@article{progl_parish_vitarelli_russell_2008, title={Analysis of V defects in GaN-based light emitting diodes by scanning transmission electron microscopy and electron beam induced current}, volume={92}, number={24}, journal={Applied Physics Letters}, author={Progl, C. L. and Parish, C. M. and Vitarelli, J. P. and Russell, P. E.}, year={2008} }