Works (23)

2018 | journal article

Determination of chemical composition in multilayer polymer film using ToF-SIMS

Analytical Methods, 10(21), 2444–2449.

By: C. Zhou, D. Sun, R. Garcia & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2018 | journal article

Imaging and quantitative analysis of insecticide in mosquito net fibers using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

PLOS ONE, 13(12).

By: S. Smith, C. Zhou, F. Stevie & R. Garcia

Source: NC State University Libraries
Added: January 14, 2019

2018 | journal article

Improvement in detection limit for time-of-flight SIMS analysis of dopants in GaN structures

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 36(3).

Source: NC State University Libraries
Added: August 6, 2018

2018 | journal article

Lanthanum-doped hafnium oxide: A robust ferroelectric material

Inorganic Chemistry, 57(5), 2752–2765.

By: U. Schroeder, C. Richter, M. Park, T. Schenk, M. Pesic, M. Hoffmann, F. Fengler, D. Pohl ...

Source: NC State University Libraries
Added: August 6, 2018

2018 | journal article

Quantification of organic materials by ion implantation

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 36(3).

By: C. Zhou, F. Stevie & S. Smith

Source: NC State University Libraries
Added: August 6, 2018

2018 | journal article

ToF-SIMS analysis of ion implanted standard to quantify insecticide in mosquito netting with cesium and argon gas cluster sputtering beams

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 36(3).

By: C. Zhou, F. Stevie, S. Smith, D. Rading & J. Zakel

Source: NC State University Libraries
Added: August 6, 2018

2017 | journal article

Doped Hf0.5Zr0.5O2 for high efficiency integrated supercapacitors

Applied Physics Letters, 110(23).

By: P. Lomenzo, C. Chung, C. Zhou, J. Jones & T. Nishida

Source: NC State University Libraries
Added: August 6, 2018

2017 | journal article

Investigating Pb diffusion across buried interfaces in Pb(Zr0.2Ti0.8)O-3 thin films via time-of-flight secondary ion mass spectrometry depth profiling

Surface and Interface Analysis, 49(10), 973–977.

By: J. Mangum, S. Podowitz-Thomas, J. Nikkel, C. Zhou & J. Jones

Source: NC State University Libraries
Added: August 6, 2018

2017 | journal article

Si doped hafnium oxide-a "fragile" ferroelectric system

Advanced Electronic Materials, 3(10).

By: C. Richter, T. Schenk, M. Park, F. Tscharntke, E. Grimley, J. LeBeau, C. Zhou, C. Fancher ...

Source: NC State University Libraries
Added: August 6, 2018

2017 | journal article

A comprehensive study on the structural evolution of HfO2 thin films doped with various dopants

Journal of Materials Chemistry C, 5(19), 4677–4690.

By: M. Park, T. Schenk, C. Fancher, E. Grimley, C. Zhou, C. Richter, J. LeBeau, J. Jones, T. Mikolajick, U. Schroeder

Source: NC State University Libraries
Added: August 6, 2018

2016 | journal article

Advancing the forensic analysis of dyed fibers by time-of-flight mass spectrometry

AATCC Journal of Research, 3(2), 25–32.

By: C. Zhou, K. Beck, D. Hinks, A. Crawford & S. Blake

Source: NC State University Libraries
Added: August 6, 2018

2016 | journal article

Method for quantification of insecticide in mosquito netting using ion implantation and ToF-SIMS analysis

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 34(3).

By: C. Zhou, F. Stevie & S. Smith

Source: NC State University Libraries
Added: August 6, 2018

2016 | journal article

SIMS measurement of hydrogen and deuterium detection limits in silicon: Comparison of different SIMS instrumentation

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 34(3).

By: F. Stevie, C. Zhou, M. Hopstaken, M. Saccomanno, Z. Zhang & A. Turansky

Source: NC State University Libraries
Added: August 6, 2018

2016 | journal article

Significantly increasing the ductility of high performance polymer semiconductors through polymer blending

ACS Applied Materials & Interfaces, 8(22), 14037–14045.

By: J. Scott, X. Xue, M. Wang, R. Kline, B. Hoffman, D. Dougherty, C. Zhou, G. Bazan, B. O'Connor

Source: NC State University Libraries
Added: August 6, 2018

2015 | journal article

Mixed Al and Si doping in ferroelectric HfO2 thin films

Applied Physics Letters, 107(24).

By: P. Lomenzo, Q. Takmeel, C. Zhou, C. Chung, S. Moghaddam, J. Jones, T. Nishida

Source: NC State University Libraries
Added: August 6, 2018

2015 | journal article

TaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin films

Journal of Applied Physics, 117(13).

By: P. Lomenzo, Q. Takmeel, C. Zhou, C. Fancher, E. Lambers, N. Rudawski, J. Jones, S. Moghaddam, T. Nishida

Source: NC State University Libraries
Added: August 6, 2018

2014 | journal article

Back side SIMS analysis

Surface and Interface Analysis, 46, 241–243.

By: F. Stevie, R. Garcia, C. Richardson & C. Zhou

Source: NC State University Libraries
Added: August 6, 2018

2014 | conference paper

Exploring lithium-ion intensity and distribution via a time-of-flight secondary ion mass spectroscopy

In Proceedings of the ASME International Mechanical Engineering Congress and Exposition, 2013, vol 10.

By: C. ChiuHuang, C. Zhou & H. Huang

Source: NC State University Libraries
Added: August 6, 2018

2014 | article

In-situ imaging of lithium-ion batteries via the secondary ion mass spectrometry

Journal of Nanotechnology in Engineering and Medicine.

By: C. ChiuHuang, C. Zhou & H. Huang

Source: NC State University Libraries
Added: August 6, 2018

2014 | journal article

The effects of layering in ferroelectric Si-doped HfO2 thin films

Applied Physics Letters, 105(7).

By: P. Lomenzo, Q. Takmeel, C. Zhou, Y. Liu, C. Fancher, J. Jones, S. Moghaddam, T. Nishida

Source: NC State University Libraries
Added: August 6, 2018

2013 | conference paper

Exploring lithium-ion intensity and distribution via a Time-of-Flight Secondary Ion Mass Spectroscopy

In ASME 2013 International Mechanical Engineering Congress & Exposition.

By: C. ChiuHuang, C. Zhou & H. Huang

Source: NC State University Libraries
Added: August 6, 2018

2013 | journal article

TOF SIMS analyses of stray Ga during FIB milling

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 31(6).

By: C. Santeufemio, B. Gorman, C. Zhou, L. Giannuzzi & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2012 | journal article

Time-of-flight-secondary ion mass spectrometry method development for high-sensitivity analysis of acid dyes in nylon fibers

Analytical Chemistry, 84(22), 10085–10090.

By: C. Zhou, M. Li, R. Garcia, A. Crawford, K. Beck, D. Hinks, D. Griffis

Source: NC State University Libraries
Added: August 6, 2018