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2018 conference paper
An accurate calorimetric method for measurement of switching losses in silicon carbide (SiC) MOSFETs
Thirty-third annual ieee applied power electronics conference and exposition (apec 2018), 2018-March, 1695–1700.
Contributors: A. Anurag n , S. Acharya n , Y. Prabowo n, G. Gohil *, n & S. Bhattacharya n
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