Yongsheng Xiao

Xiao, Y., Retterer, S. T., Thomas, D. K., Tao, J.-Y., & He, L. (2009). Impacts of Surface Morphology on Ion Desorption and Ionization in Desorption Ionization on Porous Silicon (DIOS) Mass Spectrometry. JOURNAL OF PHYSICAL CHEMISTRY C, 113(8), 3076–3083. https://doi.org/10.1021/jp808844f