Mustafa Berke Yelten

Works (7)

Updated: July 5th, 2023 15:46
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2013 article

Variation-Aware Circuit Macromodeling and Design Based on Surrogate Models

SIMULATION AND MODELING METHODOLOGIES, TECHNOLOGIES AND APPLICATIONS, Vol. 197, pp. 255–269.

By: T. Zhu n, M. Yelten n, M. Steer n & P. Franzon n 

author keywords: Surrogate Modeling; Macromodel; Variation-Aware; Circuit; Device Model; Design Exploration; IO Buffer
Sources: Web Of Science, ORCID
Added: August 6, 2018

2012 journal article

Analog Negative-Bias-Temperature-Instability Monitoring Circuit

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 12(1), 177–179.

By: M. Yelten n, P. Franzon n  & M. Steer n

author keywords: Amplifier; analog circuits; negative-bias temperature instability (NBTI); reliability; sensor
Sources: Web Of Science, ORCID
Added: August 6, 2018

2012 journal article

Comparison of modeling techniques in circuit variability analysis

INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, 25(3), 288–302.

By: M. Yelten n, P. Franzon n  & M. Steer n

author keywords: artificial neural network; digital circuit; drain current; Kriging; least-squares support vector machine; surrogate modeling; variability Analysis; XOR
Sources: Web Of Science, ORCID
Added: August 6, 2018

2012 conference paper

Process mismatch analysis based on reduced-order models

2012 13th international symposium on quality electronic design (isqed), 648–655.

By: M. Yelten n, P. Franzon n  & M. Steer n

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2009 conference paper

Theoretical analysis and characterization of the tunable matching networks in low noise amplifiers

2009 European Conference on Circuit Theory and Design, vols 1 and 2, 890–893.

By: M. Yelten & K. Gard

Source: NC State University Libraries
Added: August 6, 2018

journal article

Surrogate-model-based analysis of analog circuits-part I: Variability analysis

Yelten, M. B., Franzon, P. D., & Steer, M. B. IEEE Transactions on Device and Materials Reliability, 11(3), 466–473.

By: M. Yelten, P. Franzon  & M. Steer

Source: NC State University Libraries
Added: August 6, 2018

journal article

Surrogate-model-based analysis of analog circuits-part II: Reliability analysis

Yelten, M. B., Franzon, P. D., & Steer, M. B. IEEE Transactions on Device and Materials Reliability, 11(3), 458–465.

By: M. Yelten, P. Franzon  & M. Steer

Source: NC State University Libraries
Added: August 6, 2018