2009 journal article
Investigation of iron impurity gettering at dislocations in a SiGe/Si heterostructure
Journal of Applied Physics, 105(7).
2009 journal article
Proximity gettering of Cu at a (110)/(001) grain boundary interface formed by direct silicon bonding
Applied Physics Letters, 94(22).
2008 journal article
Capacitance transient and current-/capacitance-voltage study of direct silicon bonded (110)/(100) interface
Applied Physics Letters, 92(26).
2008 journal article
Deep-level transient spectroscopy study on direct silicon bonded (110)/(100) interfacial grain boundary
Semiconductor Science and Technology, 23(12).
2008 journal article
Impact of Cu contamination on the electrical properties of a direct silicon bonded (110)/(100) interfacial grain boundary
Journal of Applied Physics, 104(11).
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