Yo Han Yoon

Kim, J., Kim, H. S., Choi, J. H., Jeon, H., Yoon, Y., Liu, J., … Braun, P. V. (2014). Epitaxial growth of three-dimensionally mesostructured single-crystalline Cu2O via templ-ated electrodeposition. Chemistry of Materials, 26(24), 7051–7058.

Ratanaphan, S., Yoon, Y., & Rohrer, G. S. (2014). The five parameter grain boundary character distribution of polycrystalline silicon. Journal of Materials Science, 49(14), 4938–4945.

Yoon, Y., Yan, Y. X., Ostrom, N. P., Kim, J., & Rozgonyi, G. (2012). Deep level transient spectroscopy and minority carrier lifetime study on Ga-doped continuous Czochralski silicon. Applied Physics Letters, 101(22).

Yoon, Y., Paudyal, B., Kim, J., Ok, Y. W., Kulshreshtha, P., Johnston, S., & Rozgonyi, G. (2012). Effect of nickel contamination on high carrier lifetime n-type crystalline silicon. Journal of Applied Physics, 111(3).

Yoon, Y., Paudyal, B., Kim, J., Ok, Y. W., Kulshreshtha, P., Johnston, S., & Rozgonyi, G. (2012). Effect of nickel contamination on high carrier lifetime n-type crystalline silicon (vol 111, 033702, 2012). Journal of Applied Physics, Vol. 111.

Kulshreshtha, P. K., Yoon, Y., Youssef, K. M., Good, E. A., & Rozgonyi, G. (2012). Oxygen precipitation related stress-modified crack propagation in high growth rate Czochralski silicon wafers. Journal of the Electrochemical Society, 159(2), H125–129.

Yoon, Y. H., Yi, S. M., Yim, J. R., Lee, J. H., Rozgonyi, G., & Joo, Y. C. (2010). Microstructure and electrical properties of high power laser thermal annealing on inkjet-printed Ag films. Microelectronic Engineering, 87(11), 2230–2233.