College of Sciences
Displaying works 81 - 100 of 209 in total
Sorted by most recent date added to the index first, which may not be the same as publication date order.
1998 article
Stability of Si-O-F low-K dielectrics: Attack by water molecules as function of near-neighbor Si-F bonding arrangements
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 16, pp. 1525–1528.
1998 article
Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films
Edwards, N. V., Yoo, S. D., Bremser, M. D., Horton, M. N., Perkins, N. R., Weeks, T. W., … Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 187–192.
1998 article
Real-time optical characterization of GaP heterostructures by p-polarized reflectance
Dietz, N., & Ito, K. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 614–619.
1998 article
Optimization of nitrided gate dielectrics by plasma-assisted and rapid thermal processing
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 16, pp. 1721–1729.
1998 journal article
Lip-lip interactions and the growth of multiwalled carbon nanotubes
Physical Review Letters, 80(2), 313–316.
1998 article
Interface studies of tungsten nitride and titanium nitride composite metal gate electrodes with thin dielectric layers
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 16, pp. 1757–1761.
1998 journal article
Geometry and electronic structure of InP(001)(2 x 4) reconstructions
SURFACE SCIENCE, 409(3), 474–484.
1998 journal article
Electron emission characteristics of GaN pyramid arrays grown via organometallic vapor phase epitaxy
JOURNAL OF APPLIED PHYSICS, 84(9), 5238–5242.
1998 journal article
Depth-dependent spectroscopic defect characterization of the interface between plasma-deposited SiO(2) and silicon
APPLIED PHYSICS LETTERS, 73(6), 791–793.
1998 journal article
Characterization of copper-diamond (100), (111), and (110) interfaces: Electron affinity and Schottky barrier
PHYSICAL REVIEW B, 58(3), 1643–1654.
1998 article
Analysis of optical spectra by Fourier methods
Yoo, S. D., Edwards, N. V., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 143–148.
1998 article
Ultrathin oxide gate dielectrics prepared by low temperature remote plasma-assisted oxidation
Niimi, H., & Lucovsky, G. (1998, January). SURFACE & COATINGS TECHNOLOGY, Vol. 98, pp. 1529–1533.
1998 journal article
Ultrathin nitride/oxide (N/O) gate dielectrics for p(+)-polysilicon gated PMOSFET's prepared by a combined remote plasma enhanced CVD thermal oxidation process
IEEE ELECTRON DEVICE LETTERS, 19(10), 367–369.
1998 journal article
The influence of time stress and location on behavioral warning compliance
SAFETY SCIENCE, 29(2), 143–158.
1998 journal article
Study of SiOx decomposition kinetics and formation of Si nanocrystals in an SiOx matrix
Journal of Non-Crystalline Solids, 230 (part A)(1998 May), 507–512.
1998 journal article
Reaction pathways for intrinsic and extrinsic defect metastability in light-soaked hydrogenated amorphous silicon - the Staebler-Wronski effect
Journal of Non-Crystalline Solids, 230 (part A)(1998 May), 281–286.
1998 journal article
Quadrupole moments and identical superdeformed bands in Tb-149
Physical Review. C, Nuclear Physics, 58(3), 1422–1429.
1998 article
Plasma-engineered Si-SiO2 interfaces: monolayer nitrogen atom incorporation by low-temperature remote plasma-assisted oxidation in N2O
Koh, K., Niimi, H., & Lucovsky, G. (1998, January). SURFACE & COATINGS TECHNOLOGY, Vol. 98, pp. 1524–1528.
1998 journal article
Piezoelectric measurements with atomic force microscopy
APPLIED PHYSICS LETTERS, 73(26), 3851–3853.
1998 journal article
Optical-phonon confinement and scattering in wurtzite heterostructures
PHYSICAL REVIEW B, 58(8), 4860–4865.