TY - CONF TI - Power Packaging Techniques for Low and Higher Voltage Systems AU - Hopkins, Douglas C. AU - Bowers, John S. T2 - 16th Annual IEEE Conference on Applied Power Electronics Conference and Exposition (APEC) C2 - 2001/3/4/ C3 - 16th Annual IEEE Conference on Applied Power Electronics Conference and Exposition (APEC) CY - Anaheim, CA DA - 2001/3/4/ PY - 2002/3/4/ ER - TY - CONF TI - Update of Process Monitoring and Control Research at NC State University AU - Lemaster, R. AU - Saloni, D. AU - Rodkwan, S. T2 - 15th International Wood Machining Seminar C2 - 2001/// C3 - Proceedings of the 15th International Wood Machining Seminar DA - 2001/// PY - 2001/7/30/ SP - 511–522 ER - TY - CONF TI - Wood fiber-plastic composites: machining and surface quality AU - Buehlmann, U. AU - Saloni, D. AU - Lemaster, R. T2 - 15th International Wood Machining Seminar C2 - 2001/// C3 - Proceedings of the 15th International Wood Machining Seminar CY - Los Angeles, CA DA - 2001/// PY - 2001/7/30/ SP - 403–417 ER - TY - CONF TI - Characterization of Material Properties of Woodfiber-Plastic Composites Exposed to Secondary Manufacturing Processes AU - Buehlmann, U. AU - Saloni, D. AU - Lemaster, R. T2 - Sixth International Conference on Woodfiber-Plastic Composites C2 - 2001/// C3 - Proceedings of the Sixth International Conference on Woodfiber-Plastic Composites CY - Madison, WI DA - 2001/// PY - 2001/5/15/ SP - 239–247 ER - TY - SOUND TI - Compact Nonlinear Capacity Models for Supply Chains AU - Asmundsson, J. AU - Orcun, S. AU - Rardin, R.L. AU - Uzsoy, R. DA - 2001/2// PY - 2001/2// ER - TY - SOUND TI - From Finite Capacity to Supply Chain Management AU - Uzsoy, R. DA - 2001/12// PY - 2001/12// ER - TY - CONF TI - Executing Production Schedules In The Face Of Uncertainties: A Brief Review And Some Future Directions AU - Aytug, H. AU - Lawley, M.A. AU - Mohan, S. AU - Uzsoy, R. T2 - Conference on Industrial Engineering and Production Management C2 - 2001/8// C3 - Proceedings of the Conference on Industrial Engineering and Production Management CY - Quebec City, Quebec, Canada DA - 2001/8// PY - 2001/8// ER - TY - CHAP TI - Advanced Planning and Scheduling for Manufacturing AU - Musselman, K. AU - Uzsoy, R. T2 - Handbook of Industrial Engineering A2 - Salvendy, G. PY - 2001/// PB - John Wiley ER - TY - JOUR TI - Experimental Evaluation of Heuristic Optimization Algorithms: A Tutorial AU - Rardin, Ronald L. AU - Uzsoy, Reha T2 - Journal of Heuristics DA - 2001/5// PY - 2001/5// DO - 10.1023/a:1011319115230 VL - 7 IS - 3 SP - 261–304 SN - 1381-1231 UR - http://dx.doi.org/10.1023/a:1011319115230 KW - heuristic optimization KW - computational experiments ER - TY - JOUR TI - A decision support system for spare parts management in a wafer fabrication facility AU - Akcalt, E. AU - Davis, M. AU - Hamlin, R.D. AU - McCullough, T. AU - Teyner, T. AU - Uzsoy, R. T2 - IEEE Transactions on Semiconductor Manufacturing AB - We present a decision support system for spare parts management in a wafer fabrication facility. The system is based on an analytical stochastic inventory model, which calculates the reorder level and quantity for each part to attain a specified service level. Results from our simulation study indicate that the policies suggested by the system either improve the service level or reduce the operating cost. DA - 2001/// PY - 2001/// DO - 10.1109/66.909657 VL - 14 IS - 1 SP - 76-78 J2 - IEEE Trans. Semicond. Manufact. OP - SN - 0894-6507 UR - http://dx.doi.org/10.1109/66.909657 DB - Crossref ER - TY - JOUR TI - Cycle-time improvements for photolithography process in semiconductor manufacturing AU - Akcalt, E. AU - Nemoto, K. AU - Uzsoy, R. T2 - IEEE Transactions on Semiconductor Manufacturing AB - Cycle-time reduction is of great importance to semiconductor manufacturers. Photolithography, being one of the most repeated processes, is an area where substantial improvements can be made. We investigate the effects of various process control mechanisms for photolithography on the cycle-time at the process and at the overall fab via a simulation study. Test run policy at the photolithography station, test run frequency, duration of inspection, and machine dedication policy for the equipment are the factors we consider. Equipment down time due to preventive or breakdown maintenance and rework rates are also taken into account. Parallel testing, where test wafer is inspected while the lot is being processed, is the best policy in terms of cycle-time performance. Long inspection time and infrequent, long down times have the most adverse effects, but flexible machine assignment may reduce the impact of down times. Test run frequency is only significant for serial testing, where processing of the lot is not finished until the failed test wafer is stripped and reworked. DA - 2001/// PY - 2001/// DO - 10.1109/66.909654 VL - 14 IS - 1 SP - 48-56 J2 - IEEE Trans. Semicond. Manufact. OP - SN - 0894-6507 UR - http://dx.doi.org/10.1109/66.909654 DB - Crossref KW - cycle time KW - dispatching KW - machine dedication KW - photolithography KW - shop-floor control ER - TY - JOUR TI - Finite-capacity production planning algorithms for a semiconductor wafer fabrication facility AU - Horiguchi, K. AU - Raghavan, N. AU - Uzsoy, R AU - Venkateswaran, S. T2 - International Journal of Production Research AB - We consider the problem of production planning for a semiconductor wafer fabrication facility producing application-specific integrated circuits (ASICS) to customer order. Using a simple planning algorithm based on forward scheduling for WIP and backward scheduling for new orders, the effects of the level of detail at which the production process is modelled was examined. A simulation study showed that considering all near-constraint workcentres explicitly as having finite-capacity gives the best results. Also examined were the effects of undercapacity planning, and it was shown that when coupled with a shop-floor scheduling procedure driven by the planned completion date rather than customer due dates, significant improvements in both delivery performance and system predictability were obtained. DA - 2001/1// PY - 2001/1// DO - 10.1080/00207540010010253 VL - 39 IS - 5 SP - 825-842 J2 - International Journal of Production Research LA - en OP - SN - 0020-7543 1366-588X UR - http://dx.doi.org/10.1080/00207540010010253 DB - Crossref ER - TY - CHAP TI - Packaging and Smart Power Systems AU - Hopkins, D.C. T2 - Power electronics handbook A2 - Rashid, M.H. PY - 2001/// PB - Academic Press ER - TY - JOUR TI - Determining the value of dedicated multimodal cargo facilities in a multi-region distribution network AU - Warsing, D.P. AU - Souza, G.C. AU - Greis, N.P. T2 - European Journal of Operational Research AB - This paper presents an analytic model of a multi-region distribution problem that addresses the operational benefits of serving a global market using a network of dedicated multimodal cargo facilities (DMCFs). The model allows an explicit evaluation of the comparative value of using a dedicated air cargo-based multimodal distribution facility in an established network of supply and demand points as opposed to more traditional methods for inter-regional shipments. We develop a large-scale, non-linear programming model to evaluate the corresponding logistics costs, incorporating the congestion effects of aircraft loading/unloading on dock-to-dock lead times in the network. We then demonstrate how this difficult problem can be decomposed into its linear (LP) and non-linear (multi-class queueing) sub-problems. An iterative solution scheme is devised to compute the comparative costs of traditional and DMCF-based cargo operations. DA - 2001/// PY - 2001/// DO - 10.1016/S0377-2217(00)00185-5 VL - 133 IS - 1 SP - 81-93 UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0035899609&partnerID=MN8TOARS KW - distribution KW - transportation KW - linear programming KW - queueing ER - TY - JOUR TI - A Statistical Approach to Process Planning AU - Pan, Rong AU - Wysk, Richard A. AU - Chandra, M. Jeya T2 - Journal of Design and Manufacturing Automation AB - Abstract This paper presents a formal method for the process planning of machined components using a statistical methodology that can be used in design to determine the percent defective for feature-based tolerance specifications when used in conjunction with a process planning system or more specifically a process tolerance chart. The paper begins with an approach for process selection and then goes through an illustration of a tolerance specification for hole features under a location specification of Regardless of Feature size. Once a formal process plan has been developed, a probability model is used in conjunction with a process tolerance chart to determine the effects of feature size and location specification on percent defective and product cost. A discussion is presented and the model is expanded to include location specification under Maximum Material Condition and Least Material Condition. DA - 2001/10// PY - 2001/10// DO - 10.1080/15320370108500215 VL - 4 IS - 1 SP - 37-46 J2 - Journal of Design and Manufacturing Automation LA - en OP - SN - 1532-0375 UR - http://dx.doi.org/10.1080/15320370108500215 DB - Crossref ER - TY - PAT TI - Methods and apparatus for rapidly prototyping three-dimensional objects from a plurality of layers AU - Cormier, D. R. AU - Taylor, J. B. AU - West, Harvey A., II C2 - 2001/// DA - 2001/// PY - 2001/// ER -