2007 journal article

Analytical threshold voltage model with TCAD simulation verification for design and evaluation of tri-gate MOSFETs

Solid-State Electronics, 51(3), 347–353.

By: Y. Jin, C. Zeng, L. Ma & D. Barlage

Source: NC State University Libraries
Added: August 6, 2018

2007 journal article

Transmission electron microscopy studies of regrown GaN Ohmic contacts on patterned substrates for metal oxide semiconductor field effect transistor applications

Applied Physics Letters, 90(20).

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

Optical spectroscopic analysis of selected area epitaxially regrown n(+) gallium nitride

Journal of Applied Physics, 99(12).

By: D. Wang, M. Park, Y. Saripalli, M. Johnson, C. Zeng, D. Barlage, J. Long

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

Properties of III-N MOS structures with low-temperature epitaxially regrown ohmic contacts

Journal of Crystal Growth, 287(2), 562–565.

By: Y. Saripalli, C. Zeng, J. Long, D. Barlage, M. Johnson & D. Braddock

Source: NC State University Libraries
Added: August 6, 2018