Characterization and Analysis of RF Switches in SOI Technology for ESD Protection
2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS).
By: J. Liu, N. Carels & N. Peachey*
author keywords: RF Switch; Silicon on Insulator (SOI); Electrostatic Discharge (ESD); Self-Protection; Transmission Line Pulse (TLP)
Source: Web Of Science
Added: February 27, 2023
