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System-Level Common-Mode EMI Analysis for Drive Applications Using Unterminated Behavioral EMI Models
2021 THIRTY-SIXTH ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC 2021).
By: H. Pulakhandam & S. Bhattacharya
2017 conference paper
Design considerations and test setup assessment for power hardware in the loop testing
2017 ieee industry applications society annual meeting.
By: M. Kashani, H. Pulakhandam, S. Bhattacharya, F. Katiraei & D. Kaiser