Materials Science & Engineering

Spectroscopic ellipsometry study of InGaAs alloy films grown on InP

Journal of the Korean Physical Society, 39(2001 Dec), S389–392.

Reaction pathways in remote plasma nitridation of ultrathin SiO2 films

Journal of Applied Physics, 91(1), 48–55.

Growth of tetragonal zirconia coatings by reactive sputter deposition

Journal of the American Ceramic Society, 84(12), 2841–2844.

Dissociation reactions of hydrogen in remote plasma-enhanced chemical-vapor-deposition silicon nitride

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 19(5), 2622–2628.

Thermal expansion and elastic properties of InN

Applied Physics Letters, 79(11), 1602–1604.

Structural and magnetoresistance properties of La2/3Ca1/3MnO3 thin films on buffered silicon substrates

Applied Physics Letters, 78(8), 1098–1100.

Standardization" of field emission measurements

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 19(1), 87–93.

Space charge and the dependence of the flow stress of ceramics on an applied electric field

Scripta Materialia, 44(2), 311–316.

Photon energy dependence of contrast in photoelectron emission microscopy of Si devices

Applied Physics Letters, 78(22), 3547–3549.

Perfectly-alternating linear (AB)(n) multiblock copolymers: Effect of molecular design on morphology and properties

Journal of Polymer Science. Part B, Polymer Physics, 39(9), 947–955.

Nondestructive measurement of a glass transition temperature at spin-cast semicrystalline polymer surfaces

Macromolecules, Vol. 34, pp. 2395–2397.

Morphological characteristics of 1,3: 2,4-dibenzylidene sorbitol/poly(propylene glycol) organogels

Journal of Physical Chemistry. B, Condensed Matter, Materials, Surfaces, Interfaces & Biophysical, 105(11), 2091–2098.

Molecular, nanostructural and mechanical characteristics of lamellar triblock copolymer blends: Effects of molecular weight and constraint

Macromolecular Rapid Communications, 22(5), 281–296.

Investigation of noise in a spectrometer system using a short-arc source

Review of Scientific Instruments, 72(8), 3477–3479.

High temperature elastic constant prediction of some group III-nitrides

MRS Internet Journal of Nitride Semiconductor Research, 6(3), 1–5.

Growth and oxidation of thin film Al2Cu

Journal of the Electrochemical Society, 148(7), B260–263.

Characterization of RuO2 electrodes on Zr silicate and ZrO2 dielectrics

Applied Physics Letters, 78(8), 1134–1136.