Physics

College of Sciences

Works Published in 1998

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Displaying works 81 - 100 of 209 in total

Sorted by most recent date added to the index first, which may not be the same as publication date order.

1998 article

Stability of Si-O-F low-K dielectrics: Attack by water molecules as function of near-neighbor Si-F bonding arrangements

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 16, pp. 1525–1528.

Source: Web Of Science
Added: August 6, 2018

1998 article

Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films

Edwards, N. V., Yoo, S. D., Bremser, M. D., Horton, M. N., Perkins, N. R., Weeks, T. W., … Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 187–192.

By: N. Edwards*, S. Yoo*, M. Bremser*, M. Horton, N. Perkins, T. Weeks*, H. Liu, R. Stall ...

author keywords: GaN; spectroscopic ellipsometry; reflectance; valence bands; excitons; reciprocal space analysis
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Real-time optical characterization of GaP heterostructures by p-polarized reflectance

Dietz, N., & Ito, K. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 614–619.

By: N. Dietz n & K. Ito n

author keywords: p-polarized reflectance spectroscopy; pulsed chemical beam epitaxy; reduced order kinetic model
Source: Web Of Science
Added: August 6, 2018

1998 article

Optimization of nitrided gate dielectrics by plasma-assisted and rapid thermal processing

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 16, pp. 1721–1729.

By: G. Lucovsky n, H. Niimi n, Y. Wu n, C. Parker n & . Hauser n

Source: Web Of Science
Added: August 6, 2018

1998 journal article

Lip-lip interactions and the growth of multiwalled carbon nanotubes

Physical Review Letters, 80(2), 313–316.

By: M. Nardelli n, C. Brabec n, A. Maiti, C. Roland n & J. Bernholc n

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 article

Interface studies of tungsten nitride and titanium nitride composite metal gate electrodes with thin dielectric layers

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 16, pp. 1757–1761.

By: B. Claflin n, M. Binger n & G. Lucovsky n

Source: Web Of Science
Added: August 6, 2018

1998 journal article

Geometry and electronic structure of InP(001)(2 x 4) reconstructions

SURFACE SCIENCE, 409(3), 474–484.

author keywords: density functional calculations; indium phosphide; molecular dynamics; single crystal surfaces (low index single crystal surfaces)
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Electron emission characteristics of GaN pyramid arrays grown via organometallic vapor phase epitaxy

JOURNAL OF APPLIED PHYSICS, 84(9), 5238–5242.

Source: Web Of Science
Added: August 6, 2018

1998 journal article

Depth-dependent spectroscopic defect characterization of the interface between plasma-deposited SiO(2) and silicon

APPLIED PHYSICS LETTERS, 73(6), 791–793.

Source: Web Of Science
Added: August 6, 2018

1998 journal article

Characterization of copper-diamond (100), (111), and (110) interfaces: Electron affinity and Schottky barrier

PHYSICAL REVIEW B, 58(3), 1643–1654.

Source: Web Of Science
Added: August 6, 2018

1998 article

Analysis of optical spectra by Fourier methods

Yoo, S. D., Edwards, N. V., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 143–148.

By: S. Yoo n, N. Edwards n & D. Aspnes n

author keywords: Fourier analysis; critical points; spectroscopic ellipsometry; reflectance; filtering
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Ultrathin oxide gate dielectrics prepared by low temperature remote plasma-assisted oxidation

Niimi, H., & Lucovsky, G. (1998, January). SURFACE & COATINGS TECHNOLOGY, Vol. 98, pp. 1529–1533.

By: H. Niimi n & G. Lucovsky n

author keywords: N-atom; Si-SiO2 interfaces; plasma-assisted oxidation
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Ultrathin nitride/oxide (N/O) gate dielectrics for p(+)-polysilicon gated PMOSFET's prepared by a combined remote plasma enhanced CVD thermal oxidation process

IEEE ELECTRON DEVICE LETTERS, 19(10), 367–369.

By: Y. Wu n & G. Lucovsky n

author keywords: boron penetration; gate dielectrics; nitride; N/O
Source: Web Of Science
Added: August 6, 2018

1998 journal article

The influence of time stress and location on behavioral warning compliance

SAFETY SCIENCE, 29(2), 143–158.

By: M. Wogalter n, A. Magurno n, R. Rashid n & K. Klein n

Source: Web Of Science
Added: August 6, 2018

1998 journal article

Study of SiOx decomposition kinetics and formation of Si nanocrystals in an SiOx matrix

Journal of Non-Crystalline Solids, 230 (part A)(1998 May), 507–512.

By: B. Hinds, F. Wang, D. Wolfe, C. Hinkle & G. Lucovsky

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Reaction pathways for intrinsic and extrinsic defect metastability in light-soaked hydrogenated amorphous silicon - the Staebler-Wronski effect

Journal of Non-Crystalline Solids, 230 (part A)(1998 May), 281–286.

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Quadrupole moments and identical superdeformed bands in Tb-149

Physical Review. C, Nuclear Physics, 58(3), 1422–1429.

By: B. Kharraja, U. Garg, H. Jin, R. Ernst, S. Ghugre, R. Janssens, M. Carpenter, S. Fischer ...

Source: NC State University Libraries
Added: August 6, 2018

1998 article

Plasma-engineered Si-SiO2 interfaces: monolayer nitrogen atom incorporation by low-temperature remote plasma-assisted oxidation in N2O

Koh, K., Niimi, H., & Lucovsky, G. (1998, January). SURFACE & COATINGS TECHNOLOGY, Vol. 98, pp. 1524–1528.

By: K. Koh n, H. Niimi n & G. Lucovsky n

author keywords: Si-SiO2 interfaces; N-atoms; N2O; Auger electron spectroscopy
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Piezoelectric measurements with atomic force microscopy

APPLIED PHYSICS LETTERS, 73(26), 3851–3853.

By: J. Christman*, R. Woolcott, A. Kingon* & R. Nemanich*

Source: Web Of Science
Added: August 6, 2018

1998 journal article

Optical-phonon confinement and scattering in wurtzite heterostructures

PHYSICAL REVIEW B, 58(8), 4860–4865.

By: B. Lee n, K. Kim n, M. Stroscio* & M. Dutta*

Source: Web Of Science
Added: August 6, 2018