Dieter P Griffis
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Works (38)
Updated: April 4th, 2024 20:06
2014 article
SIMS analysis of high-performance accelerator niobium
Maheshwari, P., Stevie, F. A., Myneni, G. R., Ciovati, G., Rigsbee, J. M., Dhakal, P., & Griffis, D. P. (2014, November). SURFACE AND INTERFACE ANALYSIS, Vol. 46, pp. 288–290.
author keywords: SIMS depth profile; superconducting radio frequency; accelerator niobium
UN Sustainable Development Goal Categories
3. Good Health and Well-being
(Web of Science)
9. Industry, Innovation and Infrastructure
(Web of Science)
Source: Web Of Science
Added: August 6, 2018
2012 journal article
Quantification of cesium surface contamination on silicon resulting from SIMS analysis
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 30(3).
Source: Web Of Science
Added: August 6, 2018
2012 article
SIMS analysis of zinc oxide LED structures: quantification and analysis issues
Stevie, F. A., Maheshwari, P., Pierce, J. M., Adekore, B. T., & Griffis, D. P. (2013, January). SURFACE AND INTERFACE ANALYSIS, Vol. 45, pp. 352–355.
author keywords: depth profiling; ZnO; RSFs
Source: Web Of Science
Added: August 6, 2018
2012 journal article
Time-of-Flight-Secondary Ion Mass Spectrometry Method Development for High-Sensitivity Analysis of Acid Dyes in Nylon Fibers
ANALYTICAL CHEMISTRY, 84(22), 10085–10090.
TL;DR:
The use of C(60)(+) for damage removal in a cyclic manner along with Bi for data acquisition provided the ability to unambiguously identify Acid Blue 25 via its molecular ion at a concentration of 0.1% owf from both fiber surfaces and cross sections.
(via Semantic Scholar)
UN Sustainable Development Goal Categories
16. Peace, Justice and Strong Institutions
(Web of Science)
Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018
2011 article
Analysis of Interstitial Elements in Niobium with Secondary Ion Mass Spectrometry (SIMS)
INTERNATIONAL SYMPOSIUM ON THE SUPERCONDUCTING SCIENCE & TECHNOLOGY OF INGOT NIOBIUM, Vol. 1352, pp. 151-+.
author keywords: Superconducting niobium; secondary ion mass spectrometry; interstitial elements
Source: Web Of Science
Added: August 6, 2018
2011 journal article
Chemical and Spatial Differentiation of Syringyl and Guaiacyl Lignins in Poplar Wood via Time-of-Flight Secondary Ion Mass Spectrometry
ANALYTICAL CHEMISTRY, 83(18), 7020–7026.
MeSH headings : Cell Wall / chemistry; Fullerenes / chemistry; Lignin / analysis; Plant Stems / chemistry; Populus / chemistry; Spectrometry, Mass, Secondary Ion / methods
TL;DR:
The spatial distribution of the syringyl (S) and guaiacyl (G) lignins, both over larger regions and within a single cell wall, on poplar ( Populus trichocarpa ) wood cross-sections was determined via time-of-flight secondary ion mass spectrometry (ToF-SIMS).
(via Semantic Scholar)
Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018
2010 journal article
Focused Ion Beam Characterization of Bicomponent Polymer Fibers
MICROSCOPY AND MICROANALYSIS, 16(3), 282–290.
author keywords: bicomponent polymer fiber; characterization; focused ion beam; differential sputtering; ion-induced secondary electron imaging; biaxial cross section
TL;DR:
Topographical contrast as a result of differential sputtering and the high surface specificity and high signal-to-noise obtained using FIB-induced secondary electron imaging is shown to provide a useful approach for the rapid characterization of the cross-sectional morphology of bicomponent polymeric fibers without the necessity of staining or other sample preparation.
(via Semantic Scholar)
UN Sustainable Development Goal Categories
14. Life Below Water
(OpenAlex)
Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018
2010 journal article
High field Q slope and the baking effect: Review of recent experimental results and new data on Nb heat treatments
PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, 13(2).
open access via link.aps.org (publisher PDF)
UN Sustainable Development Goal Categories
3. Good Health and Well-being
(Web of Science)
9. Industry, Innovation and Infrastructure
(Web of Science)
Source: Web Of Science
Added: August 6, 2018
2010 journal article
Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 28(3), 511–516.
author keywords: amorphisation; annealing; doping profiles; elemental semiconductors; ion implantation; phosphorus; secondary ion mass spectra; silicon
UN Sustainable Development Goal Categories
6. Clean Water and Sanitation
(OpenAlex)
Source: Web Of Science
Added: August 6, 2018
2010 article
Surface analysis of Nb materials for SRF cavities
SURFACE AND INTERFACE ANALYSIS, Vol. 43, pp. 151–153.
author keywords: SIMS; depth profiling; SRF Nb; deuterium; residual gas species
UN Sustainable Development Goal Categories
7. Affordable and Clean Energy
(Web of Science; OpenAlex)
Source: Web Of Science
Added: August 6, 2018
2008 journal article
Quantification in dynamic SIMS: Current status and future needs
APPLIED SURFACE SCIENCE, 255(4), 1364–1367.
author keywords: Quantification; Ion implantation; Complementary methods; Focused ion beam (FIB)
Source: Web Of Science
Added: August 6, 2018
2007 journal article
Improved understanding of an electron beam charge compensation method for magnetic sector secondary ion mass spectrometer analysis of insulators
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 25(4), 769–774.
UN Sustainable Development Goal Categories
7. Affordable and Clean Energy
(OpenAlex)
Source: Web Of Science
Added: August 6, 2018
2007 journal article
Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O-2(+) bombardment of organic materials
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 25(3), 480–484.
Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018
2007 journal article
Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam
Applied Surface Science, 254(9), 2708–2711.
Source: NC State University Libraries
Added: August 6, 2018
2007 journal article
Transferable Internal Reservoir Device for Electron and Ion Beam Induced Chemistry
Microscopy and Analysis, 86, 5–6.
Source: NC State University Libraries
Added: August 6, 2018
2006 article
Back side SIMS analysis of hafnium silicate
Gu, C., Stevie, F. A., Bennett, J., Garcia, R., & GriffiS, D. P. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7179–7181.
author keywords: SIMS; high-k dielectrics; back side analysis; hafnium silicate
Sources: Web Of Science, ORCID, NC State University Libraries
Added: August 6, 2018
2006 article
SIMS depth profiling of deuterium labeled polymers in polymer multilayers
Harton, S. E., Stevie, F. A., Griffis, D. P., & Ade, H. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7224–7227.
author keywords: depth profiling; polymers; SIMS; thin films
UN Sustainable Development Goal Categories
3. Good Health and Well-being
(Web of Science)
6. Clean Water and Sanitation
(Web of Science)
Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018
2006 article
SIMS quantification of matrix and impurity species in AlxGa1-xN
Gu, C. J., Stevie, F. A., Hitzman, C. J., Saripalli, Y. N., Johnson, M., & Griffis, D. P. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7228–7231.
author keywords: SIMS; aluminum gallium nitride (AlGaN); quantification; calibration curve
Source: Web Of Science
Added: August 6, 2018
2006 journal article
Thermal stability of lanthanum scandate dielectrics on Si(100)
APPLIED PHYSICS LETTERS, 89(24).
UN Sustainable Development Goal Categories
7. Affordable and Clean Energy
(OpenAlex)
Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018
2004 article
Circuit editing of copper and low-k dielectrics in nanotechnology devices
Mosselveld, F., Makarov, VV, Lundquist, T. R., Griffis, D. P., & Russell, P. E. (2004, June). JOURNAL OF MICROSCOPY, Vol. 214, pp. 246–251.
author keywords: copper etching; device modification; low-k dielectrics
TL;DR:
Methods to increase the etching of metallization relative to the dielectrics are reviewed, including chemistries that improve the selectivity of copper to dielectric.
(via Semantic Scholar)
Source: Web Of Science
Added: August 6, 2018
2004 article
Improved charge neutralization method for depth profiling of bulk insulators using O-2(+) primary beam on a magnetic sector SIMS instrument
Pivovarov, A. L., Stevie, F. A., & Griffis, D. P. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 786–790.
author keywords: charge neutralization; electron gun; magnetic sector
Source: Web Of Science
Added: August 6, 2018
2004 article
O-2(+) versus Cs+ for high depth resolution depth profiling of III-V nitride-based semiconductor devices
Kachan, M., Hunter, J., Kouzminov, D., Pivovarov, A., Gu, J., Stevie, F., & Griffis, D. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 684–687.
author keywords: Cs cluster ions; GaN; depth resolution
UN Sustainable Development Goal Categories
7. Affordable and Clean Energy
(OpenAlex)
Source: Web Of Science
Added: August 6, 2018
2004 article
Secondary ion mass spectrometry backside analysis of barrier layers for copper diffusion
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 22, pp. 350–354.
UN Sustainable Development Goal Categories
7. Affordable and Clean Energy
(OpenAlex)
Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018
2004 article
Site-specific SIMS backside analysis
Gu, C., Garcia, R., Pivovarov, A., Stevie, F., & Griffis, D. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 663–667.
author keywords: SfMS; backside analysis; semiconductors; patterned wafers
Sources: Web Of Science, ORCID, NC State University Libraries
Added: August 6, 2018
2004 article
Utilization of electron impact ionization of gaseous and sputtered species in the secondary ion acceleration region of a magnetic sector SIMS instrument
Pivovarov, A., Gu, C., Stevie, F., & Griffis, D. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 781–785.
author keywords: charge neutralization; electron gun; negative secondary ions; magnetic sector
Source: Web Of Science
Added: August 6, 2018
2003 patent
Chemically enhanced focused ion beam micro-machining of copper
Washington, DC: U.S. Patent and Trademark Office.
Source: NC State University Libraries
Added: August 6, 2018
2003 journal article
Etching characteristics of chromium thin films by an electron beam induced surface reaction
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 18(4), 199–205.
UN Sustainable Development Goal Categories
7. Affordable and Clean Energy
(OpenAlex)
Source: Web Of Science
Added: August 6, 2018
2003 journal article
Optimization of secondary ion mass spectrometry detection limit for N in SiC
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 21(5), 1649–1654.
Source: Web Of Science
Added: August 6, 2018
2002 article
Comparison of secondary ion mass spectroscopy analysis of ultrashallow phosphorus using Cs+, O-2(+), and CsC6- primary ion beams
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 20, pp. 507–511.
Source: Web Of Science
Added: August 6, 2018
2002 article
Improvements in focused ion beam micromachining of interconnect materials
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 20, pp. 2700–2704.
UN Sustainable Development Goal Categories
7. Affordable and Clean Energy
(OpenAlex)
Source: Web Of Science
Added: August 6, 2018
2001 article
Chemically enhanced focused ion beam micromachining of copper
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 19, pp. 2539–2542.
UN Sustainable Development Goal Categories
6. Clean Water and Sanitation
(OpenAlex)
Source: Web Of Science
Added: August 6, 2018
2000 article
Channeling effects during focused-ion-beam micromachining of copper
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 18, pp. 1061–1065.
Source: Web Of Science
Added: August 6, 2018
2000 patent
Method for water vapor enhanced charged-particle-beam machining
Washington, DC: U.S. Patent and Trademark Office.
Source: NC State University Libraries
Added: August 6, 2018
2000 chapter
Optimization of SIMS analysis conditions for ultra-shallow phosphorus and arsenic implants
In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 327–328). Bristol: Institute of Physics Publishing.
Ed(s): D. Williams & R. Shimizu
Source: NC State University Libraries
Added: August 6, 2018
2000 article
Secondary ion mass spectrometry depth profiling of ultrashallow phosphorous in silicon
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 18, pp. 509–513.
UN Sustainable Development Goal Categories
7. Affordable and Clean Energy
(OpenAlex)
Source: Web Of Science
Added: August 6, 2018
1999 patent
Method for water vapor enhanced charged-particle-beam machining
Washington, DC: U.S. Patent and Trademark Office.
Source: NC State University Libraries
Added: August 6, 2018
1998 article
Acceptor and donor doping of AlxGa1-xN thin film alloys grown on 6H-SiC(0001) substrates via metalorganic vapor phase epitaxy
Bremser, M. D., Perry, W. G., Nam, O. H., Griffis, D. P., Loesing, R., Ricks, D. A., & Davis, R. F. (1998, April). JOURNAL OF ELECTRONIC MATERIALS, Vol. 27, pp. 229–232.
author keywords: 6H-SiC(0001); acceptor doping; AlxGa1-xN; GaN; charge scattering; donor doping; electron mobility
UN Sustainable Development Goal Categories
6. Clean Water and Sanitation
(OpenAlex)
Source: Web Of Science
Added: August 6, 2018
1998 article
Chemically and geometrically enhanced focused ion beam micromachining
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 16, pp. 2494–2498.
Source: Web Of Science
Added: August 6, 2018
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