Works (186)

Updated: August 1st, 2023 21:14

2023 journal article

Noise reduction and peak detection in x-ray diffraction data by linear and nonlinear methods

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 41(4).

Sources: ORCID, Web Of Science
Added: June 7, 2023

2022 article

Classical Model of Surface Enhanced Infrared Absorption (SEIRA) Spectroscopy

Gao, Y., Aspnes, D. E., & Franzen, S. (2022, January 10). JOURNAL OF PHYSICAL CHEMISTRY A, Vol. 1.

By: Y. Gao n, D. Aspnes n & S. Franzen n

Sources: Web Of Science, ORCID
Added: January 24, 2022

2022 journal article

Decoding 'Maximum Entropy' Deconvolution

ENTROPY, 24(9).

By: L. Le*, T. Kim*, Y. Kim* & D. Aspnes n

author keywords: maximum entropy; deconvolution; spectral analysis
Sources: Web Of Science, ORCID
Added: October 3, 2022

2022 article

Detection of the Biexciton of Monolayer WS2 in Ellipsometric Data: A Maximum-Entropy Success

Le, L. V., Kim, T. J., Kim, Y. D., & Aspnes, D. E. (2022, October 17). PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, Vol. 10.

By: L. Le*, T. Kim*, Y. Kim* & D. Aspnes n

author keywords: biexciton; Burg; Andersen; deconvolution; Fourier analysis; maximum-entropy; monolayer WS2
Sources: Web Of Science, ORCID
Added: October 31, 2022

2022 journal article

Eliminating noise from spectra by linear and nonlinear methods

THIN SOLID FILMS, 761.

By: L. Le*, Y. Kim & D. Aspnes n

author keywords: White noise; Apodization; Linear and nonlinear filters; Gauss-Hermite; Maximum -entropy
Sources: Web Of Science, ORCID
Added: November 14, 2022

2022 journal article

Eliminating white noise in spectra: A generalized maximum-entropy approach

JOURNAL OF APPLIED PHYSICS, 132(7).

By: L. Le*, Y. Kim* & D. Aspnes n

Sources: ORCID, Web Of Science
Added: August 18, 2022

2022 article

Reducing or eliminating noise in ellipsometric spectra

Le, L. V., Kim, T. J., Kim, Y. D., & Aspnes, D. E. (2022, August 4). JOURNAL OF THE KOREAN PHYSICAL SOCIETY, Vol. 8.

By: L. Le*, T. Kim*, Y. Kim* & D. Aspnes n

author keywords: Noise reduction; Gauss-Hermite kernels; Maximum-entropy; Ellipsometric spectra; Endpoint-discontinuity artifacts
Sources: Web Of Science, ORCID
Added: August 29, 2022

2021 journal article

Maximum-entropy revisited: Optimal filtering of spectra

JOURNAL OF APPLIED PHYSICS, 129(22).

By: L. Le*, T. Kim*, Y. Kim* & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 23, 2021

2020 journal article

Classical Correlation Model of Resonance Raman Spectroscopy

JOURNAL OF PHYSICAL CHEMISTRY A, 124(44), 9177–9186.

By: Y. Gao n, D. Aspnes n & S. Franzen n

Sources: Web Of Science, ORCID
Added: December 11, 2020

2020 journal article

Critical Test of the Interaction of Surface Plasmon Resonances with Molecular Vibrational Transitions

JOURNAL OF PHYSICAL CHEMISTRY A, 124(9), 1744–1753.

By: E. Sachet*, D. Aspnes n, J. Maria n & S. Franzen n

Sources: Web Of Science, ORCID
Added: March 30, 2020

2020 journal article

External removal of endpoint-discontinuity artifacts in the reciprocal-space analysis of spectra

CURRENT APPLIED PHYSICS, 20(1), 232–236.

By: V. Le*, T. Kim*, Y. Kim* & D. Aspnes n

author keywords: Endpoint-discontinuity artifacts; Fourier transform
Sources: Web Of Science, ORCID
Added: December 9, 2019

2020 journal article

Quantitative assessment of linear noise-reduction filters for spectroscopy

OPTICS EXPRESS, 28(26), 38917–38933.

By: L. Le*, Y. Kim & D. Aspnes*

Sources: Web Of Science, ORCID
Added: January 19, 2021

2019 journal article

Combined interpolation, scale change, and noise reduction in spectral analysis

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 37(5).

By: V. Le*, T. Kim*, Y. Kim* & D. Aspnes n

Sources: Web Of Science, ORCID
Added: November 18, 2019

2019 journal article

Dielectric Functions and Critical Points of GaAsSb Alloys

JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 74(6), 595–599.

By: T. Kim*, H. Park*, J. Byun*, V. Le*, H. Nguyen*, X. Nguyen*, Y. Kim*, J. Song*, D. Aspnes n

author keywords: GaAsSb; Ellipsometry; Dielectric function; Critical point
Sources: Web Of Science, ORCID
Added: April 9, 2019

2019 journal article

Linear and nonlinear filtering of spectra

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 37(5).

By: D. Aspnes n, V. Le* & Y. Kim*

Sources: Web Of Science, ORCID
Added: November 18, 2019

2016 journal article

Liquid gallium and the eutectic gallium indium (EGaIn) alloy: Dielectric functions from 1.24 to 3.1 eV by electrochemical reduction of surface oxides

APPLIED PHYSICS LETTERS, 109(9).

By: D. Morales n, N. Stoute n, Z. Yu n, D. Aspnes n & M. Dickey n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2015 article

Bond Models in Linear and Nonlinear Optics

ULTRAFAST NONLINEAR IMAGING AND SPECTROSCOPY III, Vol. 9584.

By: D. Aspnes n

author keywords: Bond models; linear optics; nonlinear optics; second-harmonic generation; hyperpolarizability
Sources: Web Of Science, ORCID
Added: August 6, 2018

2015 journal article

Exciton-dominated Dielectric Function of Atomically Thin MoS2 Films

SCIENTIFIC REPORTS, 5.

By: Y. Yu n, Y. Yu n, Y. Cai*, W. Li*, A. Gurarslan n, H. Peelaers*, D. Aspnes n, C. Walle* ...

Sources: Web Of Science, ORCID
Added: August 6, 2018

2015 article

Manuel Cardona Castro obituary

Rowe, J., Aspnes, D., Pinczuk, A., & Yu, P. Y. (2015, February). PHYSICS TODAY, Vol. 68, pp. 58–58.

Sources: Web Of Science, ORCID
Added: August 6, 2018

2014 article

Combined direct- and reciprocal-space approach for converting spectra to energy scales with negligible loss of information

Aspnes, D. E., & Choi, S. G. (2014, November 28). THIN SOLID FILMS, Vol. 571, pp. 506–508.

By: D. Aspnes n & S. Choi*

author keywords: Ellipsometry; Interpolation; Optical spectra; Wavelength; Fourier analysis
Sources: Web Of Science, ORCID
Added: August 6, 2018

2014 journal article

Dielectric functions and interband transitions of InxAl1 (-) P-x alloys

CURRENT APPLIED PHYSICS, 14(9), 1273–1276.

By: T. Kim*, S. Hwang*, J. Byun*, D. Aspnes n, E. Lee*, J. Song*, C. Liang*, Y. Chang* ...

author keywords: Ellipsometry; InAlP; Dielectric function; Critical point
Sources: Web Of Science, ORCID
Added: August 6, 2018

2014 journal article

Parameterization of the dielectric functions of InGaSb alloys

CURRENT APPLIED PHYSICS, 14(5), 768–771.

By: T. Kim*, J. Byun*, S. Hwang*, H. Park*, Y. Kang*, J. Park*, Y. Kim*, D. Aspnes n

author keywords: InGaSb; Dielectric function; Parametric model; Ellipsometry
Sources: Web Of Science, ORCID
Added: August 6, 2018

2014 article

Spectroscopic ellipsometry - Past, present, and future

Aspnes, D. E. (2014, November 28). THIN SOLID FILMS, Vol. 571, pp. 334–344.

By: D. Aspnes n

author keywords: Spectroscopic; Ellipsometry; Critical dimension; Dielectric function; Optical properties
Sources: Web Of Science, ORCID
Added: August 6, 2018

2013 article

Analytic representation of the dielectric functions of InAsxSb1-x alloys in the parametric model

Hwang, S. Y., Kim, T. J., Byun, J. S., Barange, N. S., Diware, M. S., Kim, Y. D., … Song, J. D. (2013, November 29). THIN SOLID FILMS, Vol. 547, pp. 276–279.

By: S. Hwang*, T. Kim*, J. Byun*, N. Barange*, M. Diware*, Y. Kim*, D. Aspnes n, J. Yoon*, J. Song*

author keywords: Ellipsometry; Parametric model; InAsSb alloy; Dielectric function
Sources: Web Of Science, ORCID
Added: August 6, 2018

2013 journal article

Interband transitions and dielectric functions of InGaSb alloys

APPLIED PHYSICS LETTERS, 102(10).

By: T. Kim*, J. Yoon*, J. Byun*, S. Hwang*, D. Aspnes n, S. Shin*, J. Song*, C. Liang* ...

Sources: Web Of Science, ORCID
Added: August 6, 2018

2013 journal article

Shallow acceptor complexes in p-type ZnO

APPLIED PHYSICS LETTERS, 102(15).

By: J. Reynolds*, C. Reynolds, A. Mohanta, J. Muth*, J. Rowe*, H. Everitt, D. Aspnes*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2013 journal article

Spectroscopic ellipsometry-A perspective

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 31(5).

By: D. Aspnes*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2012 journal article

Control of the oxidation kinetics of H-terminated (111)Si by using the carrier concentration and the strain: a second-harmonic-generation investigation

JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 60(10), 1685–1689.

By: B. Gokce n, K. Gundogdu n & D. Aspnes*

author keywords: Oxidation; Silicon; Second harmonic generation
Sources: Web Of Science, ORCID
Added: August 6, 2018

2012 journal article

Optical and structural characterization of epitaxial graphene on vicinal 6H-SiC(0001)-Si by spectroscopic ellipsometry, Auger spectroscopy, and STM

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 30(4).

By: F. Nelson*, A. Sandin n, D. Dougherty n, D. Aspnes n, J. Rowe n & A. Diebold*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2011 journal article

Above-band-gap dielectric functions of ZnGeAs2: Ellipsometric measurements and quasiparticle self-consistent GW calculations

PHYSICAL REVIEW B, 83(23).

By: S. Choi*, M. Schilfgaarde*, D. Aspnes n, A. Norman*, J. Olson*, T. Peshek*, D. Levi*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2011 conference paper

Analysis of surface roughness of critical-dimension structures using spectroscopic ellipsometry

Presented at the PHYSICS OF SEMICONDUCTORS: 30th International Conference on the Physics of Semiconductors.

By: T. Ghong, S. Han, J. Chung, J. Byun, D. Aspnes*, Y. Kim, J. Ihm, H. Cheong

Event: PHYSICS OF SEMICONDUCTORS: 30th International Conference on the Physics of Semiconductors

author keywords: RCWA; roughness; ellipsometry
Sources: Crossref, ORCID
Added: September 7, 2020

2011 article

Back-reflection Second-harmonic Generation of (111)Si: Theory and Experiment

Gokce, B., Gundogdu, K., Adles, E. J., & Aspnes, D. E. (2011, May). JOURNAL OF THE KOREAN PHYSICAL SOCIETY, Vol. 58, pp. 1237–1243.

By: B. Gokce*, K. Gundogdu*, E. Adles & D. Aspnes n

author keywords: Second-harmonic generation; (111)Si; Anisotropic bond model
Sources: Web Of Science, ORCID
Added: August 6, 2018

2011 journal article

Bond-specific reaction kinetics during the oxidation of (111) Si: Effect of n-type doping

Applied Physics Letters, 98(2), 021904.

By: B. Gokce n, D. Aspnes n, G. Lucovsky n & K. Gundogdu n

Sources: Crossref, ORCID, NC State University Libraries
Added: August 6, 2018

2011 journal article

Effect of strain on bond-specific reaction kinetics during the oxidation of H-terminated (111) Si

Applied Physics Letters, 98(12), 121912.

By: B. Gokce n, D. Aspnes n & K. Gundogdu n

Sources: Crossref, ORCID, NC State University Libraries
Added: August 6, 2018

2011 article

Measurement and Control of In-Plane Surface Chemistry During Oxidation of H-Terminated (111)Si

PHYSICS OF SEMICONDUCTORS: 30TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF SEMICONDUCTORS, Vol. 1399.

By: B. Gokce*, E. Adles*, D. Aspnes* & K. Gundogdu*

author keywords: Silicon; nonlinear optics; oxidation; second-harmonic generation
Sources: Web Of Science, ORCID
Added: August 6, 2018

2011 article

Plasmonics and effective-medium theories

Aspnes, D. E. (2011, February 28). THIN SOLID FILMS, Vol. 519, pp. 2571–2574.

By: D. Aspnes n

author keywords: Plasmons; Plasmonics; Effective-medium theory; Dielectric function
Sources: Web Of Science, ORCID
Added: August 6, 2018

2011 article

Roughness Analysis of the Critical Dimension by Using Spectroscopic Ellipsometry

Ghong, T. H., Han, S.-H., Chung, J.-M., Byun, J. S., Kim, Y. D., & Aspnes, D. E. (2011, May). JOURNAL OF THE KOREAN PHYSICAL SOCIETY, Vol. 58, pp. 1426–1428.

By: T. Ghong, S. Han, J. Chung, J. Byun, Y. Kim* & D. Aspnes n

author keywords: RCWA; Roughness; Ellipsometry
Sources: Web Of Science, ORCID
Added: August 6, 2018

2010 article

Bond models in linear and nonlinear optics

Aspnes, D. E. (2010, August). PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, Vol. 247, pp. 1873–1880.

By: D. Aspnes n

author keywords: bond models; frequency conversion; nonlinear optics; optical properties
Sources: Web Of Science, ORCID
Added: August 6, 2018

2010 article

Chemical-etch-assisted growth of epitaxial zinc oxide

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 28, pp. 689–692.

By: E. Adles n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2010 journal article

Dielectric functions and interband transitions of In1-xAlxSb alloys

APPLIED PHYSICS LETTERS, 97(11).

By: J. Yoon*, T. Kim*, Y. Jung*, D. Aspnes n, Y. Kim*, H. Kim*, Y. Chang*, S. Shin*, J. Song*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2010 journal article

Ellipsometric study of single-crystal gamma-InSe from 1.5 to 9.2 eV

APPLIED PHYSICS LETTERS, 96(18).

By: S. Choi*, D. Aspnes n, A. Fuchser*, C. Martinez-Tomas*, V. Munoz Sanjose* & D. Levi*

author keywords: critical points; dielectric function; ellipsometry; III-VI semiconductors; indium compounds; Kramers-Kronig relations; optical films; ultraviolet spectra
Sources: Web Of Science, ORCID
Added: August 6, 2018

2010 journal article

Measurement and control of in-plane surface chemistry during the oxidation of H-terminated (111) Si

Proceedings of the National Academy of Sciences, 107(41), 17503–17508.

By: B. Gokce n, E. Adles n, D. Aspnes n & K. Gundogdu n

author keywords: silicon; hyperpolarizability; ellipsometry; metrology; optical
MeSH headings : Anisotropy; Chemistry / methods; Hydrogen / chemistry; Models, Chemical; Molecular Conformation; Nonlinear Dynamics; Oxidation-Reduction; Silicon / chemistry
Sources: Web Of Science, Crossref, ORCID
Added: August 6, 2018

2010 journal article

Nondestructive analysis of coated periodic nanostructures from optical data

OPTICS LETTERS, 35(5), 733–735.

By: T. Ghong*, S. Han*, J. Chung*, J. Byun*, T. Kim*, D. Aspnes*, Y. Kim*, I. Park*, Y. Kim*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2010 journal article

Thickness inhomogeneities and growth mechanisms of GaP heteroepitaxy by organometallic chemical vapor deposition

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 28(4), 583–589.

By: X. Liu n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2009 journal article

Analytical solution of thickness variations in selective area growth by organometallic chemical vapor deposition

Applied Physics Letters, 94(25), 253112.

By: X. Liu n & D. Aspnes n

author keywords: chemical vapour deposition; conformal mapping; thin films
Sources: Crossref, ORCID
Added: September 7, 2020

2009 journal article

Follow the light: Ellipsometry and polarimetry

PHYSICS TODAY, 62(5), 70–71.

By: H. Arwin* & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2009 journal article

Interband transitions of InAsxSb1-x alloy films

APPLIED PHYSICS LETTERS, 95(11).

By: T. Kim*, J. Yoon*, S. Hwang*, D. Aspnes n, Y. Kim*, H. Kim*, Y. Chang*, J. Song*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2009 journal article

Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films

OPTICS LETTERS, 34(18), 2867–2869.

By: S. Franzen n, C. Rhodes n, M. Cerruti n, R. Gerber n, M. Losego n, J. Maria n, D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2008 article

Analysis of interface layers by spectroscopic ellipsometry

Kim, T. J., Yoon, J. J., Kim, Y. D., Aspnes, D. E., Klein, M. V., Ko, D.-S., … Coleman, J. J. (2008, November 30). APPLIED SURFACE SCIENCE, Vol. 255, pp. 640–642.

By: T. Kim*, J. Yoon*, Y. Kim*, D. Aspnes n, M. Klein*, D. Ko*, Y. Kim*, V. Elarde*, J. Coleman*

author keywords: AlGaAs; Ellipsometry; Multilayer
Sources: Web Of Science, ORCID
Added: August 6, 2018

2008 journal article

Application of the anisotropic bond model to second-harmonic generation from amorphous media

PHYSICAL REVIEW B, 77(16).

By: E. Adles n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2008 journal article

Dependence of plasmon polaritons on the thickness of indium tin oxide thin films

Journal of Applied Physics, 103(9), 093108.

By: C. Rhodes n, M. Cerruti n, A. Efremenko n, M. Losego n, D. Aspnes n, J. Maria n, S. Franzen n

Sources: Crossref, ORCID, NC State University Libraries
Added: August 6, 2018

2008 journal article

Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 205(4), 884–887.

By: S. Choi*, D. Aspnes n, N. Stoute n, Y. Kim*, H. Kim*, Y. Chang*, C. Palmstrom*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2008 journal article

Investigation of heteroepitaxy on nanoscopically roughened (001)Si by real-time spectroscopic polarimetry

Physica Status Solidi (c), 5(5), 1312–1315.

By: X. Liu n, I. Kim n & D. Aspnes n

Sources: Crossref, ORCID
Added: September 7, 2020

2008 journal article

Model dielectric functions for AlxGa1-xAs alloys of arbitrary compositions

JOURNAL OF APPLIED PHYSICS, 104(1).

By: Y. Jung*, T. Kim*, J. Yoon*, Y. Kim* & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2008 patent

Normal incidence rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2008 journal article

Optical properties of InxAl1-xAs alloy films

APPLIED PHYSICS LETTERS, 92(15).

By: J. Yoon*, T. Ghong*, J. Byun*, Y. Kim*, D. Aspnes n, H. Kim*, Y. Chang*, J. Song*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2008 journal article

Overlayer effects in the critical-point analysis of ellipsometric spectra: Application to InxGa1-xAs alloys

JOURNAL OF APPLIED PHYSICS, 103(7).

By: T. Ghong*, T. Kim*, Y. Jung*, Y. Kim* & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2008 journal article

The anisotropic bond model of nonlinear optics

Physica Status Solidi (a), 205(4), 728–731.

By: E. Adles n & D. Aspnes n

Sources: Web Of Science, Crossref, ORCID
Added: August 6, 2018

2008 journal article

The nearly aligned rotating-monoplate compensator

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 205(4), 739–742.

By: M. Asar n & D. Aspnes*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2008 journal article

Thickness inhomogenities in the organometallic chemical vapor deposition of GaP

APPLIED PHYSICS LETTERS, 93(20).

By: X. Liu n & D. Aspnes n

author keywords: catalysis; desorption; diffusion; gallium compounds; III-V semiconductors; MOCVD; semiconductor growth; semiconductor thin films
Sources: Web Of Science, ORCID
Added: August 6, 2018

2007 journal article

Analytic determination of n, k, and d of an absorbing film from polarimetric data in the thin-film limit

JOURNAL OF APPLIED PHYSICS, 101(3).

By: I. Kim n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2007 journal article

Dielectric functions and electronic structure of InAsxP1-x films on InP

APPLIED PHYSICS LETTERS, 91(4).

By: S. Choi*, C. Palmstrom*, Y. Kim*, D. Aspnes n, H. Kim* & Y. Chang*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2007 journal article

Effect of overlayers on critical-point parameters in the analysis of ellipsometric spectra

APPLIED PHYSICS LETTERS, 91(12).

By: Y. Jung, T. Ghong, Y. Kim & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2007 article

Initial stages of GaP heteroepitaxy on nanoscopically roughened (001)SI

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 25, pp. 1448–1452.

By: X. Liu n, I. Kim n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2007 journal article

Investigation of effective-medium approximation, alloy, average-composition, and graded-composition models for interface analysis by spectroscopic ellipsometry

JOURNAL OF APPLIED PHYSICS, 102(6).

By: T. Kim*, T. Ghong*, Y. Kim*, D. Aspnes n, M. Klein*, D. Ko*, Y. Kim*, V. Elarde*, J. Coleman*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2007 patent

Normal incidence rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

Interface analysis of an AlGaAs multilayer system by using spectroscopic ellipsometry

Journal of the Korean Physical Society, 48(6), 1601–1605.

By: T. Ghong, Y. Kim, D. Aspnes, M. Klein, D. Ko, Y. Kim, V. Elarde, J. Coleman

Source: NC State University Libraries
Added: August 6, 2018

2006 article

Suppression of Jahn-Teller term-split band edge states in the x-ray absorption spectra of non-crystalline Zr silicates and Si oxynitride alloys, and alloys of ZrO2 with Y2O3

Lucovsky, G., Fulton, C. C., Ju, B. S., Stoute, N. A., Tao, S., Aspnes, D. E., & Luening, J. (2006, November). RADIATION PHYSICS AND CHEMISTRY, Vol. 75, pp. 1591–1595.

By: G. Lucovsky n, C. Fulton n, B. Ju n, N. Stoute n, S. Tao n, D. Aspnes n, J. Luening

author keywords: x-ray absorption spectra; x-ray absorption spectroscopy; Jahn-Teller term-spit states; Zr silicate alloys; cubic zirconia and hafnia
Sources: ORCID, Web Of Science
Added: August 6, 2018

2006 journal article

Systematic approach for analyzing reflectance-difference spectra: Application to silicon-dielectric interfaces

APPLIED PHYSICS LETTERS, 88(20).

By: M. Brinkley n, G. Powell n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2006 journal article

Toward n kappa d spectroscopy: Analytic solution of the three-phase model of polarimetry in the thin-film limit

APPLIED PHYSICS LETTERS, 88(20).

By: I. Kim n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2005 article

Conduction band states of transition metal (TM) high-k gate dielectrics as determined from X-ray absorption spectra

MICROELECTRONICS RELIABILITY, Vol. 45, pp. 827–830.

By: G. Lucovsky n, J. Hong n, C. Fulton n, N. Stoute n, Y. Zou n, R. Nemanich n, D. Aspnes n, H. Ade n, D. Schlom*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2005 journal article

Dielectric functions of AlxGa1-xSb (0.00 <= x <= 0.39) alloys from 1.5 to 6.0 eV

JOURNAL OF APPLIED PHYSICS, 98(10).

Sources: Web Of Science, ORCID
Added: August 6, 2018

2005 journal article

Dipole-radiation model for terahertz radiation from semiconductors

APPLIED PHYSICS LETTERS, 86(21).

By: H. Peng n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2005 article

Optical properties of (GaSb)(3n)(AlSb)(n) (1 <= n <= 5) superlattices

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 23, pp. 1149–1153.

Sources: Web Of Science, ORCID
Added: August 6, 2018

2005 review

Real-time diagnostics for metalorganic vapor phase epitaxy

[Review of ]. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 242(13), 2551–2560.

By: D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2005 journal article

Relative bulk and interface contributions to optical second-harmonic generation in silicon

PHYSICAL REVIEW B, 72(20).

By: H. Peng n, E. Adles n, J. Wang n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Biplate artifacts in rotating-compensator ellipsometers

Ebert, K., & Aspnes, D. E. (2004, May 1). THIN SOLID FILMS, Vol. 455, pp. 779–783.

By: K. Ebert & D. Aspnes*

author keywords: biplate artifacts; rotating-compensator ellipsometers; interference oscillations; compensators
Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Calculation of bulk third-harmonic generation from crystalline Si with the simplified bond hyperpolarizability model

PHYSICAL REVIEW B, 70(16).

By: H. Peng n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Comparison of the capabilities of rotating-analyzer and rotating-compensator ellipsometers by measurements on a single system

Mori, T., & Aspnes, D. E. (2004, May 1). THIN SOLID FILMS, Vol. 455, pp. 33–38.

By: T. Mori & D. Aspnes*

author keywords: rotating-analyzer ellipsometer (RAE); rotating-compensator ellipsometer (RCE); depolarization; polarizer leakage
Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Expanding horizons: new developments in ellipsometry and polarimetry

Aspnes, D. E. (2004, May 1). THIN SOLID FILMS, Vol. 455, pp. 3–13.

By: D. Aspnes n

author keywords: ellipsometry; Mueller-matrix; polarimetry
Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Integrated rotating-compensator polarimeter for real-time measurements and analysis of organometallic chemical vapor deposition

Flock, K., Kim, S. J., Asar, M., Kim, I. K., & Aspnes, D. E. (2004, May 1). THIN SOLID FILMS, Vol. 455, pp. 639–644.

By: K. Flock n, S. Kim n, M. Asar n, I. Kim n & D. Aspnes n

author keywords: rotating-compensator rotating-sample spectroscopic polarimeter; organometallic chemical vapor deposition; heteroepitaxial growth; ellipsometry; GaSb
Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Optical anisotropy relevant to rotating-compensator polarimeters: application to the monoplate retarder

Asar, M., & Aspnes, D. E. (2004, May 1). THIN SOLID FILMS, Vol. 455, pp. 50–53.

By: M. Asar n & D. Aspnes n

author keywords: optical anisotropy; monoplate; transmitted intensity; compensator
Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 journal article

Optical properties of Cd1-xMgxTe (x=0.00, 0.23, 0.31, and 0.43) alloy films

APPLIED PHYSICS LETTERS, 84(5), 693–695.

By: Y. Ihn*, T. Kim*, Y. Kim*, D. Aspnes n & J. Kossut*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 journal article

Optimizing precision of rotating-analyzer and rotating-compensator-ellipsometers

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 21(3), 403–410.

By: D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Parametric modeling of the dielectric functions of Cd1-xMgxTe alloy films

Ihn, Y. S., Kim, T. J., Ghong, T. H., Kim, Y. D., Aspnes, D. E., & Kossut, J. (2004, May 1). THIN SOLID FILMS, Vol. 455, pp. 222–227.

By: Y. Ihn*, T. Kim*, T. Ghong*, Y. Kim*, D. Aspnes n & J. Kossut*

author keywords: dielectric functions; Cd1-xMgxTe; chemical etching
Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Real-time characterization of GaSb homo- and heteroepitaxy

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 22, pp. 2233–2239.

By: S. Kim n, K. Flock n, M. Asar n, I. Kim n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 journal article

Spectroscopic ellipsometric analysis of interfaces: Comparison of alloy and effective-medium-approximation approaches to a CdMgTe multilayer system

APPLIED PHYSICS LETTERS, 85(6), 946–948.

By: T. Ghong*, T. Kim*, Y. Kim* & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2003 article

Application of the simplified bond-hyperpolarizability model to fourth-harmonic generation

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 21, pp. 1798–1803.

By: J. Hansen n, H. Peng n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2003 patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Dielectric functions of Cd1-xMgxTe alloy films by uusing spectroscopic ellipsometry

Journal of the Korean Physical Society, 43(4), 634–637.

By: Y. Ihn, T. Kim, Y. Kim, D. Aspnes & J. Kossut

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Dielectric functions of InxGa1-xAs alloys

PHYSICAL REVIEW B, 68(11).

By: T. Kim*, T. Ghong*, Y. Kim*, S. Kim n, D. Aspnes n, T. Mori*, T. Yao*, B. Koo*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2003 journal article

Optical properties of InGaAs alloy films in the E-2 region by spectroscopic ellipsometry

Journal of the Korean Physical Society, 42(2003 Feb), S242–245.

By: Y. Ihn, T. Ghong, Y. Kim, S. Kim, D. Aspnes, T. Yao, B. Koo

Source: NC State University Libraries
Added: August 6, 2018

2003 article

Simplified bond-hyperpolarizability model of second- and fourth-harmonic generation: application to Si-SiO2 interfaces

Aspnes, D. E., Hansen, J. K., Peng, H. J., Powell, G. D., & Wang, J. F. T. (2003, December). PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, Vol. 240, pp. 509–517.

By: D. Aspnes*, J. Hansen, H. Peng*, G. Powell & J. Wang

Sources: Web Of Science, ORCID
Added: August 6, 2018

2003 journal article

Study of the dielectric function of ZnS by spectroscopic ellipsometry

Journal of the Korean Physical Society, 42(2003 Feb), S238–241.

By: T. Ghong, T. Kim, Y. Kim, S. Kim, D. Aspnes, Y. Choi, Y. Yu

Source: NC State University Libraries
Added: August 6, 2018

2002 patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Pseudodielectric function of ZnGeP2 from 1.5 to 6 eV

APPLIED PHYSICS LETTERS, 81(4), 628–630.

By: V. Blickle*, K. Flock n, N. Dietz n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 journal article

Pseudodielectric functions of InGaAs alloy films grown on InP

APPLIED PHYSICS LETTERS, 81(13), 2367–2369.

By: T. Kim*, Y. Ihn*, Y. Kim*, S. Kim n, D. Aspnes n, T. Yao*, K. Shim*, B. Koo*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 journal article

Simplified bond-hyperpolarizability model of second harmonic generation

PHYSICAL REVIEW B, 65(20).

By: G. Powell n, J. Wang n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 article

Simplified bond-hyperpolarizability model of second harmonic generation: Application to Si-dielectric interfaces

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 20, pp. 1699–1705.

By: J. Wang n, G. Powell n, R. Johnson n, G. Lucovsky n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 patent

Thin film optical measurement system and method with calibrating ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, J. Opsal & J. Faton

Source: NC State University Libraries
Added: August 6, 2018

2001 journal article

Above bandgap optical properties of ZnS and ZnS1-xTex alloys grown by using hot-wall epitaxy

Journal of the Korean Physical Society, 39(3), 462–465.

By: C. Bang, M. Lee, T. Kim, Y. Kim, D. Aspnes, Y. Yu, B. O, Y. Choi

Source: NC State University Libraries
Added: August 6, 2018

2001 patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2001 journal article

Elimination of endpoint-discontinuity artifacts in the analysis of spectra in reciprocal space

JOURNAL OF APPLIED PHYSICS, 89(12), 8183–8192.

By: S. Yoo n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2001 patent

Ellipsometer and polarimeter with zero-order plate compensator

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Law

Source: NC State University Libraries
Added: August 6, 2018

2001 journal article

Investigation and control of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 184(1), 79–87.

By: M. Ebert n, K. Bell n, K. Flock n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2001 journal article

Investigation of noise in a spectrometer system using a short-arc source

REVIEW OF SCIENTIFIC INSTRUMENTS, 72(8), 3477–3479.

By: M. Ebert n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2001 article

Linear and nonlinear optical spectroscopy of surfaces and interfaces

Aspnes, D. E. (2001, December 16). PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Vol. 188, pp. 1353–1360.

By: D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2001 journal article

Nondestructive measurement of a glass transition temperature at spin-cast semicrystalline polymer surfaces

MACROMOLECULES, 34(8), 2395–2397.

By: J. Hyun n, D. Aspnes n & J. Cuomo n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2001 journal article

Ordinary and extraordinary dielectric functions of 4H-and 6H-SiC from 3.5 to 9.0 eV

APPLIED PHYSICS LETTERS, 78(18), 2715–2717.

By: O. Lindquist*, K. Jarrendahl*, S. Peters*, J. Zettler*, C. Cobet*, N. Esser*, D. Aspnes n, A. Henry*, N. Edwards*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2001 journal article

Spectroscopic ellipsometric study of the dielectric function of ZnSe and its overlayer

Journal of the Korean Physical Society, 39(2001 Dec), S372–375.

By: T. Kim, M. Koo, M. Lee, Y. Kim, D. Aspnes & B. Jonker

Source: NC State University Libraries
Added: August 6, 2018

2001 journal article

Spectroscopic ellipsometry study of InGaAs alloy films grown on InP

Journal of the Korean Physical Society, 39(2001 Dec), S389–392.

By: G. Seong, C. Bang, Y. Kim, J. Wang, D. Aspnes, B. Koo, T. Yao

Source: NC State University Libraries
Added: August 6, 2018

2001 patent

Thin film optical measurement system and method with calibrating ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, J. Opsal & J. Faton

Source: NC State University Libraries
Added: August 6, 2018

2000 patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

2000 article

Characterization of Al(x)Ga(1-x)N-compound layers by reflectance difference spectroscopy

Rossow, U., & Aspnes, D. E. (2000, January). PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Vol. 177, pp. 157–163.

By: U. Rossow* & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Coherence effects and time dependences of the optical response of surfaces and interfaces of optically absorbing materials

Aspnes, D. E., Mantese, L., Bell, K. A., & Rossow, U. (2000, July). PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, Vol. 220, pp. 709–715.

By: D. Aspnes*, L. Mantese*, K. Bell* & U. Rossow

Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 journal article

Dielectric function and bowing parameter of Zn1-xMgxSe and Zn1-xBexSe alloys

JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 37(6), 1012–1016.

By: H. Lee*, I. Kim*, J. Powell n, D. Aspnes n, S. Lee*, F. Peiris*, J. Furdyna*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 journal article

Dielectric function of epitaxial ZnSe films

APPLIED PHYSICS LETTERS, 77(21), 3364–3366.

By: M. Koo*, T. Kim*, M. Lee*, M. Oh*, Y. Kim*, S. Yoo n, D. Aspnes n, B. Jonker*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 journal article

Effect of Ar+ ion beam in the process of plasma surface modification of PET films

JOURNAL OF APPLIED POLYMER SCIENCE, 77(8), 1679–1683.

By: J. Hyun n, P. Barletta n, K. Koh n, S. Yoo n, J. Oh n, D. Aspnes n, J. Cuomo n

author keywords: polymer; plasma; ion beam; crosslinking; hydrophilic
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

High-resolution spectroscopy with reciprocal-space analysis: Application to isotopically pure Si

Yoo, S. D., Aspnes, D. E., Lastras-Martinez, L. F., Ruf, T., Konuma, M., & Cardona, M. (2000, July). PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, Vol. 220, pp. 117–125.

By: S. Yoo n, D. Aspnes n, L. Lastras-Martinez*, T. Ruf*, M. Konuma* & M. Cardona*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy

Ebert, M., Bell, K. A., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, March 27). THIN SOLID FILMS, Vol. 364, pp. 22–27.

By: M. Ebert n, K. Bell n, S. Yoo n, K. Flock n & D. Aspnes n

author keywords: real-time monitoring; metalorganic vapor phase epitaxy; growth control; spectroscopic ellipsometry; reflectance-difference spectroscopy; silicon (Si); gallium phosphide (GaP)
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 journal article

Isotopic effects on the dielectric response of Si around the E-1 gap

PHYSICAL REVIEW B, 61(19), 12946–12951.

By: L. Lastras-Martinez*, T. Ruf*, M. Konuma*, M. Cardona* & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 patent

Method of reducing noise generated by arc lamps in optical systems employing slits

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & M. Ebert

Source: NC State University Libraries
Added: August 6, 2018

2000 article

Optical characterization of wide bandgap semiconductors

Edwards, N. V., Bremser, M. D., Batchelor, A. D., Buyanova, I. A., Madsen, L. D., Yoo, S. D., … Monemar, B. (2000, March 27). THIN SOLID FILMS, Vol. 364, pp. 98–106.

By: N. Edwards*, M. Bremser n, A. Batchelor n, I. Buyanova*, L. Madsen*, S. Yoo n, T. Welhkamp, K. Wilmers* ...

author keywords: GaN; strain; valence bands; reflectance; excitons; reciprocal space analysis; spectroscopic ellipsometry
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 journal article

Optical properties of AlxGa1-xP (0 <= x <= 0.52) alloys

JOURNAL OF APPLIED PHYSICS, 87(3), 1287–1290.

By: S. Choi*, Y. Kim*, S. Yoo n, D. Aspnes n, D. Woo* & S. Kim*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Real-time assessment of overlayer removal on 4H-SiC surfaces: Techniques and relevance to contact formation

SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2, Vol. 338-3, pp. 1033–1036.

By: N. Edwards*, L. Madsen*, K. Robbie*, G. Powell n, K. Jarrendahl*, C. Cobet*, N. Esser*, W. Richter*, D. Aspnes n

author keywords: cleaning; contact; spectroscopic ellipsometry; surface preparation; synchrotron
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 journal article

Real-time assessment of selected surface preparation regimens for 4H-SiC surfaces using spectroscopic ellipsometry

SURFACE SCIENCE, 464(1), L703–L707.

By: N. Edwards*, K. Jarrendahl*, D. Aspnes n, K. Robbie*, G. Powell n, C. Cobet*, N. Esser*, W. Richter*, L. Madsen*

author keywords: contact; ellipsometry; etching; semiconducting surfaces; silicon carbide; vicinal single crystal surfaces
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 18, pp. 1184–1189.

By: K. Bell n, M. Ebert n, S. Yoo n, K. Flock n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor

Bell, K. A., Ebert, M., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, January). JOURNAL OF ELECTRONIC MATERIALS, Vol. 29, pp. 106–111.

By: K. Bell n, M. Ebert n, S. Yoo n, K. Flock n & D. Aspnes n

author keywords: real-time monitoring; organometallic vapor phase epitaxy; quadrupole mass spectrometry; spectroscopic ellipsometry; reflectance-difference spectroscopy; silicon (Si); gallium phosphide (GaP)
Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 article

Surface-induced optical anisotropy of Si and Ge

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 18, pp. 2229–2231.

By: U. Rossow, L. Mantese & D. Aspnes*

Sources: Web Of Science, ORCID
Added: August 6, 2018

2000 journal article

Visible-near ultraviolet ellipsometric study of Zn1-xMgxSe and Zn1-xBexSe alloys

JOURNAL OF APPLIED PHYSICS, 88(2), 878–882.

By: H. Lee*, I. Kim*, J. Powell n, D. Aspnes n, S. Lee*, F. Peiris*, J. Furdyna*

Sources: Web Of Science, ORCID
Added: August 6, 2018

1999 article

Analysis of high-index Si(001) surfaces by reflectance difference spectroscopy

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 17, pp. 1652–1656.

By: L. Mantese*, Q. Xue*, T. Sakurai & D. Aspnes*

Sources: Web Of Science, ORCID
Added: August 6, 2018

1999 patent

Broadband spectroscopic rotating compensator ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & J. Opsal

Source: NC State University Libraries
Added: August 6, 2018

1999 article

Comment on "Ab initio calculation of excitonic effects in the optical spectra of semiconductors"

Cardona, M., Lastras-Martinez, L. F., & Aspnes, D. E. (1999, November 8). PHYSICAL REVIEW LETTERS, Vol. 83, pp. 3970–3970.

By: M. Cardona*, L. Lastras-Martinez* & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

1999 journal article

Dielectric function of Cd0.57Mg0.43Te alloy film studied by ellipsometry

Journal of the Korean Physical Society, 34(1999 June), S496–498.

By: T. Kim, Y. Kim, S. Yoo, D. Aspnes & J. Kossut

Source: NC State University Libraries
Added: August 6, 2018

1999 article

High-resolution spectroscopy with reciprocal-space analysis

Aspnes, D. E., & Yoo, S. D. (1999, September). PHYSICA STATUS SOLIDI B-BASIC RESEARCH, Vol. 215, pp. 715–723.

By: D. Aspnes* & S. Yoo n

Sources: Web Of Science, ORCID
Added: August 6, 2018

1999 journal article

Photon-induced localization in optically absorbing materials

PHYSICS LETTERS A, 253(1-2), 93–97.

By: L. Mantese n, K. Bell n, D. Aspnes n & U. Rossow*

author keywords: localization; surface optical absorption
Sources: Web Of Science, ORCID
Added: August 6, 2018

1999 journal article

Proximal electromagnetic shear forces

Journal of Microscopy, 196(1), 59–60.

By: E. Ayars n, D. Aspnes n, P. Moyer* & M. Paesler n

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 journal article

Relaxation phenomena in GaN/ AlN/ 6H-SiC heterostructures

MRS Internet Journal of Nitride Semiconductor Research, 4S1(G3.78).

By: N. Edwards*, A. Batchelor*, I. Buyanova*, L. Madsen*, M. Bremser n, R. Davis n, D. Aspnes n, B. Monemar*

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1999 patent

Thin film optical measurement system and method with calibrating ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, J. Opsal & J. Faton

Source: NC State University Libraries
Added: August 6, 2018

1998 article

Analysis of optical spectra by Fourier methods

Yoo, S. D., Edwards, N. V., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 143–148.

By: S. Yoo n, N. Edwards n & D. Aspnes n

author keywords: Fourier analysis; critical points; spectroscopic ellipsometry; reflectance; filtering
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Analytic representations of the dielectric functions of crystalline and amorphous Si and crystalline Ge for very large scale integrated device and structural modeling

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 16, pp. 1654–1657.

By: J. Leng, J. Opsal, H. Chu, M. Senko & D. Aspnes*

Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Analytic representations of the dielectric functions of materials for device and structural modeling

Leng, J., Opsal, J., Chu, H., Senko, M., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 132–136.

By: J. Leng*, J. Opsal*, H. Chu*, M. Senko* & D. Aspnes*

author keywords: analytic representations; dielectric functions; crystalline Si; amorphous Si; silicon nitride
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Broadband spectral operation of a rotating-compensator ellipsometer

Opsal, J., Fanton, J., Chen, J., Leng, J., Wei, L., Uhrich, C., … Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 58–61.

By: J. Opsal, J. Fanton, J. Chen, J. Leng, L. Wei, C. Uhrich, M. Senko, C. Zaiser, D. Aspnes*

author keywords: rotating-compensator ellipsometer (RCE); least-squares analysis; pseudodielectric function; crystalline Si
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Interpretation of critical point energy shifts in crystalline Si by near-surface localization of excited electronic states

Mantese, L., Bell, K. A., Rossow, U., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 557–560.

By: L. Mantese n, K. Bell n, U. Rossow* & D. Aspnes n

author keywords: localization; wave packet
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Lineshapes of surface induced optical anisotropy spectra measured by RDS/RAS

Rossow, U., Mantese, L., & Aspnes, D. E. (1998, January). APPLIED SURFACE SCIENCE, Vol. 123, pp. 237–242.

By: U. Rossow*, L. Mantese n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 journal article

Many-body and correlation effects in surface and interface spectra of optically absorbing materials

Physica Status Solidi. A, Applications and Materials Science, 170(2), 199–210.

By: D. Aspnes, L. Mantese, K. Bell & U. Rossow

Source: NC State University Libraries
Added: August 6, 2018

1998 article

Optical approaches for controlling epitaxial growth

Aspnes, D. E., & Dietz, N. (1998, June). APPLIED SURFACE SCIENCE, Vol. 130, pp. 367–376.

By: D. Aspnes n & N. Dietz n

author keywords: epitaxial growth; optical spectroscopy; OMCVD
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Optical characterization of GaAs/AlAs short period superlattices

Woo, D. H., Han, I. K., Choi, W. J., Lee, S., Kim, H. J., Lee, J. I., … Woo, J. C. (1998, August). MICROELECTRONIC ENGINEERING, Vol. 43-4, pp. 265–270.

By: D. Woo*, I. Han*, W. Choi*, S. Lee*, H. Kim*, J. Lee*, S. Kim*, K. Kang* ...

Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Photon-induced localization and final-state correlation effects in optically absorbing materials

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 16, pp. 2367–2372.

By: D. Aspnes*, L. Mantese, K. Bell & U. Rossow

Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Reflectance difference spectroscopy spectra of clean (3 x 2), (2 x 1), and c(2 x 2) 3C-SiC(001) surfaces: New evidence for surface state contributions to optical anisotropy spectra

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 16, pp. 2355–2357.

By: U. Rossow, K. Lindner, M. Lubbe, D. Aspnes & D. Zahn

Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films

Edwards, N. V., Yoo, S. D., Bremser, M. D., Horton, M. N., Perkins, N. R., Weeks, T. W., … Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 187–192.

By: N. Edwards*, S. Yoo*, M. Bremser*, M. Horton, N. Perkins, T. Weeks*, H. Liu, R. Stall ...

author keywords: GaN; spectroscopic ellipsometry; reflectance; valence bands; excitons; reciprocal space analysis
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Systematic differences among nominal reference dielectric function spectra for crystalline Si as determined by spectroscopic ellipsometry

Bell, K. A., Mantese, L., Rossow, U., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 161–166.

By: K. Bell n, L. Mantese n, U. Rossow n & D. Aspnes n

author keywords: ellipsometry; optical modeling; dielectric function; silicon
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 patent

Thin film optical measurement system and method with calibrating ellipsometer

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, J. Opsal & J. Faton

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Trends in residual stress for GaN/AlN/6H-SiC heterostructures

APPLIED PHYSICS LETTERS, 73(19), 2808–2810.

By: N. Edwards n, M. Bremser n, R. Davis n, A. Batchelor n, S. Yoo n, C. Karan n, D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 journal article

Above bandgap dielectric function of epitaxial ZnSe layers

Journal of the Korean Physical Society, 31(4), L553–555.

By: Y. Kim, Y. Ko, S. Choi, S. Yoo, D. Aspnes & B. Jonker

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Ellipsometric studies of Cd1-xMgxTe (0<=x<=0.5) alloys

APPLIED PHYSICS LETTERS, 71(2), 249–251.

By: S. Choi*, Y. Kim*, S. Yoo n, A. Duk, D. Miotkowski*, I., A. Ramdas*

Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 article

Evidence of near-surface localization of excited electronic states in crystalline Si

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 15, pp. 1196–1200.

By: L. Mantese*, K. Bell, U. Rossow & D. Aspnes

Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 article

Growth, doping and characterization of AlxGa1-xN thin film alloys on 6H-SiC(0001) substrates

Bremser, M. D., Perry, W. G., Zheleva, T., Edwards, N. V., Nam, O. H., Parikh, N., … Davis, R. F. (1997, March). DIAMOND AND RELATED MATERIALS, Vol. 6, pp. 196–201.

By: M. Bremser n, W. Perry n, T. Zheleva n, N. Edwards n, O. Nam n, N. Parikh*, D. Aspnes n, R. Davis n

author keywords: GaN; alloy; AlGaN epitaxy; SiC substrates
Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 conference paper

In-plane optical anisotropies of Al(x)Ga(1-x)N films in their regions of transparency

III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society symposia proceedings ; v. 449), 835–840.

By: U. Rossow n, N. Edwards n, M. Bremser n, R. Kern n, H. Liu*, R. Davis n, D. Aspnes n

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 conference paper

Low pH chemical etch route for smooth H-terminated Si(100) and study of subsequent chemical stability

Environmental, safety, and health issues in IC production: Symposium held December 4-5, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society Symposium proceedings, no. 447), 191–196. Pittsburgh, PA: Materials Research Society.

By: B. Hinds, D. Aspenes & G. Lucovsky

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Molecular layer epitaxy by real-time optical process monitoring

Applied Surface Science, 112(1997 Mar.), 38–47.

By: K. Bachmann n, C. Hopfner n, N. Sukidi n, A. Miller n, C. Harris n, D. Aspnes n, N. Dietz n, H. Tran n ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 conference paper

Multilevel approaches toward monitoring and control of semiconductor epitaxy

Control of semiconductor surfaces and interfaces: Symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society Symposium proceedings, no. 448), 451–462.

By: D. Aspnes n, N. Dietz n, U. Rossow n & K. Bachmann*

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1997 journal article

Real-time optical analysis and control of semiconductor epitaxy: Progress and opportunity

SOLID STATE COMMUNICATIONS, 101(2), 85–92.

By: D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 journal article

Spectral analysis of above-, below-, and near-bandedge phenomena in GaN thin films

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 50(1-3), 134–141.

By: N. Edwards n, S. Yoo n, M. Bremser n, T. Zheleva n, M. Horton*, N. Perkins*, T. Weeks n, H. Liu* ...

author keywords: GaN thin films; spectroscopic ellipsometry; bandedge phenomena
Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 journal article

Spectroscopic ellipsometric characterization of undoped ZnTe films grown on GaAs

APPLIED PHYSICS LETTERS, 70(5), 610–612.

By: Y. Kim*, S. Choi*, M. Klein*, S. Yoo n, D. Aspnes n, S. Xin*, J. Furdyna*

Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 journal article

Spectroscopic ellipsometric study of Zn(1-x)Mn(x)Te films grown on GaAs

Journal of the Korean Physical Society, 31(1), 202–205.

By: S. Choi, Y. Kim, M. Klein, S. Yoo, D. Aspnes, S. Xin, J. Furdyna

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Spectroscopic ellipsometry study of GaAs/AlAs superlattices and Al(0.5)Ga(0.5)As alloy

Journal of the Korean Physical Society, 30(suppl.), 108–112.

By: S. Choi, Y. Kim, S. Yoo, D. Aspnes, S. Rhee, J. Woo, D. Woo, S. Kim, K. Kang

Source: NC State University Libraries
Added: August 6, 2018

1997 article

Surface and interface effects on ellipsometric spectra of crystalline Si

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 15, pp. 1205–1211.

By: K. Bell n, L. Mantese n, U. Rossow n & D. Aspnes n

Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 journal article

Variation of GaN valence bands with biaxial stress and quantification of residual stress

APPLIED PHYSICS LETTERS, 70(15), 2001–2003.

By: N. Edwards n, S. Yoo n, M. Bremser n, T. Weeks n, O. Nam n, R. Davis n, H. Liu, R. Stall ...

Sources: Web Of Science, ORCID
Added: August 6, 2018

1997 conference paper

Variation of GaN valence bands with biaxial stress: quantification of residual stress and impact on fundamental band parameters

III-V nitrides: symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society symposia proceedings ; v. 449), 781–786.

By: N. Edwards n, S. Yoo n, M. Bremser n, M. Horton*, N. Perkins*, T. Weeks n, H. Liu*, R. Stall* ...

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1994 patent

Extraction of spatially varying dielectric function from ellipsometric data

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1993 journal article

Minimal-data approaches for determining outer-layer dielectric responses of films from kinetic reflectometric and ellipsometric measurements

Journal of the Optical Society of America A, 10(5), 974.

By: D. Aspnes*

Sources: Crossref, ORCID
Added: June 30, 2019

1992 patent

Ellipsometric control of material growth

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & D. Quinn

Source: NC State University Libraries
Added: August 6, 2018

1992 journal article

Growth of AlxGa1−xAs parabolic quantum wells by real‐time feedback control of composition

Applied Physics Letters, 60(10), 1244–1246.

By: D. Aspnes*, W. Quinn, M. Tamargo, M. Pudensi, S. Schwarz, M. Brasil, R. Nahory, S. Gregory

Sources: Crossref, ORCID
Added: June 30, 2019

1990 patent

Optical control of deposition of crystal monolayers

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes, R. Bhat, E. Colas, L. Florez, J. Harbison & A. Studna

Source: NC State University Libraries
Added: August 6, 2018

1985 patent

Cylindrical grating monochromator for synchrotron radiation

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1983 journal article

Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV

Physical Review B, 27(2), 985–1009.

By: D. Aspnes* & A. Studna

Sources: Crossref, ORCID
Added: June 30, 2019

1983 patent

Method of preparing semiconductor surfaces

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes & A. Studna

Source: NC State University Libraries
Added: August 6, 2018

1982 journal article

Local‐field effects and effective‐medium theory: A microscopic perspective

American Journal of Physics, 50(8), 704–709.

By: D. Aspnes*

Sources: Crossref, ORCID
Added: June 30, 2019

1982 patent

Method for optical monitoring in materials fabrication

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1982 patent

Method for producing devices comprising high density amorphous silicon or germanium layers by low pressure CVD technique

Washington, DC: U.S. Patent and Trademark Office.

By: A. Adams, D. Aspnes & B. Bagley

Source: NC State University Libraries
Added: August 6, 2018

1982 journal article

Optical properties of thin films

Thin Solid Films, 89(3), 249–262.

By: D. Aspnes*

Sources: Crossref, ORCID
Added: June 30, 2019

1976 patent

Measurement of thin films by polarized light

Washington, DC: U.S. Patent and Trademark Office.

By: D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

1975 journal article

High Precision Scanning Ellipsometer

Applied Optics, 14(1), 220.

By: D. Aspnes* & A. Studna

Sources: Crossref, ORCID
Added: June 30, 2019

1966 journal article

Electric-Field Effects on Optical Absorption near Thresholds in Solids

Physical Review, 147(2), 554–566.

By: D. Aspnes*

Sources: Crossref, ORCID
Added: June 30, 2019

Employment

Updated: July 2nd, 2019 17:28

1992 - present

North Carolina State University Raleigh, NC, US
Director of Graduate Programs/Distinguished University Professor Physics