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2018 conference paper
An accurate calorimetric method for measurement of switching losses in silicon carbide (SiC) MOSFETs
Thirty-third annual ieee applied power electronics conference and exposition (apec 2018), 1695–1700.
By: A. Anurag, S. Acharya, Y. Prabowo, G. Gohil, H. Kassa & S. Bhattacharya