Works (66)

Updated: July 5th, 2023 15:59

2023 journal article

Analysis of furnace contamination on superconducting radio frequency niobium using secondary-ion mass spectrometry

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 41(3).

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: May 30, 2023

2022 journal article

Enhanced focused ion beam milling with use of nested raster patterns

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 40(1).

By: R. Garcia n, L. Giannuzzi n, F. Stevie n & P. Strader n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: January 18, 2022

2022 journal article

Improved quantitation of SIMS depth profile measurements of niobium via sample holder design improvements and characterization of grain orientation effects

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 40(2).

By: J. Angle*, E. Lechner*, A. Palczewski*, C. Reece*, F. Stevie n & M. Kelley*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: April 4, 2022

2021 journal article

A study of dopant incorporation in Te-doped GaAsSb nanowires using a combination of XPS/UPS, and C-AFM/SKPM

SCIENTIFIC REPORTS, 11(1).

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: June 10, 2021

2021 journal article

Advances in secondary ion mass spectrometry for N-doped niobium

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 39(2).

By: J. Angle*, A. Palczewski*, C. Reece*, F. Stevie n & M. Kelley*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: March 29, 2021

2020 journal article

Analysis of permethrin treated fabric using ToF-SIMS

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 38(3).

By: C. Zhou n, F. Stevie n & R. Garcia n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: October 5, 2020

2020 journal article

Introduction to x-ray photoelectron spectroscopy

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 38(6).

By: F. Stevie n & C. Donley*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: October 26, 2020

2020 journal article

Sample handling, preparation and mounting for XPS and other surface analytical techniques

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 38(6).

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: October 12, 2020

2019 journal article

Electron backscatter diffraction of Nb3Sn coated niobium: Revealing structure as a function of depth

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 37(5).

By: J. Tuggle*, U. Pudasaini*, J. Angle*, G. Eremeev*, C. Reece*, F. Stevie n, M. Kelley*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: November 18, 2019

2018 journal article

Determination of chemical composition in multilayer polymer film using ToF-SIMS

ANALYTICAL METHODS, 10(21), 2444–2449.

By: C. Zhou n, D. Sun*, R. Garcia n & F. Stevie n

co-author countries: Germany 🇩🇪 United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2018 journal article

Imaging and quantitative analysis of insecticide in mosquito net fibers using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

PLOS ONE, 13(12).

By: S. Smith*, C. Zhou n, F. Stevie n & R. Garcia n

co-author countries: United States of America 🇺🇸
MeSH headings : Chlorides / chemistry; Insecticide-Treated Bednets; Insecticides / analysis; Microscopy, Electron, Scanning; Permethrin / analysis; Spectrometry, Mass, Secondary Ion
Sources: Web Of Science, ORCID
Added: January 14, 2019

2018 journal article

Improvement in detection limit for time-of-flight SIMS analysis of dopants in GaN structures

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(3).

By: A. Klump n, C. Zhou n, F. Stevie n, R. Collazo n & Z. Sitar n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2018 journal article

Quantification of organic materials by ion implantation

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(3).

By: C. Zhou n, F. Stevie n & S. Smith*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2018 journal article

Secondary ion mass spectrometry for superconducting radiofrequency cavity materials

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(5).

By: J. Tuggle n, U. Pudasaini n, F. Stevie n, M. Kelley n, A. Palczewski n & C. Reece n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: October 16, 2018

2018 journal article

ToF-SIMS analysis of ion implanted standard to quantify insecticide in mosquito netting with cesium and argon gas cluster sputtering beams

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(3).

By: C. Zhou n, F. Stevie n, S. Smith*, D. Rading & J. Zakel

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2016 journal article

Analysis of hydrogen in materials with and without high hydrogen mobility

SURFACE AND INTERFACE ANALYSIS, 48(5), 310–314.

By: F. Stevie n

co-author countries: United States of America 🇺🇸
author keywords: hydrogen analysis; depth profiling; SIMS; hydrogen forward scattering; nuclear reaction analysis; niobium analysis
Source: Web Of Science
Added: August 6, 2018

2016 conference paper

Improvement of hydrogen detection limit for quadruple SIMS tool

2016 27th annual semi advanced semiconductor manufacturing conference (asmc), 172–175.

By: Z. Zhang*, B. Hengstebeck n, F. Stevie* & M. Hopstaken*

co-author countries: United States of America 🇺🇸
Source: NC State University Libraries
Added: August 6, 2018

2016 journal article

Method for quantification of insecticide in mosquito netting using ion implantation and ToF-SIMS analysis

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 34(3).

By: C. Zhou n, F. Stevie n & S. Smith*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2016 journal article

SIMS measurement of hydrogen and deuterium detection limits in silicon: Comparison of different SIMS instrumentation

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 34(3).

By: F. Stevie n, C. Zhou n, M. Hopstaken*, M. Saccomanno*, Z. Zhang* & A. Turansky*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2015 article

SRF Niobium Characterization Using SIMS and FIB-TEM

SCIENCE AND TECHNOLOGY OF INGOT NIOBIUM FOR SUPERCONDUCTING RADIO FREQUENCY APPLICATIONS, Vol. 1687.

By: F. Stevie n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2014 article

Back side SIMS analysis

Stevie, F. A., Garcia, R., Richardson, C., & Zhou, C. (2014, November). SURFACE AND INTERFACE ANALYSIS, Vol. 46, pp. 241–243.

By: F. Stevie n, R. Garcia n, C. Richardson* & C. Zhou n

co-author countries: United States of America 🇺🇸
author keywords: SIMS; depth profiling; back side analysis; mesa structure; sample polishing
Sources: Web Of Science, ORCID
Added: August 6, 2018

2014 article

FIB-SIMS quantification using TOF-SIMS with Ar and Xe plasma sources

Stevie, F. A., Sedlacek, L., Babor, P., Jiruse, J., Principe, E., & Klosova, K. (2014, November). SURFACE AND INTERFACE ANALYSIS, Vol. 46, pp. 285–287.

By: F. Stevie n, L. Sedlacek*, P. Babor*, J. Jiruse*, E. Principe & K. Klosova*

co-author countries: Czechia 🇨🇿 United States of America 🇺🇸
author keywords: SIMS depth profiling; plasma ion source; TOF-SIMS analyzer; FIB-SIMS; SIMS quantification; high sputtering rate
Source: Web Of Science
Added: August 6, 2018

2014 article

SIMS analysis of high-performance accelerator niobium

Maheshwari, P., Stevie, F. A., Myneni, G. R., Ciovati, G., Rigsbee, J. M., Dhakal, P., & Griffis, D. P. (2014, November). SURFACE AND INTERFACE ANALYSIS, Vol. 46, pp. 288–290.

By: P. Maheshwari n, F. Stevie n, G. Myneni*, G. Ciovati*, J. Rigsbee n, P. Dhakal*, D. Griffis n

co-author countries: United States of America 🇺🇸
author keywords: SIMS depth profile; superconducting radio frequency; accelerator niobium
Source: Web Of Science
Added: August 6, 2018

2013 article

SIMS analysis of zinc oxide LED structures: quantification and analysis issues

Stevie, F. A., Maheshwari, P., Pierce, J. M., Adekore, B. T., & Griffis, D. P. (2013, January). SURFACE AND INTERFACE ANALYSIS, Vol. 45, pp. 352–355.

By: F. Stevie n, P. Maheshwari n, J. Pierce, B. Adekore & D. Griffis n

co-author countries: United States of America 🇺🇸
author keywords: depth profiling; ZnO; RSFs
Source: Web Of Science
Added: August 6, 2018

2013 journal article

TOF SIMS analyses of stray Ga during FIB milling

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 31(6).

By: C. Santeufemio*, B. Gorman*, C. Zhou n, L. Giannuzzi* & F. Stevie n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2012 journal article

Quantification of cesium surface contamination on silicon resulting from SIMS analysis

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 30(3).

By: C. Penley n, F. Stevie n & D. Griffis n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2011 article

Analysis of Interstitial Elements in Niobium with Secondary Ion Mass Spectrometry (SIMS)

INTERNATIONAL SYMPOSIUM ON THE SUPERCONDUCTING SCIENCE & TECHNOLOGY OF INGOT NIOBIUM, Vol. 1352, pp. 151-+.

By: P. Maheshwari n, F. Stevie n, G. Myeneni*, G. Ciovati*, J. Rigsbee n & D. Griffis n

co-author countries: United States of America 🇺🇸
author keywords: Superconducting niobium; secondary ion mass spectrometry; interstitial elements
Source: Web Of Science
Added: August 6, 2018

2011 article

Surface analysis of Nb materials for SRF cavities

SURFACE AND INTERFACE ANALYSIS, Vol. 43, pp. 151–153.

co-author countries: United States of America 🇺🇸
author keywords: SIMS; depth profiling; SRF Nb; deuterium; residual gas species
Source: Web Of Science
Added: August 6, 2018

2010 journal article

High field Q slope and the baking effect: Review of recent experimental results and new data on Nb heat treatments

PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, 13(2).

By: G. Ciovati*, G. Myneni*, F. Stevie n, P. Maheshwari n & D. Griffis n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2010 journal article

Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 28(3), 511–516.

By: C. Penley n, F. Stevie n, D. Griffis n, S. Siebel*, L. Kulig* & J. Lee*

co-author countries: United States of America 🇺🇸
author keywords: amorphisation; annealing; doping profiles; elemental semiconductors; ion implantation; phosphorus; secondary ion mass spectra; silicon
Source: Web Of Science
Added: August 6, 2018

2009 journal article

On the origin of aluminum-related cathodoluminescence emissions from sublimation grown 4H-SiC(11(2)over-bar0)

APPLIED SURFACE SCIENCE, 255(13-14), 6535–6539.

By: S. Bishop n, C. Reynolds n, J. Molstad*, F. Stevie n, D. Barnhardt n & R. Davis*

co-author countries: United States of America 🇺🇸
author keywords: 4H-SiC; Chemical vapor deposition processes-hot wall epitaxy and sublimation epitaxy; Interfacial impurities; Cathodoluminescence; Secondary ion mass spectrometry; Impurity luminescence
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam

Applied Surface Science, 254(9), 2708–2711.

By: Z. Zhu*, F. Stevie* & D. Griffis*

Source: NC State University Libraries
Added: August 6, 2018

2008 journal article

Quantification in dynamic SIMS: Current status and future needs

APPLIED SURFACE SCIENCE, 255(4), 1364–1367.

By: F. Stevie n & D. Griffis n

co-author countries: United States of America 🇺🇸
author keywords: Quantification; Ion implantation; Complementary methods; Focused ion beam (FIB)
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Sublimation growth of an in-situ-deposited layer in SiC chemical vapor deposition on 4H-SiC(1 1 (2)over-bar 0)

JOURNAL OF CRYSTAL GROWTH, 311(1), 72–78.

By: S. Bishop n, C. Reynolds n, Z. Liliental-Weber*, Y. Uprety*, C. Ebert*, F. Stevie n, J. Park n, R. Davis*

co-author countries: United States of America 🇺🇸
author keywords: Characterization; Chemical vapor deposition processes; Hot-wall epitaxy; Silicon carbide; Semiconducting materials
Source: Web Of Science
Added: August 6, 2018

2007 journal article

Carbon-13 labeling for quantitative analysis of molecular movement in heterogeneous organic materials using secondary ion mass spectrometry

ANALYTICAL CHEMISTRY, 79(14), 5358–5363.

By: S. Harton n, Z. Zhu n, F. Stevie n, Y. Aoyama n & H. Ade n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2007 journal article

Improved understanding of an electron beam charge compensation method for magnetic sector secondary ion mass spectrometer analysis of insulators

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 25(4), 769–774.

By: Z. Zhu n, C. Gu n, F. Stevie n & D. Griffis n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2007 journal article

Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O-2(+) bombardment of organic materials

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 25(3), 480–484.

By: S. Harton n, Z. Zhu n, F. Stevie n, D. Griffis n & H. Ade n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2006 article

Back side SIMS analysis of hafnium silicate

Gu, C., Stevie, F. A., Bennett, J., Garcia, R., & GriffiS, D. P. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7179–7181.

By: C. Gu n, F. Stevie n, J. Bennett*, R. Garcia n & D. GriffiS n

co-author countries: United States of America 🇺🇸
author keywords: SIMS; high-k dielectrics; back side analysis; hafnium silicate
Sources: Web Of Science, ORCID
Added: August 6, 2018

2006 journal article

Carbon-13 labeled polymers: An alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry

ANALYTICAL CHEMISTRY, 78(10), 3452–3460.

By: S. Harton n, F. Stevie n, Z. Zhu n & H. Ade n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2006 journal article

Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry

JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 17(8), 1142–1145.

By: S. Harton n, F. Stevie n & H. Ade n

co-author countries: United States of America 🇺🇸
MeSH headings : Carbon Isotopes / chemistry; Isotope Labeling / methods; Organic Chemicals / chemistry; Polymethyl Methacrylate / chemistry; Polystyrenes / chemistry; Reproducibility of Results; Sensitivity and Specificity; Spectrometry, Mass, Electrospray Ionization / methods
Sources: Web Of Science, ORCID
Added: August 6, 2018

2006 article

Diffusion behavior of implanted Li ions in GaN thin films studied by secondary ion mass spectrometry

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Vol. 9, pp. 375–379.

By: F. Salman*, L. Chow*, B. Chai* & F. Stevie n

co-author countries: United States of America 🇺🇸
author keywords: GaN; diffusion; SIMS
Source: Web Of Science
Added: August 6, 2018

2006 article

Diffusion profiles of low dosages chromium ions implanted into (100) crystalline silicon

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Vol. 9, pp. 62–65.

By: F. Salman*, P. Zhang*, L. Chow* & F. Stevie n

co-author countries: United States of America 🇺🇸
author keywords: Cr; Si; SIMS; diffusion; ion implantation
Source: Web Of Science
Added: August 6, 2018

2006 journal article

Investigation of the effects of isotopic labeling, at a PS/PMMA interface using SIMS and mean-field theory

MACROMOLECULES, 39(4), 1639–1645.

By: S. Harton n, F. Stevie n & H. Ade n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2006 article

SIMS depth profiling of deuterium labeled polymers in polymer multilayers

Harton, S. E., Stevie, F. A., Griffis, D. P., & Ade, H. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7224–7227.

By: S. Harton n, F. Stevie n, D. Griffis n & H. Ade n

co-author countries: United States of America 🇺🇸
author keywords: depth profiling; polymers; SIMS; thin films
Sources: Web Of Science, ORCID
Added: August 6, 2018

2006 article

SIMS quantification of matrix and impurity species in AlxGa1-xN

Gu, C. J., Stevie, F. A., Hitzman, C. J., Saripalli, Y. N., Johnson, M., & Griffis, D. P. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7228–7231.

By: C. Gu*, F. Stevie*, C. Hitzman, Y. Saripalli*, M. Johnson & D. Griffis*

author keywords: SIMS; aluminum gallium nitride (AlGaN); quantification; calibration curve
Source: Web Of Science
Added: August 6, 2018

2006 journal article

Thermal stability of lanthanum scandate dielectrics on Si(100)

APPLIED PHYSICS LETTERS, 89(24).

By: P. Sivasubramani*, T. Lee*, M. Kim*, J. Kim*, B. Gnade*, R. Wallace*, L. Edge*, D. Schlom* ...

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2005 journal article

Diffusion-controlled reactive coupling at polymer-polymer interfaces

MACROMOLECULES, 38(9), 3543–3546.

By: S. Harton n, F. Stevie n & H. Ade n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2005 journal article

Growth of dense ZnO films via MOVPE on GaN(0001) epilayers using a low/high-temperature sequence

JOURNAL OF CRYSTAL GROWTH, 277(1-4), 345–351.

By: J. Pierce n, B. Adekore n, R. Davis n & F. Stevie n

co-author countries: United States of America 🇺🇸
author keywords: crystal morphology; impurities; X-ray diffraction; organometallic vapor phase deposition; ZnO
Source: Web Of Science
Added: August 6, 2018

2005 journal article

Homoepitaxial growth of dense ZnO(0001) and ZnO (1120) films via MOVPE on selected ZnO substrates

Journal of Crystal Growth, 283(02-Jan), 147–155.

By: J. Pierce, B. Adekore, R. Davis & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2005 book

Introduction to focused ion beams: Instrumentation, theory, techniques, and practice

New York: Springer.

By: L. Giannuzzi & F. Stevie

Source: NC State University Libraries
Added: August 6, 2018

2005 journal article

Investigation of blend miscibility of a ternary PS/PCHMA/PMMA system using SIMS and mean-field theory

MACROMOLECULES, 38(25), 10511–10515.

By: S. Harton n, T. Koga n, F. Stevie n, T. Araki n & H. Ade n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2005 journal article

Low-temperature reactive coupling at polymer–polymer interfaces facilitated by supercritical CO2

Polymer, 46(23), 10173–10179.

By: S. Harton*, F. Stevie*, R. Spontak*, T. Koga, M. Rafailovich, J. Sokolov, H. Ade*

author keywords: polymer bends; reactive compatibilization; supercritical fluids
Sources: Web Of Science, ORCID, Crossref
Added: August 6, 2018

2005 journal article

Segregation and enhanced diffusion of nitrogen in silicon induced by low energy ion bombardment

JOURNAL OF APPLIED PHYSICS, 97(8).

By: N. Stoddard n, G. Duscher n, A. Karoui n, F. Stevie n & G. Rozgonyi n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2004 journal article

Diffusion profiles of high dosage Cr and V ions implanted into silicon

JOURNAL OF APPLIED PHYSICS, 96(2), 1053–1058.

By: P. Zhang*, F. Stevie n, R. Vanfleet*, R. Neelakantan*, M. Klimov*, D. Zhou*, L. Chow*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2004 article

Improved charge neutralization method for depth profiling of bulk insulators using O-2(+) primary beam on a magnetic sector SIMS instrument

Pivovarov, A. L., Stevie, F. A., & Griffis, D. P. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 786–790.

By: A. Pivovarov n, F. Stevie n & D. Griffis n

co-author countries: United States of America 🇺🇸
author keywords: charge neutralization; electron gun; magnetic sector
Source: Web Of Science
Added: August 6, 2018

2004 article

O-2(+) versus Cs+ for high depth resolution depth profiling of III-V nitride-based semiconductor devices

Kachan, M., Hunter, J., Kouzminov, D., Pivovarov, A., Gu, J., Stevie, F., & Griffis, D. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 684–687.

By: M. Kachan, J. Hunter, D. Kouzminov, A. Pivovarov*, J. Gu, F. Stevie*, D. Griffis*

author keywords: Cs cluster ions; GaN; depth resolution
Source: Web Of Science
Added: August 6, 2018

2004 article

Secondary ion mass spectrometry backside analysis of barrier layers for copper diffusion

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 22, pp. 350–354.

By: C. Gu n, A. Pivovarov n, R. Garcia n, F. Stevie n, D. Griffis n, J. Moran*, L. Kulig*, J. Richards*

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Site-specific SIMS backside analysis

Gu, C., Garcia, R., Pivovarov, A., Stevie, F., & Griffis, D. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 663–667.

By: C. Gu n, R. Garcia n, A. Pivovarov n, F. Stevie n & D. Griffis n

co-author countries: United States of America 🇺🇸
author keywords: SfMS; backside analysis; semiconductors; patterned wafers
Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Special Issue - Secondary Ion Mass Spectrometry SIMS XIV - Proceedings of the Fourteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics - San Diego, California, USA, September 14-19, 2003 - Preface

Hunter, J., Schueler, B. W., & Stevie, F. A. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 1–2.

By: J. Hunter*, B. Schueler & F. Stevie n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2004 article

Utilization of electron impact ionization of gaseous and sputtered species in the secondary ion acceleration region of a magnetic sector SIMS instrument

Pivovarov, A., Gu, C., Stevie, F., & Griffis, D. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 781–785.

By: A. Pivovarov n, C. Gu n, F. Stevie n & D. Griffis n

co-author countries: United States of America 🇺🇸
author keywords: charge neutralization; electron gun; negative secondary ions; magnetic sector
Source: Web Of Science
Added: August 6, 2018

2003 journal article

Diffusion of 18 elements implanted into thermally grown SiO2

JOURNAL OF APPLIED PHYSICS, 94(12), 7433–7439.

By: H. Francois-Saint-Cyr*, F. Stevie n, J. McKinley, K. Elshot*, L. Chow* & K. Richardson*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2003 journal article

Optimization of secondary ion mass spectrometry detection limit for N in SiC

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 21(5), 1649–1654.

By: A. Pivovarov n, F. Stevie n, D. Griffis n & G. Guryanov*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

In-fab techniques for baselining implant dose, contamination

Solid State Technology, 45(8), 63-.

By: R. Santiesteban, J. McKinley, F. Stevie, P. Flatch & O. Rodriguez

Source: NC State University Libraries
Added: August 6, 2018

2002 article

Secondary ion mass spectrometry induced damage adjacent to analysis craters in silicon

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 20, pp. 1663–1666.

By: M. Clark*, K. Jones* & F. Stevie n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Utilizing the SIMS technique in the study of grain boundary diffusion along twist grain boundaries in the Cu(Ni) system

ACTA MATERIALIA, 50(20), 5079–5084.

By: S. Schwarz*, B. Kempshall*, L. Giannuzzi* & F. Stevie n

co-author countries: United States of America 🇺🇸
author keywords: SIMS; grain boundary diffusion; Cu(Ni); twist grain boundaries
Source: Web Of Science
Added: August 6, 2018

2002 journal article

XPS analysis of FIB-milled Si

SURFACE AND INTERFACE ANALYSIS, 33(12), 907–913.

By: A. Ferryman*, J. Fulghum*, L. Giannuzzi* & F. Stevie n

co-author countries: United States of America 🇺🇸
author keywords: XPS; FIB; Si; surface oxidation; Ga contamination; spectra-from-images
Source: Web Of Science
Added: August 6, 2018

Citation Index includes data from a number of different sources. If you have questions about the sources of data in the Citation Index or need a set of data which is free to re-distribute, please contact us.

Certain data included herein are derived from the Web of Science© and InCites© (2024) of Clarivate Analytics. All rights reserved. You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.