@article{fancher_burch_patala_dickey_2022, title={Implications of gnomonic distortion on electron backscatter diffraction and transmission Kikuchi diffraction}, volume={1}, ISSN={["1365-2818"]}, url={https://app.dimensions.ai/details/publication/pub.1143660520}, DOI={10.1111/jmi.13077}, abstractNote={The effect of gnomonic distortion on orientation indexing of electron backscatter diffraction patterns is explored through simulation of electron diffraction patterns for sample‐to‐detector geometries associated with transmission Kikuchi diffraction (TKD) and electron backscatter diffraction (EBSD). Simulated data were analysed by computing a similarity index for both Hough transformed data and simulated patterns to determine the sensitivity of each method for detecting subtle differences in the effect of gnomonic distortions on electron diffraction patterns. These results indicate that the increased gnomonic distortions in electron diffraction patterns for a TKD geometry enhance the sensitivity for detecting subtle differences in interband angles. Additionally, the utilisation of a Hough transform‐based indexing approach further enhances the sensitivity.}, number={2}, journal={JOURNAL OF MICROSCOPY}, author={Fancher, Chris M. and Burch, Matthew J. and Patala, Srikanth and Dickey, Elizabeth C.}, year={2022}, month={Jan} }
 @article{jhuang_fuentes_jones_esteves_fancher_furman_reich_2019, title={Spatial Signal Detection Using Continuous Shrinkage Priors}, volume={61}, ISSN={["1537-2723"]}, DOI={10.1080/00401706.2018.1546622}, abstractNote={Abstract Motivated by the problem of detecting changes in two-dimensional X-ray diffraction data, we propose a Bayesian spatial model for sparse signal detection in image data. Our model places considerable mass near zero and has heavy tails to reflect the prior belief that the image signal is zero for most pixels and large for an important subset. We show that the spatial prior places mass on nearby locations simultaneously being zero, and also allows for nearby locations to simultaneously be large signals. The form of the prior also facilitates efficient computing for large images. We conduct a simulation study to evaluate the properties of the proposed prior and show that it outperforms other spatial models. We apply our method in the analysis of X-ray diffraction data from a two-dimensional area detector to detect changes in the pattern when the material is exposed to an electric field.}, number={4}, journal={TECHNOMETRICS}, author={Jhuang, An-Ting and Fuentes, Montserrat and Jones, Jacob L. and Esteves, Giovanni and Fancher, Chris M. and Furman, Marschall and Reich, Brian J.}, year={2019}, month={Oct}, pages={494–506} }
 @article{johnson_fancher_hou_jones_2019, title={Structure of HfO2 modified with Y, Gd, and Zr at ambient conditions and high pressures}, volume={126}, ISSN={["1089-7550"]}, DOI={10.1063/1.5121024}, abstractNote={High-resolution and high-pressure X-ray diffraction measurements were performed to determine the effects of 5% Y, 3% Gd, and 50% Zr substitution on the crystal structure and polymorphism of HfO2. High-resolution experiments at ambient pressure show a mixture of monoclinic and cubic fluorite phases in 5% Y:HfO2 and 3% Gd:HfO2, while 50% Zr:HfO2 formed a monoclinic, single-phase solid solution. Crystallographic refinement using the Rietveld method indicates that Y and Gd substitute for Hf in both the monoclinic and cubic phases. High-pressure X-ray diffraction was performed in situ up to 31 GPa and shows that the pressure-induced phase transitions were reduced with the addition of either Y, Gd, or Zr relative to the transition pressures in undoped HfO2. The pressure-induced changes in lattice parameter, relative volume, and spontaneous strain are reported.}, number={20}, journal={JOURNAL OF APPLIED PHYSICS}, author={Johnson, Brienne and Fancher, Chris M. and Hou, Dong and Jones, Jacob L.}, year={2019}, month={Nov} }
 @article{jones_broughton_iamsasri_fancher_wilson_reich_smith_2019, title={The use of Bayesian inference in the characterization of materials and thin films}, volume={75}, ISSN={["2053-2733"]}, DOI={10.1107/S0108767319097940}, journal={ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES}, author={Jones, Jacob L. and Broughton, Rachel and Iamsasri, Thanakorn and Fancher, Chris M. and Wilson, Alyson G. and Reich, Brian and Smith, Ralph C.}, year={2019}, pages={A211–A211} }
 @article{iamsasri_guerrier_esteves_fancher_wilson_smith_paisley_johnson-wilke_ihlefeld_bassiri-gharb_et al._2017, title={A Bayesian approach to modeling diffraction profiles and application to ferroelectric materials}, volume={50}, journal={Journal of Applied Crystallography}, author={Iamsasri, T. and Guerrier, J. and Esteves, G. and Fancher, C. M. and Wilson, A. G. and Smith, R. C. and Paisley, E. A. and Johnson-Wilke, R. and Ihlefeld, J. F. and Bassiri-Gharb, N. and et al.}, year={2017}, pages={211–220} }
 @article{fancher_blendell_bowman_2017, title={Decoupling of superposed textures in an electrically biased piezoceramic with a 100 preferred orientation}, volume={110}, number={6}, journal={Applied Physics Letters}, author={Fancher, C. M. and Blendell, J. E. and Bowman, K. J.}, year={2017} }
 @article{esteves_fancher_roehrig_maier_jones_deluca_2017, title={Electric-field-induced structural changes in multilayer piezoelectric actuators during electrical and mechanical loading}, volume={132}, ISSN={["1873-2453"]}, DOI={10.1016/j.actamat.2017.04.014}, abstractNote={The effects of electrical and mechanical loading on the behavior of domains and phases in Multilayer Piezoelectric Actuators (MAs) is studied using in situ high-energy X-ray diffraction (XRD) and macroscopic property measurements. Rietveld refinement is carried out on measured diffraction patterns using a two-phase tetragonal (P4mm) and rhombohedral (R3m) model. Applying an electric field promotes the rhombohedral phase, while increasing compressive uniaxial pre-stress prior to electric field application favors the tetragonal phase. The competition between electrical and mechanical energy leads to a maximal difference between electric-field-induced phase fractions at 70 MPa pre-stress. Additionally, the available volume fraction of non-180° domain reorientation that can be accessed during electric field application increases with compressive pre-stress up to 70 MPa. The origin for enhanced strain and polarization with applied pre-stress is attributed to a combination of enhanced non-180° domain reorientation and electric-field-induced phase transitions. The suppression of both the electric-field-induced phase transitions and domain reorientation at high pre-stresses (>70 MPa) is attributed to a large mechanical energy barrier, and alludes to the competition of the electrical and mechanical energy within the MA during applied stimuli.}, journal={ACTA MATERIALIA}, author={Esteves, Giovanni and Fancher, Chris M. and Roehrig, Soeren and Maier, Guenther A. and Jones, Jacob L. and Deluca, Marco}, year={2017}, month={Jun}, pages={96–105} }
 @article{hou_aksel_fancher_usher_hoshina_takeda_tsurumi_jones_2017, title={Formation of sodium bismuth titanatebarium titanate during solid-state synthesis}, volume={100}, ISSN={["1551-2916"]}, DOI={10.1111/jace.14631}, abstractNote={Phase formation of sodium bismuth titanate (Na0.5Bi0.5TiO3 or NBT) and its solid solution with barium titanate (BaTiO3 or BT) during the calcination process is studied using in situ high-temperature diffraction. The reactant powders were mixed and heated to 1000°C, while X-ray diffraction patterns were recorded continuously. Phase evolutions from starting materials to final perovskite products are observed, and different transient phases are identified. The formation mechanism of NBT and NBT–xBT perovskite structures is discussed, and a reaction sequence is suggested based on the observations. The in situ study leads to a new processing approach, which is the use of nano-TiO2, and gives insights to the particle size effect for solid-state synthesis products. It was found that the use of nano-TiO2 as reactant powder accelerates the synthesis process, decreases the formation of transient phases, and helps to obtain phase-pure products using a lower thermal budget.}, number={4}, journal={JOURNAL OF THE AMERICAN CERAMIC SOCIETY}, author={Hou, Dong and Aksel, Elena and Fancher, Chris M. and Usher, Tedi-Marie and Hoshina, Takuya and Takeda, Hiroaki and Tsurumi, Takaaki and Jones, Jacob L.}, year={2017}, month={Apr}, pages={1330–1338} }
 @article{ochoa_levit_fancher_esteves_jones_garcia_2017, title={Low temperature dielectric relaxation in ordinary perovskite ferroelectrics: Enlightenment from high-energy x-ray diffraction}, volume={50}, number={20}, journal={Journal of Physics. D, Applied Physics}, author={Ochoa, D. A. and Levit, R. and Fancher, C. M. and Esteves, G. and Jones, J. L. and Garcia, J. E.}, year={2017} }
 @article{burch_fancher_patala_de graef_dickey_2017, title={Mapping 180° polar domains using electron backscatter diffraction and dynamical scattering simulations}, volume={173}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2016.11.013}, DOI={10.1016/j.ultramic.2016.11.013}, abstractNote={A novel technique, which directly and nondestructively maps polar domains using electron backscatter diffraction (EBSD) is described and demonstrated. Through dynamical diffraction simulations and quantitative comparison to experimental EBSD patterns, the absolute orientation of a non-centrosymmetric crystal can be determined. With this information, the polar domains of a material can be mapped. The technique is demonstrated by mapping the non-ferroelastic, or 180°, ferroelectric domains in periodically poled LiNbO3 single crystals. Further, the authors demonstrate the possibility of mapping polarity using this technique in other polar materials system.}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Burch, Matthew J. and Fancher, Chris M. and Patala, Srikanth and De Graef, Marc and Dickey, Elizabeth C.}, year={2017}, month={Feb}, pages={47–51} }
 @article{richter_schenk_park_tscharntke_grimley_lebeau_zhou_fancher_jones_mikolajick_et al._2017, title={Si doped hafnium oxide-a "fragile" ferroelectric system}, volume={3}, number={10}, journal={Advanced Electronic Materials}, author={Richter, C. and Schenk, T. and Park, M. H. and Tscharntke, F. A. and Grimley, E. D. and LeBeau, J. M. and Zhou, C. Z. and Fancher, C. M. and Jones, J. L. and Mikolajick, T. and et al.}, year={2017} }
 @article{fancher_brewer_chung_rohrig_rojac_esteves_deluca_bassiri-gharb_jones_2017, title={The contribution of 180 degrees domain wall motion to dielectric properties quantified from in situ X-ray diffraction}, volume={126}, journal={Acta Materialia}, author={Fancher, C. M. and Brewer, S. and Chung, C. C. and Rohrig, S. and Rojac, T. and Esteves, G. and Deluca, M. and Bassiri-Gharb, N. and Jones, J. L.}, year={2017}, pages={36–43} }
 @article{keech_morandi_wallace_esteves_denis_guerrier_johnson-wilke_fancher_jones_trolier-mckinstry_2017, title={Thickness-dependent domain wall reorientation in 70/30 lead magnesium niobate- lead titanate thin films}, volume={100}, ISSN={["1551-2916"]}, DOI={10.1111/jace.14927}, abstractNote={Abstract Continued reduction in length scales associated with many ferroelectric film‐based technologies is contingent on retaining the functional properties as the film thickness is reduced. Epitaxial and polycrystalline lead magnesium niobate‐lead titanate (70 PMN ‐30 PT ) thin films were studied over the thickness range of 100‐350 nm for the relative contributions to property thickness dependence from interfacial and grain‐boundary low permittivity layers. Epitaxial PMN ‐ PT films were grown on SrRuO 3 /(001)SrTiO 3 , while polycrystalline films with {001}‐Lotgering factors >0.96 were grown on Pt/TiO 2 /SiO 2 /Si substrates via chemical solution deposition. Both film types exhibited similar relative permittivities of ~300 at high fields at all measured thicknesses with highly crystalline electrode/dielectric interfaces. These results, with the DC ‐biased and temperature‐dependent dielectric characterization, suggest irreversible domain wall mobility is the major contributor to the overall dielectric response and its thickness dependence. In epitaxial films, the irreversible Rayleigh coefficients reduced 85% upon decreasing thickness from 350 to 100 nm. The temperature at which a peak in the relative permittivity is observed was the only measured small signal quantity which was more thickness‐dependent in polycrystalline than epitaxial films. This is attributed to the relaxor nature present in the films, potentially stabilized by defect concentrations, and/or chemical inhomogeneity. Finally, the effective interfacial layers are found to contribute to the measured thickness dependence in the longitudinal piezoelectric coefficient.}, number={9}, journal={JOURNAL OF THE AMERICAN CERAMIC SOCIETY}, author={Keech, Ryan and Morandi, Carl and Wallace, Margeaux and Esteves, Giovanni and Denis, Lyndsey and Guerrier, Jonathon and Johnson-Wilke, Raegan L. and Fancher, Chris M. and Jones, Jacob L. and Trolier-McKinstry, Susan}, year={2017}, month={Sep}, pages={3961–3972} }
 @article{khatua_lalitha_fancher_jones_ranjan_2016, title={Anomalous reduction in domain wall displacement at the morphotropic phase boundary of the piezoelectric alloy system PbTiO3-BiScO3}, volume={93}, ISSN={["2469-9969"]}, DOI={10.1103/physrevb.93.104103}, abstractNote={A comparative study of field-induced domain switching and lattice strain was carried out by in situ electric-field-dependent high-energy synchrotron x-ray diffraction on a morphotropic phase boundary (MPB) and a near-MPB rhombohedral/pseudomonoclinic composition of a high-performance piezoelectric alloy (1-x) PbTiO3-(x)BiScO3. It is demonstrated that the MPB composition showing large d(33) similar to 425 pC/N exhibits significantly reduced propensity of field-induced domain switching as compared to the non-MPB rhombohedral composition (d(33) similar to 260 pC/N). These experimental observations contradict the basic premise of the martensitic-theory-based explanation which emphasizes on enhanced domain wall motion as the primary factor for the anomalous piezoelectric response in MPB piezoelectrics. Our results favor field-induced structural transformation to be the primary mechanism contributing to the large piezoresponse of the critical MPB composition of this system.}, number={10}, journal={PHYSICAL REVIEW B}, author={Khatua, Dipak Kumar and Lalitha, K. and Fancher, Chris M. and Jones, Jacob L. and Ranjan, Rajeev}, year={2016}, month={Mar} }
 @article{khatua_lalitha_fancher_jones_ranjan_2016, title={Coupled domain wall motion, lattice strain and phase transformation in morphotropic phase boundary composition of PbTiO3-BiScO3 piezoelectric ceramic}, volume={120}, number={15}, journal={Journal of Applied Physics}, author={Khatua, D. K. and Lalitha, K. V. and Fancher, C. M. and Jones, J. L. and Ranjan, R.}, year={2016} }
 @article{tutuncu_chen_fan_fancher_forrester_zhao_jones_2016, title={Domain wall and interphase boundary motion in (1-x)Bi(Mg0.5Ti0.5)O-3-xPbTiO(3) near the morphotropic phase boundary}, volume={120}, number={4}, journal={Journal of Applied Physics}, author={Tutuncu, G. and Chen, J. and Fan, L. L. and Fancher, C. M. and Forrester, J. S. and Zhao, J. W. and Jones, J. L.}, year={2016} }
 @article{esteves_wallace_johnson-wilke_fancher_wilke_trolier-mckinstry_jones_2016, title={Effect of Mechanical Constraint on Domain Reorientation in Predominantly {111}-Textured Lead Zirconate Titanate Films}, volume={99}, ISSN={["1551-2916"]}, DOI={10.1111/jace.14159}, abstractNote={Ferroelectric/ferroelastic domain reorientation was measured in 2.0 μm thick tetragonal {111}-textured PbZr0.30Ti0.70O3 thin films using synchrotron X-ray diffraction (XRD). Lattice strain from the peak shift in the 111 Bragg reflection and domain reorientation were quantified as a function of applied electric field amplitude. Domain reorientation was quantified through the intensity exchange between the 112 and 211 Bragg reflections. Results from three different film types are reported: dense films that are clamped to the substrate (as-processed), dense films that are partially released from the substrate, and films with 3% volume porosity. The highest amount of domain reorientation is observed in grains that are misoriented with respect to the {111} preferred (domain engineered) orientation. Relative to the clamped films, films that were released from the substrate or had porosity exhibited neither significant enhancement in domain reorientation nor in 111 lattice strain. In contrast, similar experiments on {100}-textured and randomly oriented films showed significant enhancement in domain reorientation in released and porous films. Therefore, {111}-textured films are less susceptible to changes in properties due to mechanical constraints because there is overall less domain reorientation in {111} films than in {100} films.}, number={5}, journal={JOURNAL OF THE AMERICAN CERAMIC SOCIETY}, author={Esteves, Giovanni and Wallace, Margeaux and Johnson-Wilke, Raegan and Fancher, Chris M. and Wilke, Rudeger H. T. and Trolier-McKinstry, Susan and Jones, Jacob L.}, year={2016}, month={May}, pages={1802–1807} }
 @article{esteves_fancher_wallace_johnson-wilke_wilke_trolier-mckinstry_polcawichc_jones_2016, title={In situ X-ray diffraction of lead zirconate titanate piezoMEMS cantilever during actuation}, volume={111}, ISSN={["1873-4197"]}, DOI={10.1016/j.matdes.2016.09.011}, abstractNote={Synchrotron X-ray diffraction (XRD) was used to probe the electric-field-induced response of a 500 nm lead zirconate titanate (52/48, Zr/Ti) (PZT) based piezoelectric microelectromechanical system (piezoMEMS) device. 90° ferroelectric/ferroelastic domain reorientation was observed in a cantilever comprised of a 500 nm thick PZT film on a 3 μm thick elastic layer composite of SiO2 and Si3N4. Diffraction data from sectors both parallel- and perpendicular-to-field showed the presence of ferroelastic texture, which is typically seen in in situ electric field diffraction studies of bulk tetragonal perovskite ferroelectrics. The fraction of domains reoriented into the field direction was quantified through the intensity changes of the 002 and 200 diffraction profiles. The maximum induced volume fraction calculated from the results was 20%, which is comparable to values seen in previous bulk and thin film ferroelectric diffraction studies. The novelty of the present work is that a fully released ferroelectric thin film device of micron scale dimensions (down to 60,000 μm3) was interrogated in situ with an applied electric field using synchrotron XRD. Furthermore, the experiment demonstrates that 90° ferroelectric/ferroelastic domain reorientation can be characterized in samples of such small dimensions.}, journal={MATERIALS & DESIGN}, author={Esteves, Giovanni and Fancher, Chris M. and Wallace, Margeaux and Johnson-Wilke, Raegan and Wilke, Rudeger H. T. and Trolier-McKinstry, Susan and Polcawichc, Ronald G. and Jones, Jacob L.}, year={2016}, month={Dec}, pages={429–434} }
 @article{boltersdorf_zoellner_fancher_jones_maggard_2016, title={Single- and Double-Site Substitutions in Mixed-Metal Oxides: Adjusting the Band Edges Toward the Water Redox Couples}, volume={120}, ISSN={["1932-7455"]}, DOI={10.1021/acs.jpcc.6b05758}, abstractNote={New mixed-metal oxide solid solutions, i.e., the single-metal substituted Na2Ta4–yNbyO11 (0 ≤ y ≤ 4) and the double-metal substituted Na2–2xSnxTa4–yNbyO11 (0 ≤ y ≤ 4; 0 ≤ x ≤ 0.35), were investigated and used to probe the impact of composition on their crystalline structures, optical band gaps, band energies, and photocatalytic properties. The Na2Ta4O11 (y = 1) phase was prepared by flux-mediated synthesis, while the members of the Na2Ta4–yNbyO11 solid solution (1 ≤ y ≤ 4) were prepared by traditional high-temperature reactions. The Sn(II)-containing Na2–2xSnxTa4–yNbyO11 (0 ≤ y ≤ 4) solid solutions were prepared by flux-mediated ion-exchange reactions of the Na2Ta4–yNbyO11 solid solutions within a SnCl2 flux. The crystalline structures of both solid solutions are based on the parent Na2B4O11 (B = Nb, Ta) phases and consist of layers of edge-shared BO7 pentagonal bipyramids that alternate with layers of isolated BO6 octahedra surrounded by Na(I) cations. Rietveld refinements of the Na2Ta4–yNbyO11 solid sol...}, number={34}, journal={Journal of Physical Chemistry C}, author={Boltersdorf, J. and Zoellner, B. and Fancher, C. and Jones, J. and Maggard, P.A.}, year={2016}, month={Aug}, pages={19175–19188} }
 @article{fancher_han_levin_page_reich_smith_wilson_jones_2016, title={Use of Bayesian inference in crystallographic structure refinement via full diffraction profile analysis}, volume={6}, journal={Scientific Reports}, author={Fancher, C. M. and Han, Z. and Levin, I. and Page, K. and Reich, B. J. and Smith, R. C. and Wilson, A. G. and Jones, J. L.}, year={2016} }
 @article{dycus_harris_sang_fancher_findlay_oni_chan_koch_jones_allen_et al._2015, title={Accurate Nanoscale Crystallography in Real-Space Using Scanning Transmission Electron Microscopy}, volume={21}, ISSN={["1435-8115"]}, DOI={10.1017/s1431927615013732}, abstractNote={Abstract Here, we report reproducible and accurate measurement of crystallographic parameters using scanning transmission electron microscopy. This is made possible by removing drift and residual scan distortion. We demonstrate real-space lattice parameter measurements with <0.1% error for complex-layered chalcogenides Bi2Te3, Bi2Se3, and a Bi2Te2.7Se0.3 nanostructured alloy. Pairing the technique with atomic resolution spectroscopy, we connect local structure with chemistry and bonding. Combining these results with density functional theory, we show that the incorporation of Se into Bi2Te3 causes charge redistribution that anomalously increases the van der Waals gap between building blocks of the layered structure. The results show that atomic resolution imaging with electrons can accurately and robustly quantify crystallography at the nanoscale.}, number={4}, journal={MICROSCOPY AND MICROANALYSIS}, author={Dycus, J. Houston and Harris, Joshua S. and Sang, Xiahan and Fancher, Chris M. and Findlay, Scott D. and Oni, Adedapo A. and Chan, Tsung-ta E. and Koch, Carl C. and Jones, Jacob L. and Allen, Leslie J. and et al.}, year={2015}, month={Aug}, pages={946–952} }
 @article{biancoli_fancher_jones_damjanovic_2015, title={Breaking of macroscopic centric symmetry in paraelectric phases of ferroelectric materials and implications for flexoelectricity}, volume={14}, ISSN={["1476-4660"]}, DOI={10.1038/nmat4139}, abstractNote={A centrosymmetric stress cannot induce a polar response in centric materials, piezoelectricity is, for example, possible only in non-centrosymmetric structures. An exception is meta-materials with shape asymmetry, which may be polarized by stress even when the material is centric. In this case the mechanism is flexoelectricity, which relates polarization to a strain gradient. The flexoelectric response scales inversely with size, thus a large effect is expected in nanoscale materials. Recent experiments in polycrystalline, centrosymmetric perovskites [e.g., (Ba,Sr)TiO3] have indicated values of flexoelectric coefficients that are orders of magnitude higher than theoretically predicted, promising practical applications based on bulk materials. We show that materials with unexpectedly large flexoelectric response exhibit breaking of the macroscopic centric symmetry through inhomogeneity induced by the high temperature processing. The emerging electro-mechanical coupling is significant and may help to resolve the controversy surrounding the large apparent flexoelectric coefficients in this class of materials.}, number={2}, journal={NATURE MATERIALS}, author={Biancoli, Alberto and Fancher, Chris M. and Jones, Jacob L. and Damjanovic, Dragan}, year={2015}, month={Feb}, pages={224–229} }
 @article{palizdar_fancher_comyn_stevenson_poterala_messing_suvaci_kleppe_jephcoat_bell_2015, title={Characterization of thick bismuth ferrite-lead titanate films processed by tape casting and templated grain growth}, volume={35}, number={16}, journal={Journal of the European Ceramic Society}, author={Palizdar, M. and Fancher, C. M. and Comyn, T. P. and Stevenson, T. J. and Poterala, S. F. and Messing, G. L. and Suvaci, E. and Kleppe, A. P. and Jephcoat, A. J. and Bell, A. J.}, year={2015}, pages={4453–4458} }
 @article{lalitha_fancher_jones_ranjan_2015, title={Field induced domain switching as the origin of anomalous lattice strain along non-polar direction in rhombohedral BiScO3-PbTiO3 close to the morphotropic phase boundary}, volume={107}, number={5}, journal={Applied Physics Letters}, author={Lalitha, K. V. and Fancher, C. M. and Jones, J. L. and Ranjan, R.}, year={2015} }
 @misc{esteves_fancher_jones_2015, title={In situ characterization of polycrystalline ferroelectrics using x-ray and neutron diffraction}, volume={30}, ISSN={["2044-5326"]}, DOI={10.1557/jmr.2014.302}, abstractNote={X-ray and neutron diffraction are particularly useful for characterizing ferroelectric materials in situ, e.g., during application of temperature, pressure, electric field, and stress. In this review, we introduce many experimental approaches for such measurements and highlight important discoveries in ferroelectrics that utilized diffraction. We focus our examples on polycrystalline ferroelectrics, though many of the approaches and analysis methods can also be applied to thin films and single crystals. Methods discussed for characterization of structure include, phase identification, line profile analysis, whole pattern fitting, pair distribution functions, and the x-ray diffraction based three-dimensional microscopy. Further advancement of these and other techniques offers potential for continued important contributions to the fundamental understanding of ferroelectric materials.}, number={3}, journal={JOURNAL OF MATERIALS RESEARCH}, author={Esteves, Giovanni and Fancher, Chris M. and Jones, Jacob L.}, year={2015}, month={Feb}, pages={340–356} }
 @article{wallace_johnson-wilke_esteves_fancher_wilke_jones_trolier-mckinstry_2015, title={In situ measurement of increased ferroelectric/ferroelastic domain wall motion in declamped tetragonal lead zirconate titanate thin films}, volume={117}, number={5}, journal={Journal of Applied Physics}, author={Wallace, M. and Johnson-Wilke, R. L. and Esteves, G. and Fancher, C. M. and Wilke, R. H. T. and Jones, J. L. and Trolier-McKinstry, S.}, year={2015} }
 @article{fancher_zhao_nelson_bai_shen_jones_2015, title={Pressure-induced structures of Si-doped HfO2}, volume={117}, number={23}, journal={Journal of Applied Physics}, author={Fancher, C. M. and Zhao, L. L. and Nelson, M. and Bai, L. G. and Shen, G. Y. and Jones, J. L.}, year={2015} }
 @article{hou_fancher_zhao_esteves_jones_2015, title={Processing and crystallographic structure of non-equilibrium Si-doped HfO2}, volume={117}, number={24}, journal={Journal of Applied Physics}, author={Hou, D. and Fancher, C. M. and Zhao, L. L. and Esteves, G. and Jones, J. L.}, year={2015} }
 @article{zhao_hou_usher_iamsasri_fancher_forrester_nishida_moghaddam_jones_2015, title={Structure of 3 at.% and 9 at.% Si-doped HfO2 from combined refinement of X-ray and neutron diffraction patterns}, volume={646}, ISSN={["1873-4669"]}, DOI={10.1016/j.jallcom.2015.06.084}, abstractNote={The crystal structure of 3 at.% and 9 at.% Si-doped HfO2 powder was determined through refinements using X-ray and neutron diffraction patterns. The lattice parameters, atomic positions, dopant occupancy, and the second phase fraction were determined with high precision using a combined full pattern fitting via the Rietveld method. The results show that both 3 at.% and 9 at.% Si-doped HfO2 powder exhibit the monoclinic crystal structure with P 1 21/c 1 space group. Through the combined refinement, the crystal structure parameters, especially for the positions and occupancies of the lighter atoms, were more precisely determined compared to independent X-ray diffraction refinement. Although the ionic radius of Si4+ is smaller than Hf4+, with increasing Si occupancy, the unit cell volume slightly increases; possible mechanisms for this effect are discussed. Moreover, the refined results provide evidence of the existence of a non-equilibrium phase of HfxSi1−xO2. The second phase (SiO2) fraction is determined as 0.17 at.% for 3 at.% Si-doped HfO2 powders and 1.7 at.% for 9 at.% Si-doped HfO2 powders.}, journal={JOURNAL OF ALLOYS AND COMPOUNDS}, author={Zhao, Lili and Hou, Dong and Usher, Tedi-Marie and Iamsasri, Thanakorn and Fancher, Chris M. and Forrester, Jennifer S. and Nishida, Toshikazu and Moghaddam, Saeed and Jones, Jacob L.}, year={2015}, month={Oct}, pages={655–661} }
 @article{zhao_nelson_aldridge_iamsasri_fancher_forrester_nishida_moghaddam_jones_2014, title={Crystal structure of Si-doped HfO2}, volume={115}, number={3}, journal={Journal of Applied Physics}, author={Zhao, L. L. and Nelson, M. and Aldridge, H. and Iamsasri, T. and Fancher, C. M. and Forrester, J. S. and Nishida, T. and Moghaddam, S. and Jones, J. L.}, year={2014} }
 @article{fancher_jo_rodel_blendell_bowman_2014, title={Effect of texture on temperature-dependent properties of K0.5Na0.5NbO3 modified Bi1/2Na1/2TiO3-xBaTiO(3)}, volume={97}, number={8}, journal={Journal of the American Ceramic Society}, author={Fancher, C. M. and Jo, W. and Rodel, J. and Blendell, J. E. and Bowman, K. J.}, year={2014}, pages={2557–2563} }
 @article{lomenzo_zhao_takmeel_moghaddam_nishida_nelson_fancher_grimley_sang_lebeau_et al._2014, title={Ferroelectric phenomena in Si-doped HfO2 thin films with TiN and Ir electrodes}, volume={32}, number={3}, journal={Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures}, author={Lomenzo, P. D. and Zhao, P. and Takmeel, Q. and Moghaddam, S. and Nishida, T. and Nelson, M. and Fancher, C. M. and Grimley, E. D. and Sang, X. H. and LeBeau, J. M. and et al.}, year={2014} }
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