin Solid Films, 455-56(2004 May 1), 33–38.

By: T. Mori & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 | journal article

Expanding horizons: new developments in ellipsometry and polarimetry

Thin Solid Films, 455-56(2004 May 1), 13-.

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 | journal article

Integrated rotating-compensator polarimeter for real-time measurements and analysis of organometallic chemical vapor deposition

Thin Solid Films, 455-56(2004 May 1), 639–644.

By: K. Flock, S. Kim, M. Asar, I. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 | journal article

Optical anisotropy relevant to rotating-compensator polarimeters: application to the monoplate retarder

Thin Solid Films, 455-56(2004 May 1), 50–53.

By: M. Asar & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 | journal article

Optical properties of Cd1-xMgxTe (x=0.00, 0.23, 0.31, and 0.43) alloy films

Applied Physics Letters, 84(5), 693–695.

By: Y. Ihn, T. Kim, Y. Kim, D. Aspnes & J. Kossut

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 | journal article

Optimizing precision of rotating-analyzer and rotating-compensator-ellipsometers

Journal of the Optical Society of America. A, Optics, Image Science, and Vision, 21(3), 403–410.

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 | journal article

Parametric modeling of the dielectric functions of Cd1-xMgxTe alloy films

Thin Solid Films, 455-56(2004 May 1), 222–227.

By: Y. Ihn, T. Kim, T. Ghong, Y. Kim, D. Aspnes & J. Kossut

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 | journal article

Real-time characterization of GaSb homo- and heteroepitaxy

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 22(4), 2233–2239.

By: S. Kim, K. Flock, M. Asar, I. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2004 | journal article

Spectroscopic ellipsometric analysis of interfaces: Comparison of alloy and effective-medium-approximation approaches to a CdMgTe multilayer system

Applied Physics Letters, 85(6), 946–948.

By: T. Ghong, T. Kim, Y. Kim & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2003 | journal article

Application of the simplified bond-hyperpolarizability model to fourth-harmonic generation

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 21(4), 1798–1803.

By: J. Hansen, H. Peng & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2003 | patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2003 | journal article

Dielectric functions of Cd1-xMgxTe alloy films by uusing spectroscopic ellipsometry

Journal of the Korean Physical Society, 43(4), 634–637.

By: Y. Ihn, T. Kim, Y. Kim, D. Aspnes & J. Kossut

Source: NC State University Libraries
Added: August 6, 2018

2003 | journal article

Dielectric functions of InxGa1-xAs alloys

Physical Review. B, Condensed Matter and Materials Physics, 68(11).

By: T. Kim, T. Ghong, Y. Kim, S. Kim, D. Aspnes, T. Mori, T. Yao, B. Koo

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2003 | journal article

Optical properties of InGaAs alloy films in the E-2 region by spectroscopic ellipsometry

Journal of the Korean Physical Society, 42(2003 Feb), S242–245.

By: Y. Ihn, T. Ghong, Y. Kim, S. Kim, D. Aspnes, T. Yao, B. Koo

Source: NC State University Libraries
Added: August 6, 2018

2003 | journal article

Simplified bond-hyperpolarizability model of second- and fourth-harmonic generation: application to Si-SiO2 interfaces

Physica Status Solidi. B, Basic Solid State Physics, 240(3), 509–517.

By: D. Aspnes, J. Hansen, H. Peng, G. Powell & J. Wang

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2003 | journal article

Study of the dielectric function of ZnS by spectroscopic ellipsometry

Journal of the Korean Physical Society, 42(2003 Feb), S238–241.

By: T. Ghong, T. Kim, Y. Kim, S. Kim, D. Aspnes, Y. Choi, Y. Yu

Source: NC State University Libraries
Added: August 6, 2018

2002 | patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2002 | journal article

Pseudodielectric function of ZnGeP2 from 1.5 to 6 eV

Applied Physics Letters, 81(4), 628–630.

By: V. Blickle, K. Flock, N. Dietz & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2002 | journal article

Pseudodielectric functions of InGaAs alloy films grown on InP

Applied Physics Letters, 81(13), 2367–2369.

By: T. Kim, Y. Ihn, Y. Kim, S. Kim, D. Aspnes, T. Yao, K. Shim, B. Koo

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2002 | journal article

Simplified bond-hyperpolarizability model of second harmonic generation

Physical Review. B, Condensed Matter and Materials Physics, 65(20), 205320–1.

By: G. Powell, J. Wang & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2002 | journal article

Simplified bond-hyperpolarizability model of second harmonic generation: Application to Si-dielectric interfaces

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1699–1705.

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2002 | patent

Thin film optical measurement system and method with calibrating ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, J. Opsal & J. Faton

Source: NC State University Libraries
Added: August 6, 2018

2001 | journal article

Above bandgap optical properties of ZnS and ZnS1-xTex alloys grown by using hot-wall epitaxy

Journal of the Korean Physical Society, 39(3), 462–465.

By: C. Bang, M. Lee, T. Kim, Y. Kim, D. Aspnes, Y. Yu, B. O, Y. Choi

Source: NC State University Libraries
Added: August 6, 2018

2001 | patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2001 | journal article

Elimination of endpoint-discontinuity artifacts in the analysis of spectra in reciprocal space

Journal of Applied Physics, 89(12), 8183–8192.

By: S. Yoo & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2001 | patent

Ellipsometer and polarimeter with zero-order plate compensator

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Law

Source: NC State University Libraries
Added: August 6, 2018

2001 | journal article

Investigation and control of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Physica Status Solidi. A, Applications and Materials Science, 184(1), 79–87.

By: M. Ebert, K. Bell, K. Flock & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2001 | journal article

Investigation of noise in a spectrometer system using a short-arc source

Review of Scientific Instruments, 72(8), 3477–3479.

By: M. Ebert & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2001 | journal article

Linear and nonlinear optical spectroscopy of surfaces and interfaces

Physica Status Solidi. A, Applications and Materials Science, 188(4), 1353–1360.

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2001 | article

Nondestructive measurement of a glass transition temperature at spin-cast semicrystalline polymer surfaces

Macromolecules.

By: J. Hyun, D. Aspnes & J. Cuomo

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2001 | journal article

Ordinary and extraordinary dielectric functions of 4H-and 6H-SiC from 3.5 to 9.0 eV

Applied Physics Letters, 78(18), 2715–2717.

By: O. Lindquist, K. Jarrendahl, S. Peters, J. Zettler, C. Cobet, N. Esser, D. Aspnes, A. Henry, N. Edwards

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2001 | journal article

Spectroscopic ellipsometric study of the dielectric function of ZnSe and its overlayer

Journal of the Korean Physical Society, 39(2001 Dec), S372–375.

By: T. Kim, M. Koo, M. Lee, Y. Kim, D. Aspnes & B. Jonker

Source: NC State University Libraries
Added: August 6, 2018

2001 | journal article

Spectroscopic ellipsometry study of InGaAs alloy films grown on InP

Journal of the Korean Physical Society, 39(2001 Dec), S389–392.

By: G. Seong, C. Bang, Y. Kim, J. Wang, D. Aspnes, B. Koo, T. Yao

Source: NC State University Libraries
Added: August 6, 2018

2001 | patent

Thin film optical measurement system and method with calibrating ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, J. Opsal & J. Faton

Source: NC State University Libraries
Added: August 6, 2018

2000 | patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2000 | journal article

Characterization of AlxGa1-xN-compound layers by reflectance difference spectroscopy

Physica Status Solidi. A, Applications and Materials Science, 177(1), 157–163.

By: U. Rossow & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

Coherence effects and time dependences of the optical response of surfaces and interfaces of optically absorbing materials

Physica Status Solidi. B, Basic Solid State Physics, 220(1), 709–715.

By: D. Aspnes, L. Mantese, K. Bell & U. Rossow

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

Dielectric function and bowing parameter of Zn1-xMgxSe and Zn1- xBexSe alloys

Journal of the Korean Physical Society, 37(6), 1012–1016.

By: H. Lee, I. Kim, J. Powell, D. Aspnes, S. Lee, F. Peiris, J. Furdyna

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

Dielectric function of epitaxial ZnSe films

Applied Physics Letters, 77(21), 3364–3366.

By: M. Koo, T. Kim, M. Lee, M. Oh, Y. Kim, S. Yoo, D. Aspnes, B. Jonker

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

Effect of Ar+ ion beam in the process of plasma surface modification of PET films

Journal of Applied Polymer Science, 77(8), 1679–1683.

By: N. Libraries

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

High-resolution spectroscopy with reciprocal-space analysis: Application to isotopically pure Si

Physica Status Solidi. B, Basic Solid State Physics, 220(1), 117–125.

By: S. Yoo, D. Aspnes, L. Lastras-Martinez, T. Ruf, M. Konuma & M. Cardona

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Thin Solid Films, 364(1-2), 22–27.

By: M. Ebert, K. Bell, S. Yoo, K. Flock & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

Isotopic effects on the dielectric response of Si around the E- 1 gap

Physical Review. B, Condensed Matter and Materials Physics, 61(19), 12946–12951.

By: L. Lastras-Martinez, T. Ruf, M. Konuma, M. Cardona & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | patent

Method of reducing noise generated by arc lamps in optical systems employing slits

Aspnes, D. E., & Ebert, M. (2000, May 2). Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & M. Ebert

Source: NC State University Libraries
Added: August 6, 2018

2000 | journal article

Optical characterization of wide bandgap semiconductors

Thin Solid Films, 364(1-2), 98–106.

By: N. Edwards, M. Bremser, A. Batchelor, I. Buyanova, L. Madsen, S. Yoo, T. Welhkamp, K. Wilmers ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

Optical properties of AlxGa1-xP (0 <= x <= 0.52) alloys

Journal of Applied Physics, 87(3), 1287–1290.

By: S. Choi, Y. Kim, S. Yoo, D. Aspnes, D. Woo & S. Kim

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

Real-time assessment of over layer removal on 4H-SiC surfaces: Techniques and relevance to contact formation

Materials Science Forum, 338(3), 1033–1036.

By: N. Edwards, L. Madsen, K. Robbie, G. Powell, K. Jarrendahl, C. Cobet, N. Esser, W. Richter, D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

Real-time assessment of selected surface preparation regimens for 4H-SiC surfaces using spectroscopic ellipsometry

Surface Science, 464(1), L703–707.

By: N. Edwards, K. Jarrendahl, D. Aspnes, K. Robbie, G. Powell, C. Cobet, N. Esser, W. Richter, L. Madsen

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 18(4), 1184–1189.

By: K. Bell, M. Ebert, S. Yoo, K. Flock & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor

Journal of Electronic Materials, 29(1), 106–111.

By: K. Bell, M. Ebert, S. Yoo, K. Flock & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

Surface-induced optical anisotropy of Si and Ge

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 18(4), 2229–2231.

By: U. Rossow, L. Mantese & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2000 | journal article

Visible-near ultraviolet ellipsometric study of Zn1-xMgxSe and Zn1-xBexSe alloys

Journal of Applied Physics, 88(2), 878–882.

By: H. Lee, I. Kim, J. Powell, D. Aspnes, S. Lee, F. Peiris, J. Furdyna

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 | journal article

Analysis of high-index Si(001) surfaces by reflectance difference spectroscopy

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 17(4), 1652–1656.

By: L. Mantese, Q. Xue, T. Sakurai & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 | patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

1999 | journal article

Comment on 'Ab initio calculation of excitonic effects in the optical spectra of semiconductors'

Physical Review Letters, 83(19), 3970.

By: M. Cardona, L. Lastras-Martinez & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 | journal article

Dielectric function of Cd0.57Mg0.43Te alloy film studied by ellipsometry

Journal of the Korean Physical Society, 34(1999 June), S496–498.

By: T. Kim, Y. Kim, S. Yoo, D. Aspnes & J. Kossut

Source: NC State University Libraries
Added: August 6, 2018

1999 | journal article

High-resolution spectroscopy with reciprocal-space analysis

Physica Status Solidi. B, Basic Solid State Physics, 215(1), 715–723.

By: D. Aspnes & S. Yoo

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 | journal article

Photon-induced localization in optically absorbing materials

Physics Letters. A, 253(1-2), 93–97.

By: L. Mantese, K. Bell, D. Aspnes & U. Rossow

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 | journal article

Proximal electromagnetic shear forces

Journal of Microscopy, 196(1), 59–60.

By: E. Ayars, D. Aspnes, P. Moyer & M. Paesler

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 | journal article

Relaxation phenomena in GaN/ AlN/ 6H-SiC heterostructures

MRS Internet Journal of Nitride Semiconductor Research, 4S1(G3.78).

By: N. Edwards, A. Batchelor, I. Buyanova, L. Madsen, M. Bremser, R. Davis, D. Aspnes, B. Monemar

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 | patent

Thin film optical measurement system and method with calibrating ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, J. Opsal & J. Faton

Source: NC State University Libraries
Added: August 6, 2018

1998 | journal article

Analysis of optical spectra by Fourier methods

Thin Solid Films, 313(1998 Feb.), 143–148.

By: S. Yoo, N. Edwards & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 | journal article

Analytic representations of the dielectric functions of crystalline and amorphous Si and crystalline Ge for very large scale integrated device and structural modeling

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 16(1998), 1654–1657.

By: J. Leng, J. Opsal, H. Chu, M. Senko & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 | journal article

Analytic representations of the dielectric functions of materials for device and structural modeling

Thin Solid Films, 313-314(1998), 132–136.

By: J. Leng, J. Opsal, H. Chu, M. Senko & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 | journal article

Broadband spectral operation of a rotating-compensator ellipsometer

Thin Solid Films, 313-314(1998), 58–62.

By: J. Opsal, J. Fanton, J. Chen, J. Leng, L. Wei, C. Uhrich, M. Senko, C. Zaiser, D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 | journal article

Interpretation of critical point energy shifts in crystalline Si by near-surface localization of excited electronic states

Thin Solid Films, 313(1998 Feb.), 557–560.

By: L. Mantese, K. Bell, U. Rossow & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 | journal article

Lineshapes of surface induced optical anisotropy spectra measured by RDS/RAS

Applied Surface Science, 123-124(1998 Jan.), 237–242.

By: U. Rossow, L. Mantese & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 | journal article

Many-body and correlation effects in surface and interface spectra of optically absorbing materials

Physica Status Solidi. A, Applications and Materials Science, 170(2), 199–210.

By: D. Aspnes, L. Mantese, K. Bell & U. Rossow

Source: NC State University Libraries
Added: August 6, 2018

1998 | journal article

Optical approaches for controlling epitaxial growth

Applied Surface Science, 132(1998 June), 367–376.

By: D. Aspnes & N. Dietz

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 | journal article

Optical characterization of GaAs/AlAs short period superlattices

Microelectronic Engineering, 43-4(1998 Aug.), 265–270.

By: D. Woo, I. Han, W. Choi, S. Lee, H. Kim, J. Lee, S. Kim, K. Kang ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 | journal article

Photon-induced localization and final-state correlation effects in optically absorbing materials

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 16(4), 2367–2372.

By: D. Aspnes, L. Mantese, K. Bell & U. Rossow

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 | journal article

Reflectance difference spectroscopy (RDS) spectra of clean (3 x 2), (2 x 1), and c(2 x 2) 3C-SiC(001) surfaces: New evidence for surface state contributions to optical anisotrospectra

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 16(4), 2355–2357.

By: U. Rossow, K. Lindner, M. Lubbe, D. Aspnes & D. Zahn

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 | journal article

Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films

Thin Solid Films, 313(1998 Feb.), 187–192.

By: N. Edwards, S. Yoo, M. Bremser, M. Horton, N. Perkins, T. Weeks, H. Liu, R. Stall ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 | journal article

Systematic differences among nominal reference dielectric function spectra for crystalline Si as determined by spectroscopic ellipsometry

Thin Solid Films, 313(1998 Feb.), 161–166.

By: K. Bell, L. Mantese, U. Rossow & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 | patent

Thin film optical measurement system and method with calibrating ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, J. Opsal & J. Faton

Source: NC State University Libraries
Added: August 6, 2018

1998 | journal article

Trends in residual stress for GaN/AlN/6H-SiC heterostructures

Applied Physics Letters, 73(19), 2808–2810.

By: N. Edwards, M. Bremser, R. Davis, A. Batchelor, S. Yoo, C. Karan, D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 | journal article

Above bandgap dielectric function of epitaxial ZnSe layers

Journal of the Korean Physical Society, 31(4), L553–555.

By: Y. Kim, Y. Ko, S. Choi, S. Yoo, D. Aspnes & B. Jonker

Source: NC State University Libraries
Added: August 6, 2018

1997 | journal article

Ellipsometric studies of Cd(1-x)Mg(x)Te (0 less than or equal to x less than or equal to 0.5) alloys

Applied Physics Letters, 71(2), 249–251.

By: S. Choi, Y. Kim, S. Yoo, A. Duk, M. David E., . I., A. Ramdas

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 | journal article

Evidence of near-surface localization of excited electronic states in crystalline Si

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 15(4), 1196–1200.

By: L. Mantese, K. Bell, U. Rossow & D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 | journal article

Growth, doping and characterization of Al(x)Ga(1-x)N thin film alloys on 6H-SiC(0001) substrates

Diamond and Related Materials, 6(2-4), 196–201.

By: M. Bremser, W. Perry, T. Zheleva, N. Edwards, O. Nam, N. Parikh, D. Aspnes, R. Davis

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 | conference paper

In-plane optical anisotropies of Al(x)Ga(1-x)N films in their regions of transparency

In III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society symposia proceedings ; v. 449) (pp. 835–840). Pittsburgh, Pa.: Materials Research Society.

By: U. Rossow, N. Edwards, M. Bremser, R. Kern, H. Liu, R. Davis, D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 | conference paper

Low pH chemical etch route for smooth H-terminated Si(100) and study of subsequent chemical stability

In Environmental, safety, and health issues in IC production: Symposium held December 4-5, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society Symposium proceedings, no. 447) (pp. 191–196). Pittsburgh, PA: Materials Research Society.

By: B. Hinds, D. Aspenes & G. Lucovsky

Source: NC State University Libraries
Added: August 6, 2018

1997 | journal article

Molecular layer epitaxy by real-time optical process monitoring

Applied Surface Science, 112(1997 Mar.), 38–47.

By: K. Bachmann, C. Hopfner, N. Sukidi, A. Miller, C. Harris, D. Aspnes, N. Dietz, H. Tran ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 | conference paper

Multilevel approaches toward monitoring and control of semiconductor epitaxy

In Control of semiconductor surfaces and interfaces: Symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society Symposium proceedings, no. 448) (pp. 451–462). Pittsburgh, PA: Materials Research Society.

By: D. Aspnes, N. Dietz, U. Rossow & K. Bachmann

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 | journal article

Real-time optical analysis and control of semiconductor epitaxy: progress and opportunity

Solid State Communications, 101(2), 85–92.

By: D. Aspnes

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 | journal article

Spectral analysis of above-, below-, and near-bandedge phenomena in GaN thin films

Materials Science & Engineering. B, Solid-State Materials for Advanced Technology, 50(1-3), 134–141.

By: N. Edwards, S. Yoo, M. Bremser, T. Zheleva, M. Horton, N. Perkins, T. Weeks, H. Liu ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 | journal article

Spectroscopic ellipsometric characterization of undoped ZnTe films grown on GaAs

Applied Physics Letters, 70(5), 610–612.

By: Y. Kim, S. Choi, M. Klein, S. Yoo, D. Aspnes, S. Xin, J. Furdyna

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 | journal article

Spectroscopic ellipsometric study of Zn(1-x)Mn(x)Te films grown on GaAs

Journal of the Korean Physical Society, 31(1), 202–205.

By: S. Choi, Y. Kim, M. Klein, S. Yoo, D. Aspnes, S. Xin, J. Furdyna

Source: NC State University Libraries
Added: August 6, 2018

1997 | journal article

Spectroscopic ellipsometry study of GaAs/AlAs superlattices and Al(0.5)Ga(0.5)As alloy

Journal of the Korean Physical Society, 30(suppl.), 108–112.

By: S. Choi, Y. Kim, S. Yoo, D. Aspnes, S. Rhee, J. Woo, D. Woo, S. Kim, K. Kang

Source: NC State University Libraries
Added: August 6, 2018

1997 | journal article

Surface and interface effects on ellipsometric spectra of crystalline Si

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 15(4), 1205–1211.

By: K. Bell, L. Mantese, U. Rossow & A. E.

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 | journal article

Variation of GaN valence bands with biaxial stress and quantification of residual stress

Applied Physics Letters, 70(1997), 2001.

By: N. Edwards, M. Bremser, T. Weeks, O. Nam, R. Davis, H. Liu, R. Stall, M. Horton ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 | conference paper

Variation of GaN valence bands with biaxial stress: quantification of residual stress and impact on fundamental band parameters

In III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society symposia proceedings ; v. 449) (pp. 781–786). Pittsburgh, Pa.: Materials Research Society.

By: N. Edwards, S. Yoo, M. Bremser, M. Horton, N. Perkins, T. Weeks, H. Liu, R. Stall ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1994 | patent

Extraction of spatially varying dielectric function from ellipsometric data

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1993 | journal article

Minimal-data approaches for determining outer-layer dielectric responses of films from kinetic reflectometric and ellipsometric measurements

Journal of the Optical Society of America A, 10(5), 974.

By: D. Aspnes

Sources: Crossref, ORCID
Added: June 30, 2019

1992 | patent

Ellipsometric control of material growth

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & D. Quinn

Source: NC State University Libraries
Added: August 6, 2018

1992 | journal article

Growth of AlxGa1−xAs parabolic quantum wells by real‐time feedback control of composition

Applied Physics Letters, 60(10), 1244–1246.

By: D. Aspnes, W. Quinn, M. Tamargo, M. Pudensi, S. Schwarz, M. Brasil, R. Nahory, S. Gregory

Sources: Crossref, ORCID
Added: June 30, 2019

1990 | patent

Optical control of deposition of crystal monolayers

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, R. Bhat, E. Colas, L. Florez, J. Harbison & A. Studna

Source: NC State University Libraries
Added: August 6, 2018

1985 | patent

Cylindrical grating monochromator for synchrotron radiation

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1983 | journal article

Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV

Physical Review B, 27(2), 985–1009.

By: D. Aspnes & A. Studna

Sources: Crossref, ORCID
Added: June 30, 2019

1983 | patent

Method of preparing semiconductor surfaces

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & A. Studna

Source: NC State University Libraries
Added: August 6, 2018

1982 | journal article

Local‐field effects and effective‐medium theory: A microscopic perspective

American Journal of Physics, 50(8), 704–709.

By: D. Aspnes

Sources: Crossref, ORCID
Added: June 30, 2019

1982 | patent

Method for optical monitoring in materials fabrication

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1982 | patent

Method for producing devices comprising high density amorphous silicon or germanium layers by low pressure CVD technique

Washington, DC: U.S. Patent and Trademark Office.

By: A. Adams, D. Aspnes & B. Bagley

Source: NC State University Libraries
Added: August 6, 2018

1982 | journal article

Optical properties of thin films

Thin Solid Films, 89(3), 249–262.

By: D. Aspnes

Sources: Crossref, ORCID
Added: June 30, 2019

1976 | patent

Measurement of thin films by polarized light

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1975 | journal article

High Precision Scanning Ellipsometer

Applied Optics, 14(1), 220.

By: D. Aspnes & A. Studna

Sources: Crossref, ORCID
Added: June 30, 2019

1966 | journal article

Electric-Field Effects on Optical Absorption near Thresholds in Solids

Physical Review, 147(2), 554–566.

By: D. Aspnes

Sources: Crossref, ORCID
Added: June 30, 2019

Employment

1992 - present

North Carolina State University Raleigh, NC
Director of Graduate Programs/Distinguished University Professor, Physics