2021 article

System-Level Common-Mode EMI Analysis for Drive Applications Using Unterminated Behavioral EMI Models

2021 THIRTY-SIXTH ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC 2021).

By: H. Pulakhandam & S. Bhattacharya

Source: Web Of Science
Added: September 20, 2021

2017 conference paper

Design considerations and test setup assessment for power hardware in the loop testing

2017 ieee industry applications society annual meeting.

By: M. Kashani, H. Pulakhandam, S. Bhattacharya, F. Katiraei & D. Kaiser

Source: NC State University Libraries
Added: August 6, 2018