Matthew Miller

Miller, M. J., Cabral, M. J., Dickey, E. C., LeBeau, J. M., & Reich, B. J. (2021, April 28). Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials. TECHNOMETRICS, Vol. 4. https://doi.org/10.1080/00401706.2021.1905070