2010 article

Titanium silicide islands on atomically clean Si(100): Identifying single electron tunneling effects

Tedesco, J. L., Rowe, J. E., & Nemanich, R. J. (2010, June 15). Journal of Applied Physics.

By: J. Tedesco n, J. Rowe n & R. Nemanich*

topics (OpenAlex): Semiconductor materials and interfaces; Surface and Thin Film Phenomena; Semiconductor materials and devices
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Source: Web Of Science
Added: August 6, 2018

2009 article

Conducting atomic force microscopy studies of nanoscale cobalt silicide Schottky barriers on Si(111) and Si(100)

Tedesco, J. L., Rowe, J. E., & Nemanich, R. J. (2009, April 15). Journal of Applied Physics.

By: J. Tedesco n, J. Rowe n & R. Nemanich*

author keywords: annealing; atomic force microscopy; cobalt compounds; elemental semiconductors; Fermi level; impurities; island structure; nanostructured materials; Schottky barriers; silicon; thermionic emission; thin films
topics (OpenAlex): Semiconductor materials and interfaces; Integrated Circuits and Semiconductor Failure Analysis; Semiconductor materials and devices; Silicon and Solar Cell Technologies
Source: Web Of Science
Added: August 6, 2018

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