2018 conference paper

An accurate calorimetric method for measurement of switching losses in silicon carbide (SiC) MOSFETs

Thirty-third annual ieee applied power electronics conference and exposition (apec 2018), 1695–1700.

By: A. Anurag, S. Acharya, Y. Prabowo, G. Gohil, H. Kassa & S. Bhattacharya

Source: NC State University Libraries
Added: August 6, 2018