Hulgize A Kassa

Works (1)

Updated: April 5th, 2024 11:02

2018 conference paper

An accurate calorimetric method for measurement of switching losses in silicon carbide (SiC) MOSFETs

An accurate calorimetrie method for measurement of switching losses in silicon carbide (SiC) MOSFETs. Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC, 2018-March, 1695–1700.

By: A. Anurag n , S. Acharya n , Y. Prabowo n, G. Gohil *, H. Kassa n & S. Bhattacharya n 

Contributors: A. Anurag n , S. Acharya n , Y. Prabowo n, G. Gohil *, H. Kassa n & S. Bhattacharya n 

topics (OpenAlex): Silicon Carbide Semiconductor Technologies; Semiconductor materials and devices; Multilevel Inverters and Converters
Sources: NC State University Libraries, NC State University Libraries, ORCID
Added: August 6, 2018

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