Yongsheng Xiao

Xiao, Y. S., Retterer, S. T., Thomas, D. K., Tao, J. Y., & He, L. (2009). Impacts of surface morphology on ion desorption and ionization in desorption ionization on porous silicon (DIOS) mass spectrometry. Journal of Physical Chemistry. C, 113(8), 3076–3083. https://doi.org/10.1021/jp808844f