Jacob Jones

Effect of Pt3Pb on the permittivity and conductivity of lead zirconate titanate thin films

THIN SOLID FILMS, 685, 420–427.

Effect of furnace annealing on the ferroelectricity of Hf0.5 Zr0.5O2 thin films

THIN SOLID FILMS, 677, 142–149.

Electrical fatigue failure in (Na1/2Bi1/2)TiO3-BaTiO3 relaxor ceramics

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 102(10), 5997–6007.

Electrocaloric fatigue of lead magnesium niobate mediated by an electric-field-induced phase transformation

ACTA MATERIALIA, 169, 275–283.

Enhancing thermoelectric properties of NaCo2O4 ceramics through Na pre-treatment induced nano-decoration

JOURNAL OF ALLOYS AND COMPOUNDS, 788, 91–101.

Giant dielectric phenomenon of Ba0.5Sr0.5TiO3/CaCu3Ti4O12 multilayers due to interfacial polarization for capacitor applications

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 39(4), 1116–1121.

Texture and phase variation of ALD PbTiO3 films crystallized by rapid thermal anneal

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 37(2).

Total scattering and diffraction studies of lead-free piezoelectric (1-x) Ba(Zr0.2Ti0.8)O-3-x(Ba0.7Ca0.3)TiO3 deconvolute intrinsic and extrinsic contributions to electromechanical strain

ACTA MATERIALIA, 171, 79–91.

Understanding the lithium deficient LixNiyMnzCo1-y-zO2 (x < 1) cathode materials structure

Understanding the lithium deficient LixNiyMnzCo1-y-zO2 (x < 1) cathode materials structure. MATERIALS CHEMISTRY AND PHYSICS, 228, 32–36.

Comparison of the in- and across-plane ionic conductivity of highly oriented neodymium doped ceria thin films

Acta Materialia, 147, 10–15.

Deconvolved intrinsic and extrinsic contributions to electrostrain in high performance, Nb-doped Pb(ZrxTi1-x)O-3 piezoceramics (0.50 <= x <= 0.56)

ACTA MATERIALIA, 158, 369–380.

Dielectric and piezoelectric properties of 0.7 Pb(Mg1/3Nb2/3)O-3-0.3 PbTiO3 single crystal poled using alternating current

MATERIALS RESEARCH LETTERS, 6(10), 537–544.

Effect of annealing ferroelectric HfO2 thin films: in situ, high temperature x-ray diffraction

Advanced Electronic Materials, 4(7).

Effect of mechanical depoling on piezoelectric properties of Na0.5Bi0.5TiO3-xBaTiO(3) in the morphotropic phase boundary region

Journal of Materials Science, 53(3), 1672–1679.

Field induced metastable ferroelectric phase in Pb0.97La0.03(Zr0.90Ti0.10)(Zr0.90Ti0.10)(0.9925)O-3 ceramics

Journal of the European Ceramic Society, 38(4), 1479–1487.

Field-induced polarization rotation and phase transitions in 0.70Pb(Mg1/3Nb2/3)O-3-0.30PbTiO(3) piezoceramics observed by in situ high-energy x-ray scattering

Physical Review B, 97(21).

Lanthanum-doped hafnium oxide: A robust ferroelectric material

Inorganic Chemistry, 57(5), 2752–2765.

Local structures of perovskite dielectrics and ferroelectrics via pair distribution function analyses

Journal of the European Ceramic Society, 38(4), 971–987.

Multiscale field-induced structure of (1-x)Pb(Mg1/3Nb2/3)O-3-xPbTiO(3) ceramics from combined techniques

Acta Materialia, 154, 14–24.

Origin of temperature-dependent ferroelectricity in Si-Doped HfO2

Advanced Electronic Materials, 4(4).

Patterned nano-domains in PMN-PT single crystals

Acta Materialia, 143, 166–173.

Polarization Mechanisms in P(VDF-TrFE) Ferroelectric Thin Films

PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 12(10).

Radiation-induced changes of vacancy-type defects in ferroelectric capacitors as revealed by Doppler broadening positron annihilation spectroscopy

JOURNAL OF APPLIED PHYSICS, 124(24).

Thickness dependent response of domain wall motion in declamped {001} Pb(Zr0.3Ti0.7)O(3 )thin films

Acta Materialia, 151, 243–252.

Time-of-flight neutron total scattering with applied electric fields: Ex situ and in situ studies of ferroelectric materials

REVIEW OF SCIENTIFIC INSTRUMENTS, 89(9).

Unexpectedly high piezoelectricity of Sm-doped lead zirconate titanate in the Curie point region

Scientific Reports, 8.

A versatile thin-film deposition method for multidimensional semiconducting bismuth halides

Chemistry of Materials, 30(10), 3538–3544.

A Bayesian approach to modeling diffraction profiles and application to ferroelectric materials

Journal of Applied Crystallography, 50, 211–220.

Declamped Piezoelectric Coefficients in patterned 70/30 lead magnesium niobate-lead titanate thin films

Advanced Functional Materials, 27(9).

Doped Hf0.5Zr0.5O2 for high efficiency integrated supercapacitors

Applied Physics Letters, 110(23).

Effect of microstructure on irradiated ferroelectric thin films

Journal of Applied Physics, 121(24).

Electric field dependent local structure of (KxNa1-x)(0.5)Bi0.5TiO3

Physical Review B, 96(1).

Electric-field-induced structural changes in multilayer piezoelectric actuators during electrical and mechanical loading

Acta Materialia, 132, 96–105.

Enhanced ferroelectric polarization in epitaxial (Pb1-xLax)(Zr0.52Ti0.48)O-3 thin films due to low La doping

Physical Review B, 95(17).

External-field-induced crystal structure and domain texture in (1-x) Na0.5Bi0.5TiO3-xK(0.5)Bi(0.5)TiO(3) piezoceramics

Acta Materialia, 127, 319–331.

Extrinsic contributions to piezoelectric Rayleigh behavior in morphotropic PbTiO3 - SiScO3

Acta Materialia, 137, 45–53.

Factors favoring ferroelectricity in Hafnia: a first-principles computational study

Journal of Physical Chemistry. C, 121(8), 4139–4145.

Few-layered metallic 1T-MoS2/TiO2 with exposed (001) facets: two-dimensional nanocomposites for enhanced photocatalytic activities

Physical Chemistry Chemical Physics, 19(41), 28207–28215.

Field-induced antiferroelectric to ferroelectric transitions in (Pb1-xLax)(Zr0.90Ti0.10)(1-x)/O-4(3) investigated by in situ X-ray diffraction

Journal of the European Ceramic Society, 37(15), 4631–4636.

Flexible inorganic ferroelectric thin films for nonvolatile memory devices

Advanced Functional Materials, 27(21).

Flexoelectric characterization of BaTiO3-0.08Bi(Zn1/2Ti1/2)O-3

Applied Physics Letters, 110(22).

Formation of sodium bismuth titanatebarium titanate during solid-state synthesis

Journal of the American Ceramic Society, 100(4), 1330–1338.

Grain orientation effects on the ionic conductivity of neodymia doped ceria thin films

Acta Materialia, 133, 81–89.

Investigating Pb diffusion across buried interfaces in Pb(Zr0.2Ti0.8)O-3 thin films via time-of-flight secondary ion mass spectrometry depth profiling

Surface and Interface Analysis, 49(10), 973–977.

Local structural behavior of PbZr0.5Ti0.5O3 during electric field application via in situ pair distribution function study

Journal of Applied Physics, 122(17).

Low temperature dielectric relaxation in ordinary perovskite ferroelectrics: Enlightenment from high-energy x-ray diffraction

Journal of Physics. D, Applied Physics, 50(20).

Phenomenological model for defect interactions in irradiated functional materials

Scientific Reports, 7.

Si doped hafnium oxide-a "fragile" ferroelectric system

Advanced Electronic Materials, 3(10).

Temperature dependence of field-responsive mechanisms in lead zirconate titanate

Journal of the American Ceramic Society, 100(9), 4352–4361.

Temperature-induced local and average structural changes in BaTiO3-xBi(Zn1/2Ti1/2)O-3 solid solutions: The origin of high temperature dielectric permittivity

Journal of Applied Physics, 122(6).

Thickness-dependent domain wall reorientation in 70/30 lead magnesium niobate- lead titanate thin films

Journal of the American Ceramic Society, 100(9), 3961–3972.

Time and frequency-dependence of the electric field-induced phase transition in BaTiO3-BiZn1/2Ti1/2O3

Journal of Applied Physics, 122(6).

Total ionizing dose effects on piezoelectric thin-film cantilevers with oxide electrodes

IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control, 64(7), 1135–1143.

A comprehensive study on the structural evolution of HfO2 thin films doped with various dopants

Journal of Materials Chemistry C, 5(19), 4677–4690.

The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs)

Semiconductor Science and Technology.

Accelerated thermal decomposition of graphene oxide films in air via in situ x-ray diffraction analysis

Journal of Physical Chemistry. C, 120(27), 14984–14990.

Anomalous reduction in domain wall displacement at the morphotropic phase boundary of the piezoelectric alloy system PbTiO3-BiScO3

Physical Review B, 93(10).

Composition dependence of electric-field-induced structure of Bi-1/2(Na1-xKx)(1/2)TiO3 lead-free piezoelectric ceramics

Journal of Applied Physics, 119(23).

Coupled domain wall motion, lattice strain and phase transformation in morphotropic phase boundary composition of PbTiO3-BiScO3 piezoelectric ceramic

Journal of Applied Physics, 120(15).

CuNb1-xTaxO3 (x <= 0.25) solid solutions: impact of Ta(V) substitution and Cu(I) deficiency on their structure, photocatalytic, and photoelectrochemical properties

Journal of Materials Chemistry A, 4(8), 3115–3126.

Current understanding of structure-processing-property relationships in BaTiO3-Bi(M)O-3 dielectrics

Journal of the American Ceramic Society, 99(9), 2849–2870.

Diffusion across M/Pb(Zr,Ti)O-3 interfaces (M=Pt3Pb or Pt) under different system conditions

Journal of the American Ceramic Society, 99(1), 356–362.

Domain wall and interphase boundary motion in (1-x)Bi(Mg0.5Ti0.5)O-3-xPbTiO(3) near the morphotropic phase boundary

Journal of Applied Physics, 120(4).

Effect of high cobalt concentration on hopping motion in cobalt manganese spinel oxide (CoxMn3-xO4, x >= 2.3)

Effect of high cobalt concentration on hopping motion in cobalt manganese spinel oxide (CoxMn3-xO4, x >= 2.3). Journal of Physical Chemistry. C, 120(25), 13667–13674.

Effect of mechanical constraint on domain reorientation in predominantly {111}-textured lead zirconate titanate films

Journal of the American Ceramic Society, 99(5), 1802–1807.

Effect of top electrode material on radiation-induced degradation of ferroelectric thin film structures

Journal of Applied Physics, 120(2).

Extensive domain wall contribution to strain in a (K,Na)NbO3-based lead-free piezoceramics quantified from high energy X-ray diffraction

Journal of the European Ceramic Society, 36(10), 2489–2494.

Extrinsic response enhancement at the polymorphic phase boundary in piezoelectric materials

Applied Physics Letters, 108(14).

In situ X-ray diffraction of lead zirconate titanate piezoMEMS cantilever during actuation

Materials & Design, 111, 429–434.

Local and average structures of BaTiO3-Bi(Zn1/2Ti1/2)O-3

Journal of Applied Physics, 120(18).

Local structure in BaTiO3-BiScO3 dipole glasses

Physical Review B, 93(10).

Role of composition and structure on the properties of metal/multifunctional ceramic interfaces

Journal of Applied Physics, 120(4).

Scaling effects in perovskite ferroelectrics: Fundamental limits and process-structure-property relations

Journal of the American Ceramic Society, 99(8), 2537–2557.

Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics

Scientific Reports, 6.

Single- and double-site substitutions in mixed-metal oxides: Adjusting the band edges toward the water redox couples

Journal of Physical Chemistry. C, 120(34), 19175–19188.

Ultrafast method for selective design of graphene quantum dots with highly efficient blue emission

Scientific Reports, 6.

Use of Bayesian inference in crystallographic structure refinement via full diffraction profile analysis

Scientific Reports, 6.

Accurate nanoscale crystallography in real-space using scanning transmission electron microscopy

Microscopy and Microanalysis, 21(4), 946–952.

Breaking of macroscopic centric symmetry in paraelectric phases of ferroelectric materials and implications for flexoelectricity

Nature Materials, 14(2), 224–229.

Combined experimental and computational methods reveal the evolution of buried interfaces during synthesis of ferroelectric thin films

Advanced Materials Interfaces, 2(10).

Electric field-induced phase transitions in Li-modified Na0.5K0.5NbO3 at the polymorphic phase boundary

Journal of Applied Physics, 117(2).

Electric-field-induced local and mesoscale structural changes in polycrystalline dielectrics and ferroelectrics

Scientific Reports, 5.

Entropy-stabilized oxides

Nature Communications, 6.

Ferroelectric/ferroelastic domain wall motion in dense and porous tetragonal lead zirconate titanate films

IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control, 62(1), 46–55.

Field induced domain switching as the origin of anomalous lattice strain along non-polar direction in rhombohedral BiScO3-PbTiO3 close to the morphotropic phase boundary

Applied Physics Letters, 107(5).

In situ characterization of polycrystalline ferroelectrics using x-ray and neutron diffraction

Journal of Materials Research.

In situ measurement of increased ferroelectric/ferroelastic domain wall motion in declamped tetragonal lead zirconate titanate thin films

Journal of Applied Physics, 117(5).

Mixed Al and Si doping in ferroelectric HfO2 thin films

Applied Physics Letters, 107(24).

Pressure-induced structures of Si-doped HfO2

Journal of Applied Physics, 117(23).

Processing and crystallographic structure of non-equilibrium Si-doped HfO2

Journal of Applied Physics, 117(24).

Quantification of crystalline texture in ferroelectric materials by polarized Raman spectroscopy using Reverse Monte Carlo modelling

Journal of the European Ceramic Society, 35(15), 4321–4325.

Role of the PbTiO3 seed layer on the crystallization behavior of PZT thin films

Journal of the American Ceramic Society, 98(5), 1407–1412.

Structure of 3 at.% and 9 at.% Si-doped HfO2 from combined refinement of X-ray and neutron diffraction patterns

Journal of Alloys and Compounds, 646, 655–661.

Unusual structural-disorder stability of mechanochemically derived-Pb(Sc0.5Nb0.5)O-3

Journal of Materials Chemistry C, 3(39), 10309–10315.

Anisotropy in magnetoelectric composites

Applied Physics Letters, 104(24).

BiFeO3 ceramics: Processing, electrical, and electromechanical properties

Journal of the American Ceramic Society, 97(7), 1993–2011.

Crystal structure of Si-doped HfO2

Journal of Applied Physics, 115(3).

Crystallographic changes in lead zirconate titanate due to neutron irradiation

AIP Advances, 4(11).

Domain wall displacement is the origin of superior permittivity and piezoelectricity in BaTiO 3 at intermediate grain sizes

Advanced Functional Materials, 24(7), 885–896.

Domain wall motion and electromechanical strain in lead-free piezoelectrics: Insight from the model system (1-x)Ba(Zr0.2Ti0.8)O-3-x(Ba0.7Ca0.3)TiO3 using in situ high-energy X-ray diffraction during application of electric fields

Journal of Applied Physics, 115(14).

Ergodicity reflected in macroscopic and microscopic field-dependent behavior of BNT-based relaxors

Journal of Applied Physics, 115(8).

Extensive domain wall motion and deaging resistance in morphotropic 0.55Bi(Ni1/2Ti1/2)O-3-0.45PbTiO(3) polycrystalline ferroelectrics

Applied Physics Letters, 104(13).

Ferroelectric phenomena in Si-doped HfO2 thin films with TiN and Ir electrodes

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 32(3).

Measurement and analysis of field-induced crystallographic texture using curved position-sensitive diffraction detectors

Journal of Electroceramics, 32(4), 283–291.

Phase and texture evolution in chemically derived PZT thin films on pt substrates

Journal of the American Ceramic Society, 97(9), 2973–2979.

Piezoelectric K0.5Na0.5NbO3 ceramics textured using needlelike K0.5Na0.5NbO3 templates

Journal of the American Ceramic Society, 97(12), 3818–3825.

Rayleigh analysis of dielectric properties in textured K0.5Na0.5NbO3 ceramics

Journal of Applied Physics, 116(21).

Special quasirandom structures to study the (K0.5Na0.5)NbO3 random alloy

Physical Review. B, Condensed Matter and Materials Physics, 90(2).

Structure and ferroelectricity of nonstoichiometric (Na0.5Bi0.5)TiO3

Applied Physics Letters, 104(11).

Texture analysis of thick bismuth ferrite lead titanate layers

In 2014 Joint IEEE International Symposium on the Applications of Ferroelectrics, International Workshop on Acoustic Transduction Materials and Devices & Workshop on Piezoresponse Force Microscopy (ISAF/IWATMD/PFM) (pp. 166–168).

Thermally-induced loss of piezoelectricity in ferroelectric Na0.5Bi0.5TiO3-BaTiO3

Materials Letters, 115, 132–135.

Two-step polarization reversal in biased ferroelectrics

Journal of Applied Physics, 115(22).

The effects of layering in ferroelectric Si-doped HfO2 thin films

Applied Physics Letters, 105(7).