Emmanuel Duodu Amoako
Works (2)
2024 article
ML-Based Analysis of In-Situ Backscatter Electron Detection for Quality Assurance During Additive Manufacturing
2024 JOINT INTERNATIONAL VACUUM ELECTRONICS CONFERENCE AND INTERNATIONAL VACUUM ELECTRON SOURCES CONFERENCE, IVEC + IVESC 2024.
2023 article
Microstructure and Elevated Temperature Flexure Testing of Tungsten Produced by Electron Beam Additive Manufacturing
Zhang, H., Carriere, P. R., Amoako, E. D., Rock, C. D., Thielk, S. U., Fletcher, C. G., & Horn, T. J. (2023, August 30). JOM, Vol. 8.