Thanakorn Iamsasri

Jones, J. L., Broughton, R., Iamsasri, T., Fancher, C. M., Wilson, A. G., Reich, B., & Smith, R. C. (2019). The use of Bayesian inference in the characterization of materials and thin films. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, Vol. 75, pp. A211–A211. https://doi.org/10.1107/S0108767319097940

Iamsasri, T., Guerrier, J., Esteves, G., Fancher, C. M., Wilson, A. G., Smith, R. C., … Jones, J. L. (2017). A Bayesian approach to modeling diffraction profiles and application to ferroelectric materials. Journal of Applied Crystallography, 50, 211–220.

Iamsasri, T., Esteves, G., Choe, H., Vogt, M., Prasertpalichat, S., Cann, D. P., … Jones, J. L. (2017). Time and frequency-dependence of the electric field-induced phase transition in BaTiO3-BiZn1/2Ti1/2O3. Journal of Applied Physics, 122(6).

Ochoa, D. A., Esteves, G., Iamsasri, T., Rubio-Marcos, F., Fernandez, J. F., Garcia, J. E., & Jones, J. L. (2016). Extensive domain wall contribution to strain in a (K,Na)NbO3-based lead-free piezoceramics quantified from high energy X-ray diffraction. JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 36(10), 2489–2494. https://doi.org/10.1016/j.jeurceramsoc.2016.03.022

Usher, T. M., Iamsasri, T., Forrester, J. S., Raengthon, N., Triamnak, N., Cann, D. P., & Jones, J. L. (2016). Local and average structures of BaTiO3-Bi(Zn1/2Ti1/2)O-3. Journal of Applied Physics, 120(18).

Gorfman, S., Simons, H., Iamsasri, T., Prasertpalichat, S., Cann, D. P., Choe, H., … Jones, J. L. (2016). Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics. Scientific Reports, 6.

Iamsasri, T., Tutuncu, G., Uthaisar, C., Wongsaenmai, S., Pojprapai, S., & Jones, J. L. (2015). Electric field-induced phase transitions in Li-modified Na0.5K0.5NbO3 at the polymorphic phase boundary. Journal of Applied Physics, 117(2).

Zhao, L., Hou, D., Usher, T.-M., Iamsasri, T., Fancher, C. M., Forrester, J. S., … Jones, J. L. (2015). Structure of 3 at.% and 9 at.% Si-doped HfO2 from combined refinement of X-ray and neutron diffraction patterns. JOURNAL OF ALLOYS AND COMPOUNDS, 646, 655–661. https://doi.org/10.1016/j.jallcom.2015.06.084

Zhao, L. L., Nelson, M., Aldridge, H., Iamsasri, T., Fancher, C. M., Forrester, J. S., … Jones, J. L. (2014). Crystal structure of Si-doped HfO2. Journal of Applied Physics, 115(3).

Carter, J., Aksel, E., Iamsasri, T., Forrester, J. S., Chen, J., & Jones, J. L. (2014). Structure and ferroelectricity of nonstoichiometric (Na0.5Bi0.5)TiO3. Applied Physics Letters, 104(11).