Eric Joseph Adles

Back-reflection Second-harmonic Generation of (111)Si: Theory and Experiment

Gokce, B., Gundogdu, K., Adls, E. J., & Aspnes, D. E. (2011, May 13). Journal of the Korean Physical Society, Vol. 58, pp. 1237–1243.

Measurement and Control of In-Plane Surface Chemistry During Oxidation of H-Terminated (111)Si

Gokce, B., Adles, E. J., Aspnes, D. E., Gundogdu, K., Ihm, J., & Cheong, H. (2011, January 1). AIP Conference Proceedings, Vol. 1399.

Chemical-etch-assisted growth of epitaxial zinc oxide

Adles, E. J., & Aspnes, D. E. (2010, June 29). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Vol. 28, pp. 689–692.

Developing an epitaxial growth process for ZnO by MOCVD using real-time spectroscopic ellipsometry

Adles, E. J. (2010, December 22). Thin Solid Films.

Application of the anisotropic bond model to second-harmonic generation from amorphous media

Adles, E. J., & Aspnes, D. E. (2008, April 2). Physical Review B, Vol. 77.

The anisotropic bond model of nonlinear optics

Physica Status Solidi (a), 205(4), 728–731.

Method and system for conservative evaluation, validation and monitoring of thermal processing

Washington, DC: U.S. Patent and Trademark Office.

Method and system for conservative evaluation, validation and monitoring of thermal processing

Washington, DC: U.S. Patent and Trademark Office.

Relative bulk and interface contributions to optical second-harmonic generation in silicon

Peng, H. J., Adles, E. J., Wang, J.-F. T., & Aspnes, D. E. (2005, November 14). Physical Review B, Vol. 72.

Method and system for conservative evaluation, validation and monitoring of thermal processing

Washington, DC: U.S. Patent and Trademark Office.