Young Hwan Lee

College of Engineering

Works (8)

Updated: July 5th, 2023 15:02
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2022 review

Many routes to ferroelectric HfO2: A review of current deposition methods

[Review of ]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 40(1).

By: H. Hsain  n, Y. Lee n, M. Materano *, T. Mittmann *, A. Payne n, T. Mikolajick *, U. Schroeder *, G. Parsons n , J. Jones n

co-author countries: Germany 🇩🇪 United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: December 13, 2021

2022 article

Role of Oxygen Source on Buried Interfaces in Atomic-Layer- Deposited Ferroelectric Hafnia-Zirconia Thin Films

Hsain, H. A., Lee, Y., Lancaster, S., Materano, M., Alcala, R., Xu, B., … Jones, J. L. (2022, September 7). ACS APPLIED MATERIALS & INTERFACES, Vol. 9.

By: H. Hsain n, Y. Lee n, S. Lancaster *, M. Materano *, R. Alcala *, B. Xu *, T. Mikolajick *, U. Schroeder *, G. Parsons n , J. Jones n

co-author countries: Germany 🇩🇪 United States of America 🇺🇸
author keywords: Hf0; 5Zr0; hafnia; zirconia; ferroelectric; orthorhombic; oxygen; texture
Sources: Web Of Science, ORCID
Added: September 26, 2022

2021 review

Domains and domain dynamics in fluorite-structured ferroelectrics

[Review of ]. APPLIED PHYSICS REVIEWS, 8(2).

By: D. Lee *, Y. Lee n, K. Yang *, J. Park*, S. Kim *, P. Reddy*, M. Materano *, H. Mulaosmanovic * ...

co-author countries: Germany 🇩🇪 Korea (Republic of) 🇰🇷 United States of America 🇺🇸
Source: Web Of Science
Added: June 10, 2021

2021 journal article

Effect of ferroelectric and interface films on the tunneling electroresistance of the Al2O3/Hf0.5Zr0.5O2 based ferroelectric tunnel junctions

NANOTECHNOLOGY, 32(48).

By: A. Shekhawat, H. Hsain, Y. Lee*, J. Jones* & S. Moghaddam

author keywords: ferroelectrics; hafnium oxide; interface engineering; atomic layer deposition; tunnel junctions
Source: Web Of Science
Added: September 20, 2021

2021 journal article

Unexpectedly large remanent polarization of Hf0.5Zr0.5O2 metal-ferroelectric-metal capacitor fabricated without breaking vacuum

APPLIED PHYSICS LETTERS, 118(1).

By: Y. Lee n, H. Hsain  n, S. Fields *, S. Jaszewski *, M. Horgan n, P. Edgington n, J. Ihlefeld *, G. Parsons n , J. Jones n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: February 1, 2021

2020 journal article

A perspective on semiconductor devices based on fluorite-structured ferroelectrics from the materials-device integration perspective

JOURNAL OF APPLIED PHYSICS, 128(24).

By: J. Park*, K. Yang *, D. Lee *, S. Kim *, Y. Lee n, P. Reddy*, J. Jones n, M. Park *

co-author countries: Korea (Republic of) 🇰🇷 United States of America 🇺🇸
Source: Web Of Science
Added: January 25, 2021

2020 journal article

Compositional dependence of crystallization temperatures and phase evolution in hafnia-zirconia (HfxZr1-x)O-2 thin films

APPLIED PHYSICS LETTERS, 116(19).

By: H. Hsain  n, Y. Lee n, G. Parsons n  & J. Jones n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: June 1, 2020

2019 journal article

Approaches for Characterizing Surfaces Damaged by Disinfection in Healthcare

NANO LIFE, 9(4).

By: P. Strader n, Y. Lee n, P. Teska, X. Li & J. Jones n

co-author countries: United States of America 🇺🇸
author keywords: Disinfection; damage; surface; characterization; materials
Source: Web Of Science
Added: December 16, 2019