Hanhan Zhou

Works (10)

Updated: April 11th, 2023 10:13
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2021 journal article

Residual Stress and Ferroelastic Domain Reorientation in Declamped {001} Pb(Zr0.3Ti0.7)O-3 Films

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 68(2), 259–272.

By: L. Denis-Rotella, G. Esteves, J. Walker *, H. Zhou, J. Jones & S. Trolier-McKinstry *

author keywords: Films; Substrates; Residual stresses; Permittivity; X-ray diffraction; Silicon; Electrodes; Domain wall motion; residual stress; substrate clamping; thin films; X-ray diffraction (XRD)
Source: Web Of Science
Added: March 15, 2021

2019 journal article

Dual-source evaporation of silver bismuth iodide films for planar junction solar cells

Journal of Materials Chemistry A, 7(5), 2095–2105.

By: M. Khazaee*, K. Sardashti*, C. Chung, J. Sun*, H. Zhou, E. Bergmann*, W. Dunlap-Shohl *, Q. Han* ...

Sources: Web Of Science, Crossref
Added: February 18, 2019

2018 journal article

A versatile thin-film deposition method for multidimensional semiconducting bismuth halides

Chemistry of Materials, 30(10), 3538–3544.

By: M. Khazaee*, K. Sardashti*, J. Sun*, H. Zhou, C. Clegg*, I. Hill*, J. Jones, D. Lupascu*, D. Mitzi*

Source: NC State University Libraries
Added: August 6, 2018

2018 journal article

Comparison of the in- and across-plane ionic conductivity of highly oriented neodymium doped ceria thin films

ACTA MATERIALIA, 147, 10–15.

By: G. Baure*, H. Zhou, C. Chung, M. Buck*, M. Stozhkova*, J. Jones, J. Nino*

author keywords: Epitaxial growth; Grain boundaries; Doped ceria; Impedance spectroscopy; Thin films
Source: Web Of Science
Added: August 6, 2018

2018 journal article

Deconvolved intrinsic and extrinsic contributions to electrostrain in high performance, Nb-doped Pb(ZrxTi1-x)O-3 piezoceramics (0.50 <= x <= 0.56)

ACTA MATERIALIA, 158, 369–380.

By: C. Zhao, D. Hou, C. Chung, H. Zhou, A. Kynast*, E. Hennig*, W. Liu*, S. Li*, J. Jones

Source: Web Of Science
Added: October 16, 2018

2018 journal article

Radiation-induced changes of vacancy-type defects in ferroelectric capacitors as revealed by Doppler broadening positron annihilation spectroscopy

JOURNAL OF APPLIED PHYSICS, 124(24).

By: H. Zhou, M. Liu, S. Williams*, L. Griffin *, C. Cress *, M. Rivas*, R. Rudy*, R. Polcawich* ...

Source: Web Of Science
Added: January 14, 2019

2017 journal article

Effect of microstructure on irradiated ferroelectric thin films

Journal of Applied Physics, 121(24).

By: S. Brewer, H. Zhou, S. Williams, R. Rudy, M. Rivas, R. Polcawich, C. Cress, E. Glaser ...

Source: NC State University Libraries
Added: August 6, 2018

2017 journal article

Grain orientation effects on the ionic conductivity of neodymia doped ceria thin films

ACTA MATERIALIA, 133, 81–89.

By: G. Baure*, H. Zhou, C. Chung, M. Stozhkova*, J. Jones & J. Nino*

author keywords: Transmission Kikuchi diffraction; Grain boundaries; Doped ceria; Impedance spectroscopy; Thin films
Source: Web Of Science
Added: August 6, 2018

2017 journal article

Phenomenological model for defect interactions in irradiated functional materials

Scientific Reports, 7.

By: S. Brewer, C. Cress, S. Williams, H. Zhou, M. Rivas, R. Rudy, R. Polcawich, E. Glaser, J. Jones, N. Bassiri-Gharb

Source: NC State University Libraries
Added: August 6, 2018

2017 journal article

Temperature-induced local and average structural changes in BaTiO3-xBi(Zn1/2Ti1/2)O-3 solid solutions: The origin of high temperature dielectric permittivity

Journal of Applied Physics, 122(6).

By: D. Hou, T. Usher, H. Zhou, N. Raengthon, N. Triamnak, D. Cann, J. Forrester, J. Jones

Source: NC State University Libraries
Added: August 6, 2018