2015 journal article

Reuse-based optimization for prebond and post-bond testing of 3-D-stacked ICS

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 34(1), 122–135.

By: M. Agrawal, K. Chakrabarty & R. Widialaksono

Source: NC State University Libraries
Added: August 6, 2018