Chuanzhen Zhou

Corrosion sensitivity of nickel-based Alloy Inconel 600 in pressurized water reactor water chemistry: Can KOH replace LiOH?

Tsai, F.-Y., Hong, M., Zhou, C., Yano, K. H., Schreiber, D. K., Hosemann, P., & Kaoumi, D. (2025, June 4). Corrosion Science, Vol. 255.

Effect of Precursor Purge Time on Plasma-Enhanced Atomic Layer Deposition-Prepared Ferroelectric Hf_0.5Zr_0.5O₂ Phase and Performance

Choi, Y. K., Holsgrove, K., Watson, A., Aronson, B. L., Lenox, M. K., Shvilberg, L., … Ihlefeld, J. F. (2025, May 14). ACS Omega.

Erratum: “Oxygen diffusion coefficients in ferroelectric hafnium zirconium oxide thin films” [Appl. Phys. Lett. 124, 252905 (2024)]

Shvilberg, L., Zhou, C., Lenox, M. K., Aronson, B. L., Lam, N. K., Jaszewski, S. T., … Ihlefeld, J. F. (2025, January 20). Applied Physics Letters.

P-Type Doping of Mixed Tin–Lead Halide Perovskites Using Electron Transfer to Mo(tfd-COCF3) ₃ and F ₄ TCNQ

Choi, M., Rivera, N., Harvey, S. P., Zhou, C., Pathiranage, S., Zhang, Y., … Mitzi, D. B. (2025, December 10). ACS Applied Materials & Interfaces.

Thiol–Ene Click Chemistry for Functionalizing Silica-Overcoated Gold Nanorods

Ghelardini, M. M., Zhou, C., Urban, B., Müller, M., & Tracy, J. B. (2025, March 21). Chemistry of Materials, Vol. 3.

Effect of background gas composition on the stoichiometry and lithium ion conductivity of pulse laser deposited epitaxial lithium lanthanum tantalate (Li3xLa1/3−xTaO3)

Brummel, I. A., Zhou, C., & Ihlefeld, J. F. (2024, April 10). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Oxygen diffusion coefficients in ferroelectric hafnium zirconium oxide thin films

Shvilberg, L., Zhou, C., Lenox, M. K., Aronson, B. L., Lam, N. K., Jaszewski, S. T., … Ihlefeld, J. F. (2024, June 17). Applied Physics Letters.

Nonwoven Membranes with Infrared Light-Controlled Permeability

Ramesh, S., Davis, J., Roros, A., Zhou, C., He, N., Gao, W., … Menegatti, S. (2022, September 9). ACS Applied Materials & Interfaces, Vol. 9.

Analysis of permethrin treated fabric using ToF-SIMS

Zhou, C., Stevie, F., & Garcia, R. (2020, April 14). Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Vol. 38.

Influence of Oxygen Content on the Structure and Reliability of Ferroelectric Hf_xZr_1–xO₂ Layers

ACS Applied Electronic Materials, 2(11), 3618–3626.

Influence of oxygen source on the ferroelectric properties of ALD grown Hf_1-xZr_xO₂ films

Journal of Physics D: Applied Physics, 54(3), 035102.

Low temperature cathodoluminescence study of Fe-doped β-Ga2O3

Materials Letters, 257, 126744.

Optical and electrical properties of all-inorganic Cs₂AgBiBr₆ double perovskite single crystals

Zhang, Z., Yang, G., Zhou, C., Chung, C.-C., & Hany, I. (2019, January 1). RSC Advances, Vol. 9, pp. 23459–23464.

Origin of Ferroelectric Phase in Undoped HfO2 Films Deposited by Sputtering

Advanced Materials Interfaces, 6(11), 1900042.

Peroxisome Proliferator–activated Receptor-γ Deficiency Exacerbates Fibrotic Response to Mycobacteria Peptide in Murine Sarcoidosis Model

American Journal of Respiratory Cell and Molecular Biology, 61(2), 198–208.

Determination of chemical composition in multilayer polymer film using ToF-SIMS

Zhou, C., Sun, D., Garcia, R., & Stevie, F. A. (2018, January 1). Analytical Methods, Vol. 10, pp. 2444–2449.

Imaging and quantitative analysis of insecticide in mosquito net fibers using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

Smith, S. C., Zhou, C., Stevie, F. A., & Garcia, R. (2018, December 26). PLoS ONE, Vol. 13.

Improvement in detection limit for time-of-flight SIMS analysis of dopants in GaN structures

Klump, A., Zhou, C., Stevie, F. A., Collazo, R., & Sitar, Z. (2018, January 22). Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Vol. 36.

Lanthanum-Doped Hafnium Oxide: A Robust Ferroelectric Material

Inorganic Chemistry, 57(5), 2752–2765.

Quantification of organic materials by ion implantation

Zhou, C., Stevie, F. A., & Smith, S. C. (2018, February 21). Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena.

ToF-SIMS analysis of ion implanted standard to quantify insecticide in mosquito netting with cesium and argon gas cluster sputtering beams

Zhou, C., Stevie, F. A., Smith, S. C., Rading, D., & Zakel, J. (2018, February 14). Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena.

A comprehensive study on the structural evolution of HfO₂thin films doped with various dopants

Journal of Materials Chemistry C, 5(19), 4677–4690.

Doped Hf0.5Zr0.5O2 for high efficiency integrated supercapacitors

Applied Physics Letters, 110(23).

Investigating Pb diffusion across buried interfaces in Pb(Zr _{0.2 Ti 0.8 )O 3 thin films via time‐of‐flight secondary ion mass spectrometry depth profiling}

Surface and Interface Analysis, 49(10), 973–977.

Si doped hafnium oxide-a "fragile" ferroelectric system

Advanced Electronic Materials, 3(10).

Advancing the Forensic Analysis of Dyed Fibers by Time-of-Flight Mass Spectrometry

Zhou, C., Beck, K. R., Hinks, D., Crawford, A., & Blake, S. (2016, March 1). AATCC Journal of Research.

Method for quantification of insecticide in mosquito netting using ion implantation and ToF-SIMS analysis

Zhou, C., Stevie, F. A., & Smith, S. C. (2016, January 25). Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena.

SIMS measurement of hydrogen and deuterium detection limits in silicon: Comparison of different SIMS instrumentation

Stevie, F. A., Zhou, C., Hopstaken, M., Saccomanno, M., Zhang, Z., & Turansky, A. (2016, January 19). Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena.

Significantly Increasing the Ductility of High Performance Polymer Semiconductors through Polymer Blending

Scott, J. I., Xue, X., Wang, M., Kline, R. J., Hoffman, B. C., Dougherty, D., … O’Connor, B. T. (2016, May 11). ACS Applied Materials & Interfaces, Vol. 8, pp. 14037–14045.

Mixed Al and Si doping in ferroelectric HfO2 thin films

Applied Physics Letters, 107(24).

TaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin films

Journal of Applied Physics, 117(13), 134105.

Back side SIMS analysis

Stevie, F. A., Garcia, R., Richardson, C., & Zhou, C. (2014, March 21). Surface and Interface Analysis, Vol. 46, pp. 241–243.

Exploring lithium-ion intensity and distribution via a time-of-flight secondary ion mass spectroscopy

Proceedings of the ASME International Mechanical Engineering Congress and Exposition, 2013, vol 10.

In-situ imaging of lithium-ion batteries via the secondary ion mass spectrometry

Journal of Nanotechnology in Engineering and Medicine, Vol. 5.

The effects of layering in ferroelectric Si-doped HfO2 thin films

Applied Physics Letters, 105(7).

Exploring Lithium-Ion Intensity and Distribution via a Time-of-Flight Secondary Ion Mass Spectroscopy

ChiuHuang, C.-K., Zhou, C., & Huang, H.-Y. S. (2013, November 15).

TOF SIMS analyses of stray Ga during FIB milling

Santeufemio, C., Gorman, B. P., Zhou, C., Giannuzzi, L. A., & Stevie, F. A. (2013, October 17). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Time-of-Flight-Secondary Ion Mass Spectrometry Method Development for High-Sensitivity Analysis of Acid Dyes in Nylon Fibers

Zhou, C., Li, M., Garcia, R., Crawford, A., Beck, K., Hinks, D., & Griffis, D. P. (2012, October 31). Analytical Chemistry, Vol. 84, pp. 10085–10090.