Steven R. Novak

Lee, B., Lichtenwalner, D. J., Novak, S. R., & Misra, V. (2011). Impact of AlTaO Dielectric Capping on Device Performance and Reliability for Advanced Metal Gate/High-k PMOS Application. IEEE TRANSACTIONS ON ELECTRON DEVICES, 58(9), 2928–2935. https://doi.org/10.1109/ted.2011.2160064

Lee, B., Novak, S. R., Lichtenwalner, D. J., Yang, X., & Misra, V. (2011). Investigation of the Origin of V-T/V-FB Modulation by La2O3 Capping Layer Approaches for NMOS Application: Role of La Diffusion, Effect of Host High-k Layer, and Interface Properties. IEEE TRANSACTIONS ON ELECTRON DEVICES, 58(9), 3106–3115. https://doi.org/10.1109/ted.2011.2159306

Novak, S., Lee, B., Yang, X., & Misra, V. (2010). Platinum Nanoparticles Grown by Atomic Layer Deposition for Charge Storage Memory Applications. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 157(6), H589–H592. https://doi.org/10.1149/1.3365031

Suresh, A., Novak, S., Wellenius, P., Misra, V., & Muth, J. F. (2009). Transparent indium gallium zinc oxide transistor based floating gate memory with platinum nanoparticles in the gate dielectric. APPLIED PHYSICS LETTERS, 94(12). https://doi.org/10.1063/1.3106629

Lee, B., Biswas, N., Novak, S. R., & Misra, V. (2007). Characteristics of Ni/Gd FUSI for NMOS gate electrode applications. IEEE ELECTRON DEVICE LETTERS, 28(7), 555–557. https://doi.org/10.1109/LED.2007.897889