Works (57)

2018 | journal article

Determination of chemical composition in multilayer polymer film using ToF-SIMS

Analytical Methods, 10(21), 2444–2449.

By: C. Zhou, D. Sun, R. Garcia & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2018 | journal article

Imaging and quantitative analysis of insecticide in mosquito net fibers using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

PLOS ONE, 13(12).

By: S. Smith, C. Zhou, F. Stevie & R. Garcia

Source: NC State University Libraries
Added: January 14, 2019

2018 | journal article

Improvement in detection limit for time-of-flight SIMS analysis of dopants in GaN structures

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 36(3).

By: A. Klump, C. Zhou, F. Stevie, R. Collazo & Z. Sitar

Source: NC State University Libraries
Added: August 6, 2018

2018 | journal article

Quantification of organic materials by ion implantation

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 36(3).

By: C. Zhou, F. Stevie & S. Smith

Source: NC State University Libraries
Added: August 6, 2018

2018 | journal article

Secondary ion mass spectrometry for superconducting radiofrequency cavity materials

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(5).

By: J. Tuggle, U. Pudasaini, F. Stevie, M. Kelley, A. Palczewski & C. Reece

Source: NC State University Libraries
Added: October 16, 2018

2018 | journal article

ToF-SIMS analysis of ion implanted standard to quantify insecticide in mosquito netting with cesium and argon gas cluster sputtering beams

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 36(3).

By: C. Zhou, F. Stevie, S. Smith, D. Rading & J. Zakel

Source: NC State University Libraries
Added: August 6, 2018

2016 | journal article

Analysis of hydrogen in materials with and without high hydrogen mobility

Surface and Interface Analysis, 48(5), 310–314.

By: F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2016 | conference paper

Improvement of hydrogen detection limit for quadruple SIMS tool

In 2016 27th annual semi advanced semiconductor manufacturing conference (asmc) (pp. 172–175).

By: Z. Zhang, B. Hengstebeck, F. Stevie & M. Hopstaken

Source: NC State University Libraries
Added: August 6, 2018

2016 | journal article

Method for quantification of insecticide in mosquito netting using ion implantation and ToF-SIMS analysis

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 34(3).

By: C. Zhou, F. Stevie & S. Smith

Source: NC State University Libraries
Added: August 6, 2018

2016 | journal article

SIMS measurement of hydrogen and deuterium detection limits in silicon: Comparison of different SIMS instrumentation

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 34(3).

By: F. Stevie, C. Zhou, M. Hopstaken, M. Saccomanno, Z. Zhang & A. Turansky

Source: NC State University Libraries
Added: August 6, 2018

2015 | conference paper

SRF niobium characterization using SIMS and FIB-TEM

In Science and technology of ingot niobium for superconducting radio frequency applications (Vol. 1687).

By: F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2014 | journal article

Back side SIMS analysis

Surface and Interface Analysis, 46, 241–243.

By: F. Stevie, R. Garcia, C. Richardson & C. Zhou

Source: NC State University Libraries
Added: August 6, 2018

2014 | journal article

FIB-SIMS quantification using TOF-SIMS with Ar and Xe plasma sources

Surface and Interface Analysis, 46, 285–287.

By: F. Stevie, L. Sedlacek, P. Babor, J. Jiruse, E. Principe & K. Klosova

Source: NC State University Libraries
Added: August 6, 2018

2014 | journal article

SIMS analysis of high-performance accelerator niobium

Surface and Interface Analysis, 46, 288–290.

By: P. Maheshwari, F. Stevie, G. Myneni, G. Ciovati, J. Rigsbee, P. Dhakal, D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2013 | journal article

SIMS analysis of zinc oxide LED structures: quantification and analysis issues

Surface and Interface Analysis, 45(1), 352–355.

By: F. Stevie, P. Maheshwari, J. Pierce, B. Adekore & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2013 | journal article

TOF SIMS analyses of stray Ga during FIB milling

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 31(6).

By: C. Santeufemio, B. Gorman, C. Zhou, L. Giannuzzi & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2012 | journal article

Quantification of cesium surface contamination on silicon resulting from SIMS analysis

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 30(3).

By: C. Penley, F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2011 | conference paper

Analysis of interstitial elements in niobium with secondary ion mass spectrometry (SIMS)

In International symposium on the superconducting science & technology of ingot niobium (Vol. 1352, pp. 151–160).

By: P. Maheshwari, F. Stevie, G. Myeneni, G. Ciovati, J. Rigsbee & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2011 | journal article

Surface analysis of Nb materials for SRF cavities

Surface and Interface Analysis, 43(1-2), 151–153.

By: P. Maheshwari, H. Tian, C. Reece, M. Kelley, G. Myneni, F. Stevie, J. Rigsbee, A. Batchelor, D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2010 | journal article

High field Q slope and the baking effect: Review of recent experimental results and new data on Nb heat treatments

Physical Review Special Topics. Accelerators and Beams, 13(2).

By: G. Ciovati, G. Myneni, F. Stevie, P. Maheshwari & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2010 | journal article

Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 28(3), 511–516.

By: C. Penley, F. Stevie, D. Griffis, S. Siebel, L. Kulig & J. Lee

Source: NC State University Libraries
Added: August 6, 2018

2009 | journal article

On the origin of aluminum-related cathodoluminescence emissions from sublimation grown 4H-SiC(11(2)over-bar0)

Applied Surface Science, 255(13-14), 6535–6539.

By: S. Bishop, C. Reynolds, J. Molstad, F. Stevie, D. Barnhardt & R. Davis

Source: NC State University Libraries
Added: August 6, 2018

2008 | journal article

Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam

Applied Surface Science, 254(9), 2708–2711.

By: Z. Zhu, F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2008 | journal article

Quantification in dynamic SIMS: Current status and future needs

Applied Surface Science, 255(4), 1364–1367.

By: F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2008 | journal article

Sublimation growth of an in-situ-deposited layer in SiC chemical vapor deposition on 4H-SiC(1 1 (2)over-bar 0)

Journal of Crystal Growth, 311(1), 72–78.

By: S. Bishop, C. Reynolds, Z. Liliental-Weber, Y. Uprety, C. Ebert, F. Stevie, J. Park, R. Davis

Source: NC State University Libraries
Added: August 6, 2018

2007 | journal article

Carbon-13 labeling for quantitative analysis of molecular movement in heterogeneous organic materials using secondary ion mass spectrometry

Analytical Chemistry, 79(14), 5358–5363.

By: S. Harton, Z. Zhu, F. Stevie, Y. Aoyama & H. Ade

Source: NC State University Libraries
Added: August 6, 2018

2007 | journal article

Improved understanding of an electron beam charge compensation method for magnetic sector secondary ion mass spectrometer analysis of insulators

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 25(4), 769–774.

By: Z. Zhu, C. Gu, F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2007 | journal article

Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O-2(+) bombardment of organic materials

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 25(3), 480–484.

By: S. Harton, Z. Zhu, F. Stevie, D. Griffis & H. Ade

Source: NC State University Libraries
Added: August 6, 2018

2006 | journal article

Back side SIMS analysis of hafnium silicate

Applied Surface Science, 252(19), 7179–7181.

By: C. Gu, F. Stevie, J. Bennett, R. Garcia & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2006 | journal article

Carbon-13 labeled polymers: An alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry

Analytical Chemistry, 78(10), 3452–3460.

By: S. Harton, F. Stevie, Z. Zhu & H. Ade

Source: NC State University Libraries
Added: August 6, 2018

2006 | journal article

Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry

Journal of the American Society for Mass Spectrometry, 17(8), 1142–1145.

By: S. Harton, F. Stevie & H. Ade

Source: NC State University Libraries
Added: August 6, 2018

2006 | journal article

Diffusion behavior of implanted Li ions in GaN thin films studied by secondary ion mass spectrometry

Materials Science in Semiconductor Processing, 9(1-3), 375–379.

By: F. Salman, L. Chow, B. Chai & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2006 | journal article

Diffusion profiles of low dosages chromium ions implanted into (100) crystalline silicon

Materials Science in Semiconductor Processing, 9(1-3), 62–65.

By: F. Salman, P. Zhang, L. Chow & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2006 | journal article

Investigation of the effects of isotopic labeling, at a PS/PMMA interface using SIMS and mean-field theory

Macromolecules, 39(4), 1639–1645.

By: S. Harton, F. Stevie & H. Ade

Source: NC State University Libraries
Added: August 6, 2018

2006 | journal article

SIMS depth profiling of deuterium labeled polymers in polymer multilayers

Applied Surface Science, 252(19), 7224–7227.

By: S. Harton, F. Stevie, D. Griffis & H. Ade

Source: NC State University Libraries
Added: August 6, 2018

2006 | journal article

SIMS quantification of matrix and impurity species in AlxGa1-xN

Applied Surface Science, 252(19), 7228–7231.

By: C. Gu, F. Stevie, C. Hitzman, Y. Saripalli, M. Johnson & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2006 | journal article

Thermal stability of lanthanum scandate dielectrics on Si(100)

Applied Physics Letters, 89(24).

By: P. Sivasubramani, T. Lee, M. Kim, J. Kim, B. Gnade, R. Wallace, L. Edge, D. Schlom ...

Source: NC State University Libraries
Added: August 6, 2018

2005 | journal article

Diffusion-controlled reactive coupling at polymer-polymer interfaces

Macromolecules, 38(9), 3543–3546.

By: S. Harton, F. Stevie & H. Ade

Source: NC State University Libraries
Added: August 6, 2018

2005 | journal article

Growth of dense ZnO films via MOVPE on GaN(0001) epilayers using a low/high-temperature sequence

Journal of Crystal Growth, 277(38356), 345–351.

By: J. Pierce, B. Adekore, R. Davis & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2005 | journal article

Homoepitaxial growth of dense ZnO(0001) and ZnO (1120) films via MOVPE on selected ZnO substrates

Journal of Crystal Growth, 283(02-Jan), 147–155.

By: J. Pierce, B. Adekore, R. Davis & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2005 | book

Introduction to focused ion beams: Instrumentation, theory, techniques, and practice

New York: Springer.

By: L. Giannuzzi & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2005 | journal article

Investigation of blend miscibility of a ternary PS/PCHMA/PMMA system using SIMS and mean-field theory

Macromolecules, 38(25), 10511–10515.

By: S. Harton, T. Koga, F. Stevie, T. Araki & H. Ade

Source: NC State University Libraries
Added: August 6, 2018

2005 | journal article

Low-temperature reactive coupling at polymer-polymer interfaces facilitated by supercritical CO2

Polymer, 46(23), 10173–10179.

By: S. Harton, F. Stevie, R. Spontak, T. Koga, M. Rafailovich, J. Sokolov, H. Ade

Source: NC State University Libraries
Added: August 6, 2018

2005 | journal article

Segregation and enhanced diffusion of nitrogen in silicon induced by low energy ion bombardment

Journal of Applied Physics, 97(8).

Source: NC State University Libraries
Added: August 6, 2018

2004 | journal article

Diffusion profiles of high dosage Cr and V ions implanted into silicon

Journal of Applied Physics, 96(2), 1053–1058.

By: P. Zhang, F. Stevie, R. Vanfleet, R. Neelakantan, M. Klimov, D. Zhou, L. Chow

Source: NC State University Libraries
Added: August 6, 2018

2004 | journal article

Improved charge neutralization method for depth profiling of bulk insulators using O-2(+) primary beam on a magnetic sector SIMS instrument

Applied Surface Science, 231-232(2004 June 15), 786–790.

By: A. Pivovarov, F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2004 | journal article

O-2(+) versus Cs+ for high depth resolution depth profiling of III-V nitride-based semiconductor devices

Applied Surface Science, 231-232(2004 June 15), 684–687.

By: M. Kachan, J. Hunter, D. Kouzminov, A. Pivovarov, J. Gu, F. Stevie, D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2004 | journal article

Preface - Special Issue - Secondary Ion Mass Spectrometry SIMS XIV

Applied Surface Science, 231-232(2004 June 15), 1–2.

By: J. Hunter, B. Schueler & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2004 | journal article

Secondary ion mass spectrometry backside analysis of barrier layers for copper diffusion

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 22(1), 350–354.

By: C. Gu, A. Pivovarov, R. Garcia, F. Stevie, D. Griffis, J. Moran, L. Kulig, J. Richards

Source: NC State University Libraries
Added: August 6, 2018

2004 | journal article

Site-specific SIMS backside analysis

Applied Surface Science, 231-232(2004 June 15), 663–667.

By: C. Gu, R. Garcia, A. Pivovarov, F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2004 | journal article

Utilization of electron impact ionization of gaseous and sputtered species in the secondary ion acceleration region of a magnetic sector SIMS instrument

Applied Surface Science, 231-232(2004 June 15), 781–785.

By: A. Pivovarov, C. Gu, F. Stevie & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2003 | journal article

Diffusion of 18 elements implanted into thermally grown SiO2

Journal of Applied Physics, 94(12), 7433–7439.

By: H. Francois-Saint-Cyr, F. Stevie, J. Mckinley, K. Elshot, L. Chow & K. Richardson

Source: NC State University Libraries
Added: August 6, 2018

2003 | journal article

Optimization of secondary ion mass spectrometry detection limit for N in SiC

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 21(5), 1649–1654.

By: A. Pivovarov, F. Stevie, D. Griffis & G. Guryanov

Source: NC State University Libraries
Added: August 6, 2018

2002 | journal article

In-fab techniques for baselining implant dose, contamination

Solid State Technology, 45(8), 63-.

By: R. Santiesteban, J. McKinley, F. Stevie, P. Flatch & O. Rodriguez

Source: NC State University Libraries
Added: August 6, 2018

2002 | journal article

Secondary ion mass spectrometry induced damage adjacent to analysis craters in silicon

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 20(5), 1663–1666.

By: M. Clark, K. Jones & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2002 | journal article

Utilizing the SIMS technique in the study of grain boundary diffusion along twist grain boundaries in the Cu(Ni) system

Acta Materialia, 50(20), 5079–5084.

By: S. Schwarz, B. Kempshall, L. Giannuzzi & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2002 | journal article

XPS analysis of FIB-milled Si

Surface and Interface Analysis, 33(12), 907–913.

By: A. Ferryman, J. Fulghum, L. Giannuzzi & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018