Engineering Research

Engineering economic analysis

New York: Oxford University Press.

The North Carolina State University women in science and engineering program: a community for living and learning

American Society for Engineering Education.

Engineering computing as an essential component of inquiry-guided learning

In Teaching and learning through inquiry: A guidebook for institutions and instructors. Sterling, VA: Stylus Publishing.

Utilization of electron impact ionization of gaseous and sputtered species in the secondary ion acceleration region of a magnetic sector SIMS instrument

Pivovarov, A., Gu, C., Stevie, F., & Griffis, D. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 781–785.

Special Issue - Secondary Ion Mass Spectrometry SIMS XIV - Proceedings of the Fourteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics - San Diego, California, USA, September 14-19, 2003 - Preface

Hunter, J., Schueler, B. W., & Stevie, F. A. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 1–2.

O-2(+) versus Cs+ for high depth resolution depth profiling of III-V nitride-based semiconductor devices

Kachan, M., Hunter, J., Kouzminov, D., Pivovarov, A., Gu, J., Stevie, F., & Griffis, D. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 684–687.

Storage-efficient stateless group key revocation

In K. Zhang & Y. Zheng (Eds.), Information security: 7th international conference, ISC 2004, Palo Alto, CA, USA, September 27-29, 2004: Proceedings (Vol. 3225, pp. 25–38).

Novel testing system for evaluating the thermal stability of polyol ester lubricants

INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH, 43(21), 6638–6646.

Improving robustness of PGP keyrings by conflict detection

In Topics in cryptology, CT-RSA 2004 (Vol. 2964, pp. 194–207).

Improved charge neutralization method for depth profiling of bulk insulators using O-2(+) primary beam on a magnetic sector SIMS instrument

Pivovarov, A. L., Stevie, F. A., & Griffis, D. P. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 786–790.

Certificate recommendations to improve the robustness of web of trust

In K. Zhang & Y. Zheng (Eds.), Information security: 7th international conference, ISC 2004, Palo Alto, CA, USA, September 27-29, 2004: Proceedings (Vol. 3225, pp. 292–303).

Secondary ion mass spectrometry backside analysis of barrier layers for copper diffusion

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 22, pp. 350–354.

Diffusion profiles of high dosage Cr and V ions implanted into silicon

JOURNAL OF APPLIED PHYSICS, 96(2), 1053–1058.

Bandwidth provisioning and pricing for networks with multiple classes of service

COMPUTER NETWORKS, 46(1), 41–52.

Quartz crystal microbalance (QCM) in high-pressure carbon dioxide (CO2): Experimental aspects of QCM theory and CO2 adsorption

LANGMUIR, 20(9), 3665–3673.

Capacity planning of DiffServ networks with best-effort and Expedited Forwarding traffic

TELECOMMUNICATION SYSTEMS, 25(3-4), 193–207.

Site-specific SIMS backside analysis

Gu, C., Garcia, R., Pivovarov, A., Stevie, F., & Griffis, D. (2004, June 15). APPLIED SURFACE SCIENCE, Vol. 231, pp. 663–667.