2010 journal article
An analytical model of source injection for N-type enhancement mode GaN-based Schottky Source/Drain MOSFET's with experimental demonstration
SOLID-STATE ELECTRONICS, 54(12), 1680–1685.
2010 journal article
Optimization of homoepitaxially grown AlGaN/GaN heterostructures
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 207(10), 2292–2299.
2009 journal article
Excitation current dependent cathodoluminescence study of InGaN/GaN quantum wells grown on m-plane and c-plane GaN substrates
JOURNAL OF APPLIED PHYSICS, 106(11).
2007 personal communication
Analytical threshold voltage model with TCAD simulation verification for design and evaluation of tri-gate MOSFETs
Jin, Y., Zeng, C., Ma, L., & Barlage, D. (2007, March).
2007 journal article
Electrical and optical properties of ZnO (000(1)over-bar) wafers implanted with argon
Journal of Applied Physics, 101(2).
2007 journal article
Nitrogen acceptors in bulk ZnO (000(1)over-bar)) substrates and homoepitaxial ZnO films
JOURNAL OF APPLIED PHYSICS, 102(2).
2007 journal article
Transmission electron microscopy studies of regrown GaN Ohmic contacts on patterned substrates for metal oxide semiconductor field effect transistor applications
APPLIED PHYSICS LETTERS, 90(20).
2006 journal article
Optical spectroscopic analysis of selected area epitaxially regrown n(+) gallium nitride
JOURNAL OF APPLIED PHYSICS, 99(12).
2005 journal article
Characterization and modeling of AlGaN/GaN MOS capacitor with leakage for large signal transistor modeling
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 15(10), 664–666.
2005 journal article
Fabrication of wafer scale, aligned sub-25 nm nanowire and nanowire templates using planar edge defined alternate layer process
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 28(2), 107–114.
2005 article
Properties of III-N MOS structures with low-temperature epitaxially regrown ohmic contacts
Saripalli, Y. N., Zeng, C., Long, J. P., Barlage, D. W., Johnson, M. A. L., & Braddock, D. (2006, January 25). JOURNAL OF CRYSTAL GROWTH, Vol. 287, pp. 562–565.
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