Works (38)

2014 journal article

SIMS analysis of high-performance accelerator niobium

Surface and Interface Analysis, 46, 288–290.

By: P. Maheshwari, F. Stevie, G. Myneni, G. Ciovati, J. Rigsbee, P. Dhakal, D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2013 journal article

SIMS analysis of zinc oxide LED structures: quantification and analysis issues

Surface and Interface Analysis, 45(1), 352–355.

By: F. Stevie, P. Maheshwari, J. Pierce, B. Adekore & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2012 journal article

Quantification of cesium surface contamination on silicon resulting from SIMS analysis

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 30(3).

By: C. Penley, F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2012 journal article

Time-of-flight-secondary ion mass spectrometry method development for high-sensitivity analysis of acid dyes in nylon fibers

Analytical Chemistry, 84(22), 10085–10090.

By: C. Zhou, M. Li, R. Garcia, A. Crawford, K. Beck, D. Hinks, D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2011 conference paper

Analysis of interstitial elements in niobium with secondary ion mass spectrometry (SIMS)

In International symposium on the superconducting science & technology of ingot niobium (Vol. 1352, pp. 151–160).

By: P. Maheshwari, F. Stevie, G. Myeneni, G. Ciovati, J. Rigsbee & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2011 journal article

Chemical and spatial differentiation of syringyl and guaiacyl lignins in poplar wood via time-of-flight secondary ion mass spectrometry

Analytical Chemistry, 83(18), 7020–7026.

By: C. Zhou, Q. Li, V. Chiang, L. Lucia & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2011 journal article

Surface analysis of Nb materials for SRF cavities

Surface and Interface Analysis, 43(1-2), 151–153.

By: P. Maheshwari, H. Tian, C. Reece, M. Kelley, G. Myneni, F. Stevie, J. Rigsbee, A. Batchelor, D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2010 journal article

Focused ion beam characterization of bicomponent polymer fibers

Microscopy and Microanalysis, 16(3), 282–290.

By: K. Wong, C. Haslauer, N. Anantharamaiah, B. Pourdeyhimi, A. Batchelor & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2010 journal article

High field Q slope and the baking effect: Review of recent experimental results and new data on Nb heat treatments

Physical Review Special Topics. Accelerators and Beams, 13(2).

By: G. Ciovati, G. Myneni, F. Stevie, P. Maheshwari & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2010 journal article

Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 28(3), 511–516.

By: C. Penley, F. Stevie, D. Griffis, S. Siebel, L. Kulig & J. Lee

Source: NC State University Libraries
Added: August 6, 2018

2008 journal article

Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam

Applied Surface Science, 254(9), 2708–2711.

By: Z. Zhu, F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2008 journal article

Quantification in dynamic SIMS: Current status and future needs

Applied Surface Science, 255(4), 1364–1367.

By: F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2007 journal article

Improved understanding of an electron beam charge compensation method for magnetic sector secondary ion mass spectrometer analysis of insulators

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 25(4), 769–774.

By: Z. Zhu, C. Gu, F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2007 journal article

Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O-2(+) bombardment of organic materials

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 25(3), 480–484.

By: S. Harton, Z. Zhu, F. Stevie, D. Griffis & H. Ade

Source: NC State University Libraries
Added: August 6, 2018

2007 journal article

Transferable Internal Reservoir Device for Electron and Ion Beam Induced Chemistry

Microscopy and Analysis, 86, 5–6.

By: R. A.D. Garetto, C. A.D. Batchelor & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

Back side SIMS analysis of hafnium silicate

Applied Surface Science, 252(19), 7179–7181.

By: C. Gu, F. Stevie, J. Bennett, R. Garcia & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

SIMS depth profiling of deuterium labeled polymers in polymer multilayers

Applied Surface Science, 252(19), 7224–7227.

By: S. Harton, F. Stevie, D. Griffis & H. Ade

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

SIMS quantification of matrix and impurity species in AlxGa1-xN

Applied Surface Science, 252(19), 7228–7231.

By: C. Gu, F. Stevie, C. Hitzman, Y. Saripalli, M. Johnson & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

Thermal stability of lanthanum scandate dielectrics on Si(100)

Applied Physics Letters, 89(24).

By: P. Sivasubramani, T. Lee, M. Kim, J. Kim, B. Gnade, R. Wallace, L. Edge, D. Schlom ...

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Circuit editing of copper and low-k dielectrics in nanotechnology devices

Journal of Microscopy, 214(2004 Jun), 246–251.

By: F. Mosselveld, V. Makarov, T. Lundquist, D. Griffis & P. Russell

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Improved charge neutralization method for depth profiling of bulk insulators using O-2(+) primary beam on a magnetic sector SIMS instrument

Applied Surface Science, 231-232(2004 June 15), 786–790.

By: A. Pivovarov, F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

O-2(+) versus Cs+ for high depth resolution depth profiling of III-V nitride-based semiconductor devices

Applied Surface Science, 231-232(2004 June 15), 684–687.

By: M. Kachan, J. Hunter, D. Kouzminov, A. Pivovarov, J. Gu, F. Stevie, D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Secondary ion mass spectrometry backside analysis of barrier layers for copper diffusion

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 22(1), 350–354.

By: C. Gu, A. Pivovarov, R. Garcia, F. Stevie, D. Griffis, J. Moran, L. Kulig, J. Richards

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Site-specific SIMS backside analysis

Applied Surface Science, 231-232(2004 June 15), 663–667.

By: C. Gu, R. Garcia, A. Pivovarov, F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Utilization of electron impact ionization of gaseous and sputtered species in the secondary ion acceleration region of a magnetic sector SIMS instrument

Applied Surface Science, 231-232(2004 June 15), 781–785.

By: A. Pivovarov, C. Gu, F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2003 patent

Chemically enhanced focused ion beam micro-machining of copper

Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis & J. Gonzales Perez

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Etching characteristics of chromium thin films by an electron beam induced surface reaction

Semiconductor Science and Technology, 18(4), 199–205.

By: J. Wang, D. Griffis, R. Garcia & P. Russell

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Optimization of secondary ion mass spectrometry detection limit for N in SiC

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 21(5), 1649–1654.

By: A. Pivovarov, F. Stevie, D. Griffis & G. Guryanov

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Comparison of secondary ion mass spectroscopy analysis of ultrashallow phosphorus using Cs+, O-2(+), and CsC6- primary ion beams

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(2), 507–511.

By: R. Loesing, G. Guryanov, M. Phillips & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Improvements in focused ion beam micromachining of interconnect materials

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(6), 2700–2704.

By: J. Gonzalez, M. Da Silva, D. Griffis & P. Russell

Source: NC State University Libraries
Added: August 6, 2018

2001 journal article

Chemically enhanced focused ion beam micromachining of copper

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 19(6), 2539–2542.

By: J. Gonzalez, D. Griffis, T. Miau & P. Russell

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Channeling effects during focused-ion-beam micromachining of copper

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 18(4), 1061–1065.

By: J. Phillips, D. Griffis & P. Russell

Source: NC State University Libraries
Added: August 6, 2018

2000 patent

Method for water vapor enhanced charged-particle-beam machining

Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis, G. Shedd, T. Stark & J. Vitarelli

Source: NC State University Libraries
Added: August 6, 2018

2000 chapter

Optimization of SIMS analysis conditions for ultra-shallow phosphorus and arsenic implants

In Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 327–328). Bristol: Institute of Physics Publishing.

By: J. Hunter, T. Bates, S. Patel, R. Loesing, G. Guraynov & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Secondary ion mass spectrometry depth profiling of ultrashallow phosphorous in silicon

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 18(1), 509–513.

By: R. Loesing, G. Guryanov, J. Hunter & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

1999 patent

Method for water vapor enhanced charged-particle-beam machining

Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis, G. Shedd, T. Stark & J. Vitarelli

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Acceptor and donor doping of AlxGa1 xN thin film alloys grown on 6H SiC(0001) substrates via metalorganic vapor phase epitaxy

Journal of Electronic Materials, 27(4), 229–232.

By: M. Bremser, W. Perry, O. Nam, D. Griffis, R. Loesing, D. Ricks, R. Davis

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Chemically and geometrically enhanced focused ion beam micromachining

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 16(4), 2494–2498.

By: P. Russell, T. Stark, D. Griffis, J. Phillips & K. Jarausch

Source: NC State University Libraries
Added: August 6, 2018