Works (38)

Updated: April 11th, 2023 10:13

2014 article

SIMS analysis of high-performance accelerator niobium

Maheshwari, P., Stevie, F. A., Myneni, G. R., Ciovati, G., Rigsbee, J. M., Dhakal, P., & Griffis, D. P. (2014, November). SURFACE AND INTERFACE ANALYSIS, Vol. 46, pp. 288–290.

By: P. Maheshwari, F. Stevie, G. Myneni*, G. Ciovati*, J. Rigsbee, P. Dhakal*, D. Griffis

author keywords: SIMS depth profile; superconducting radio frequency; accelerator niobium
Source: Web Of Science
Added: August 6, 2018

2013 article

SIMS analysis of zinc oxide LED structures: quantification and analysis issues

Stevie, F. A., Maheshwari, P., Pierce, J. M., Adekore, B. T., & Griffis, D. P. (2013, January). SURFACE AND INTERFACE ANALYSIS, Vol. 45, pp. 352–355.

By: F. Stevie, P. Maheshwari, J. Pierce*, B. Adekore* & D. Griffis

author keywords: depth profiling; ZnO; RSFs
Source: Web Of Science
Added: August 6, 2018

2012 journal article

Quantification of cesium surface contamination on silicon resulting from SIMS analysis

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 30(3).

By: C. Penley, F. Stevie & D. Griffis

Source: Web Of Science
Added: August 6, 2018

2012 journal article

Time-of-Flight-Secondary Ion Mass Spectrometry Method Development for High-Sensitivity Analysis of Acid Dyes in Nylon Fibers

ANALYTICAL CHEMISTRY, 84(22), 10085–10090.

By: C. Zhou, M. Li, R. Garcia, A. Crawford n, K. Beck, D. Hinks, D. Griffis

Sources: Web Of Science, ORCID
Added: August 6, 2018

2011 article

Analysis of Interstitial Elements in Niobium with Secondary Ion Mass Spectrometry (SIMS)

INTERNATIONAL SYMPOSIUM ON THE SUPERCONDUCTING SCIENCE & TECHNOLOGY OF INGOT NIOBIUM, Vol. 1352, pp. 151-+.

By: P. Maheshwari, F. Stevie, G. Myeneni, G. Ciovati, J. Rigsbee & D. Griffis

author keywords: Superconducting niobium; secondary ion mass spectrometry; interstitial elements
Source: Web Of Science
Added: August 6, 2018

2011 journal article

Chemical and Spatial Differentiation of Syringyl and Guaiacyl Lignins in Poplar Wood via Time-of-Flight Secondary Ion Mass Spectrometry

ANALYTICAL CHEMISTRY, 83(18), 7020–7026.

By: C. Zhou n, Q. Li n, V. Chiang, L. Lucia & D. Griffis

Sources: Web Of Science, ORCID
Added: August 6, 2018

2011 article

Surface analysis of Nb materials for SRF cavities

SURFACE AND INTERFACE ANALYSIS, Vol. 43, pp. 151–153.

By: P. Maheshwari, H. Tian*, C. Reece*, M. Kelley*, G. Myneni*, F. Stevie, J. Rigsbee, A. Batchelor, D. Griffis

author keywords: SIMS; depth profiling; SRF Nb; deuterium; residual gas species
Source: Web Of Science
Added: August 6, 2018

2010 journal article

Focused Ion Beam Characterization of Bicomponent Polymer Fibers

MICROSCOPY AND MICROANALYSIS, 16(3), 282–290.

By: K. Wong, C. Haslauer n, N. Anantharamaiah, B. Pourdeyhimi, A. Batchelor & D. Griffis

author keywords: bicomponent polymer fiber; characterization; focused ion beam; differential sputtering; ion-induced secondary electron imaging; biaxial cross section
Sources: Web Of Science, ORCID
Added: August 6, 2018

2010 journal article

High field Q slope and the baking effect: Review of recent experimental results and new data on Nb heat treatments

PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, 13(2).

By: G. Ciovati*, G. Myneni*, F. Stevie, P. Maheshwari & D. Griffis

Source: Web Of Science
Added: August 6, 2018

2010 journal article

Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 28(3), 511–516.

By: C. Penley, F. Stevie, D. Griffis, S. Siebel, L. Kulig & J. Lee

author keywords: amorphisation; annealing; doping profiles; elemental semiconductors; ion implantation; phosphorus; secondary ion mass spectra; silicon
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam

Applied Surface Science, 254(9), 2708–2711.

By: Z. Zhu, F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2008 journal article

Quantification in dynamic SIMS: Current status and future needs

APPLIED SURFACE SCIENCE, 255(4), 1364–1367.

By: F. Stevie & D. Griffis

author keywords: Quantification; Ion implantation; Complementary methods; Focused ion beam (FIB)
Source: Web Of Science
Added: August 6, 2018

2007 journal article

Improved understanding of an electron beam charge compensation method for magnetic sector secondary ion mass spectrometer analysis of insulators

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 25(4), 769–774.

By: Z. Zhu, C. Gu, F. Stevie & D. Griffis

Source: Web Of Science
Added: August 6, 2018

2007 journal article

Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O-2(+) bombardment of organic materials

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 25(3), 480–484.

By: S. Harton, Z. Zhu, F. Stevie, D. Griffis & H. Ade

Sources: Web Of Science, ORCID
Added: August 6, 2018

2007 journal article

Transferable Internal Reservoir Device for Electron and Ion Beam Induced Chemistry

Microscopy and Analysis, 86, 5–6.

By: R. A.D. Garetto, C. A.D. Batchelor, D. Griffis, P.E. & Russell

Source: NC State University Libraries
Added: August 6, 2018

2006 article

Back side SIMS analysis of hafnium silicate

Gu, C., Stevie, F. A., Bennett, J., Garcia, R., & GriffiS, D. P. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7179–7181.

By: C. Gu, F. Stevie, J. Bennett*, R. Garcia & D. GriffiS

author keywords: SIMS; high-k dielectrics; back side analysis; hafnium silicate
Sources: Web Of Science, ORCID
Added: August 6, 2018

2006 article

SIMS depth profiling of deuterium labeled polymers in polymer multilayers

Harton, S. E., Stevie, F. A., Griffis, D. P., & Ade, H. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7224–7227.

By: S. Harton, F. Stevie, D. Griffis & H. Ade

author keywords: depth profiling; polymers; SIMS; thin films
Sources: Web Of Science, ORCID
Added: August 6, 2018

2006 article

SIMS quantification of matrix and impurity species in AlxGa1-xN

Gu, C. J., Stevie, F. A., Hitzman, C. J., Saripalli, Y. N., Johnson, M., & Griffis, D. P. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7228–7231.

By: C. Gu, F. Stevie, C. Hitzman*, Y. Saripalli, M. Johnson n & D. Griffis

author keywords: SIMS; aluminum gallium nitride (AlGaN); quantification; calibration curve
Source: Web Of Science
Added: August 6, 2018

2006 journal article

Thermal stability of lanthanum scandate dielectrics on Si(100)

APPLIED PHYSICS LETTERS, 89(24).

By: P. Sivasubramani*, T. Lee*, M. Kim n, J. Kim, B. Gnade*, R. Wallace, L. Edge*, D. Schlom* ...

Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Circuit editing of copper and low-k dielectrics in nanotechnology devices

Mosselveld, F., Makarov, VV, Lundquist, T. R., Griffis, D. P., & Russell, P. E. (2004, June). JOURNAL OF MICROSCOPY, Vol. 214, pp. 246–251.

By: F. Mosselveld*, . Makarov*, T. Lundquist*, D. Griffis & P. Russell

author keywords: copper etching; device modification; low-k dielectrics
Source: Web Of Science
Added: August 6, 2018

2004 article

Improved charge neutralization method for depth profiling of bulk insulators using O-2(+) primary beam on a magnetic sector SIMS instrument

Pivovarov, A. L., Stevie, F. A., & Griffis, D. P. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 786–790.

By: A. Pivovarov, F. Stevie & D. Griffis

author keywords: charge neutralization; electron gun; magnetic sector
Source: Web Of Science
Added: August 6, 2018

2004 article

O-2(+) versus Cs+ for high depth resolution depth profiling of III-V nitride-based semiconductor devices

Kachan, M., Hunter, J., Kouzminov, D., Pivovarov, A., Gu, J., Stevie, F., & Griffis, D. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 684–687.

By: M. Kachan, J. Hunter, D. Kouzminov, A. Pivovarov, J. Gu, F. Stevie, D. Griffis

author keywords: Cs cluster ions; GaN; depth resolution
Source: Web Of Science
Added: August 6, 2018

2004 article

Secondary ion mass spectrometry backside analysis of barrier layers for copper diffusion

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 22, pp. 350–354.

By: C. Gu, A. Pivovarov, R. Garcia, F. Stevie, D. Griffis, J. Moran, L. Kulig, J. Richards

Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Site-specific SIMS backside analysis

Gu, C., Garcia, R., Pivovarov, A., Stevie, F., & Griffis, D. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 663–667.

By: C. Gu, R. Garcia, A. Pivovarov, F. Stevie & D. Griffis

author keywords: SfMS; backside analysis; semiconductors; patterned wafers
Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Utilization of electron impact ionization of gaseous and sputtered species in the secondary ion acceleration region of a magnetic sector SIMS instrument

Pivovarov, A., Gu, C., Stevie, F., & Griffis, D. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 781–785.

By: A. Pivovarov, C. Gu n, F. Stevie & D. Griffis

author keywords: charge neutralization; electron gun; negative secondary ions; magnetic sector
Source: Web Of Science
Added: August 6, 2018

2003 patent

Chemically enhanced focused ion beam micro-machining of copper

Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis & J. Gonzales Perez

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Etching characteristics of chromium thin films by an electron beam induced surface reaction

SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 18(4), 199–205.

By: J. Wang*, D. Griffis, R. Garcia n & P. Russell

Source: Web Of Science
Added: August 6, 2018

2003 journal article

Optimization of secondary ion mass spectrometry detection limit for N in SiC

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 21(5), 1649–1654.

By: A. Pivovarov, F. Stevie, D. Griffis & G. Guryanov

Source: Web Of Science
Added: August 6, 2018

2002 article

Comparison of secondary ion mass spectroscopy analysis of ultrashallow phosphorus using Cs+, O-2(+), and CsC6- primary ion beams

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 20, pp. 507–511.

By: R. Loesing, G. Guryanov, M. Phillips & D. Griffis

Source: Web Of Science
Added: August 6, 2018

2002 article

Improvements in focused ion beam micromachining of interconnect materials

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 20, pp. 2700–2704.

By: J. Gonzalez, M. Silva, D. Griffis & P. Russell

Source: Web Of Science
Added: August 6, 2018

2001 article

Chemically enhanced focused ion beam micromachining of copper

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 19, pp. 2539–2542.

By: J. Gonzalez, D. Griffis, T. Miau & P. Russell

Source: Web Of Science
Added: August 6, 2018

2000 article

Channeling effects during focused-ion-beam micromachining of copper

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 18, pp. 1061–1065.

By: . Phillips, D. Griffis & P. Russell

Source: Web Of Science
Added: August 6, 2018

2000 patent

Method for water vapor enhanced charged-particle-beam machining

Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis, G. Shedd, T. Stark & J. Vitarelli

Source: NC State University Libraries
Added: August 6, 2018

2000 chapter

Optimization of SIMS analysis conditions for ultra-shallow phosphorus and arsenic implants

In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 327–328). Bristol: Institute of Physics Publishing.

By: J. Hunter, T. Bates, S. Patel, R. Loesing, G. Guraynov & D. Griffis

Ed(s): D. Williams & R. Shimizu

Source: NC State University Libraries
Added: August 6, 2018

2000 article

Secondary ion mass spectrometry depth profiling of ultrashallow phosphorous in silicon

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 18, pp. 509–513.

By: R. Loesing, G. Guryanov, J. Hunter & D. Griffis

Source: Web Of Science
Added: August 6, 2018

1999 patent

Method for water vapor enhanced charged-particle-beam machining

Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis, G. Shedd, T. Stark & J. Vitarelli

Source: NC State University Libraries
Added: August 6, 2018

1998 article

Acceptor and donor doping of AlxGa1-xN thin film alloys grown on 6H-SiC(0001) substrates via metalorganic vapor phase epitaxy

Bremser, M. D., Perry, W. G., Nam, O. H., Griffis, D. P., Loesing, R., Ricks, D. A., & Davis, R. F. (1998, April). JOURNAL OF ELECTRONIC MATERIALS, Vol. 27, pp. 229–232.

By: M. Bremser, W. Perry, O. Nam, D. Griffis, R. Loesing n, D. Ricks, R. Davis

author keywords: 6H-SiC(0001); acceptor doping; AlxGa1-xN; GaN; charge scattering; donor doping; electron mobility
Source: Web Of Science
Added: August 6, 2018

1998 article

Chemically and geometrically enhanced focused ion beam micromachining

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 16, pp. 2494–2498.

By: P. Russell, T. Stark, D. Griffis, . Phillips & K. Jarausch

Source: Web Of Science
Added: August 6, 2018