Adaptive and Reliable Clock Distribution Design for 3-D Integrated Circuits
Chen, X., Zhu, T., Davis, W. R., & Franzon, P. (2014, October 20). IEEE Transactions on Components Packaging and Manufacturing Technology, Vol. 4, pp. 1862–1870.
author keywords: 3-D integrated circuit (3-D IC); adaptive; clock distribution; deskew; optimization; process-voltage-temperature (PVT) variation; stacking; thermal profile; through-silicon-via (TSV); tunable-delay-buffer (TDB)
topics (OpenAlex): 3D IC and TSV technologies; VLSI and Analog Circuit Testing; Interconnection Networks and Systems
TL;DR:
A novel active deskew technique to adaptively mitigate the cross-tier variations and the 3-D wiring asymmetry is proposed and a thermal profile-based optimization flow is developed to further improve the power efficiency and reduce design overhead.
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UN Sustainable Development Goal Categories
7. Affordable and Clean Energy
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Sources: Web Of Science, NC State University Libraries