Materials Science and Engineering

Electrochemical preparation of a stable accumulation layer on Si: A synchrotron radiation photoelectron spectroscopy study

APPLIED PHYSICS LETTERS, 87(26).

Effect of annealing temperature on texture and creep anisotropy in Ti3Al2.5V alloy

In Textures of materials: ICOTOM 14: Proceedings of the 14th International Conference on Textures of Materials, held in Leuven, Belgium, July 11-15, 2005 / Paul van Houtte; Leo Kestens. Uetikon-Zuerich, Switzerland ; Enfield, NH: Trans Tech Publications, 2005. (Materials science forum ; 495-497) (Vol. 495-497, pp. 1645–1650).

Dielectric functions of AlxGa1-xSb (0.00 <= x <= 0.39) alloys from 1.5 to 6.0 eV

JOURNAL OF APPLIED PHYSICS, 98(10).

Defects and defect relaxation at internal interfaces between high-k transition metal and rare earth dielectrics and interfacial native oxides in metal oxide semiconductor (MOS) structures

Lucovsky, G., & Phillips, J. C. (2005, August 22). THIN SOLID FILMS, Vol. 486, pp. 200–204.

Conduction band-edge d-states in high-k dielectrics due to Jahn-Teller term splittings

Lucovsky, G., Fulton, C. C., Zhang, Y., Luning, J., Edge, L., Whitten, J. L., … Afanase'v, VV. (2005, August 22). THIN SOLID FILMS, Vol. 486, pp. 129–135.

Characterization of dried whey protein concentrate and isolate flavor

JOURNAL OF DAIRY SCIENCE, 88(11), 3826–3839.

Analysis of variable scale surface roughness on Si(111): a comparative Brewster angle, ellipsometry and atomic force microscopy investigation

TRANSACTIONS OF THE INSTITUTE OF METAL FINISHING, 83(5), 238–247.

An electronically tunable microstrip bandpass filter using thin-film barium-strontium-titanate (BST) varactors

Nath, J., Ghosh, D., Maria, J. P., Kingon, A. I., Fathelbab, W., Franzon, P. D., & Steer, M. B. (2005, September). IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, Vol. 53, pp. 2707–2712.

A new understanding of near-threshold damage for 200 keV irradiation in silicon

JOURNAL OF MATERIALS SCIENCE, 40(14), 3639–3650.

Studies of the coupling of final d*-states in mixed Hf and Ti oxides (HfO2)(x)(TiOx)(1-x) and other complex oxides

Fulton, C. C., Lucovsky, G., Zhang, Y., Zou, Y., Nemanich, R. J., Ade, H., & Whitten, J. L. (2005, June). JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, Vol. 144, pp. 913–916.

Structural defects and luminescence features in heteroepitaxial GaN grown on on-axis and misoriented substrates

Journal of Applied Physics, 97(11).

Structural TEM study of nonpolar a-plane gallium nitride grown on (1120) 4H-SiC by organometallic vapor phase epitaxy

Physical Review. B, Condensed Matter and Materials Physics, 71(23).

Silicon-on-diamond: An advanced silicon-on-insulator technology

DIAMOND AND RELATED MATERIALS, Vol. 14, pp. 308–313.

Self-assembling of nanocavities in TiO2 dispersed with Au nanoclusters

Physical Review. B, Condensed Matter and Materials Physics, 72(24).

Relative bulk and interface contributions to optical second-harmonic generation in silicon

PHYSICAL REVIEW B, 72(20).

Optical properties of (GaSb)(3n)(AlSb)(n) (1 <= n <= 5) superlattices

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 23, pp. 1149–1153.

On the strain rate sensitivity of the flow stress of ultrafine-grained Cu processed by equal channel angular extrusion (ECAE)

SCRIPTA MATERIALIA, 53(5), 581–584.

Growth and field emission properties of small diameter carbon nanotube films

DIAMOND AND RELATED MATERIALS, Vol. 14, pp. 714–718.

Formation of stable titanium germanosilicide thin films on Si1-xGex

JOURNAL OF APPLIED PHYSICS, 97(11).

Final state effects in VUV and soft X-ray absorption spectra of transition metal oxides and silicate alloys: comparisons between experiment and ab initio calculations

Lucovsky, G., Zhang, Y., Fulton, C. C., Zou, Y., Nemanich, R. J., Ade, H., & Whitten, J. L. (2005, June). JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, Vol. 144, pp. 917–919.