Materials Science and Engineering

Works Published in 2002

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Displaying works 201 - 215 of 215 in total

Sorted by most recent date added to the index first, which may not be the same as publication date order.

2002 review

Carbon nanostructures

[Review of ]. CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES, 27(3-4), 227–356.

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Water absorption and interface reactivity of yttrium oxide gate dielectrics on silicon

APPLIED PHYSICS LETTERS, 80(19), 3575–3577.

By: D. Niu n, R. Ashcraft n & G. Parsons n

co-author countries: United States of America 🇺🇸

Contributors: D. Niu n, R. Ashcraft n & G. Parsons n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 journal article

Single electron tunneling of nanoscale TiSi2 islands on Si

JOURNAL OF APPLIED PHYSICS, 92(6), 3332–3337.

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Reaction pathways in remote plasma nitridation of ultrathin SiO2 films

JOURNAL OF APPLIED PHYSICS, 91(1), 48–55.

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Pseudodielectric function of ZnGeP2 from 1.5 to 6 eV

APPLIED PHYSICS LETTERS, 81(4), 628–630.

By: V. Blickle*, K. Flock n, N. Dietz n & D. Aspnes n

co-author countries: Germany 🇩🇪 United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 journal article

Plastic deformation kinetics of fine-grained MgO in tension

JOURNAL OF MATERIALS SCIENCE, 37(3), 615–620.

By: D. Yang n & H. Conrad n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Piezoresponse force microscopy for polarity imaging of GaN

APPLIED PHYSICS LETTERS, 80(22), 4166–4168.

co-author countries: Germany 🇩🇪 United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Multilayer TiC/TiN diffusion barrier films for copper

APPLIED PHYSICS LETTERS, 80(1), 79–81.

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 journal article

Low temperature electrical transport in La1-xNdxNiO3-delta

Solid State Communications, 121(6-7), 357–361.

By: A. Tiwari n, K. Rajeev* & J. Narayan n

co-author countries: India 🇮🇳 United States of America 🇺🇸
Sources: NC State University Libraries, ORCID
Added: August 6, 2018

2002 journal article

Issues in high-kappa gate stack interfaces

MRS BULLETIN, 27(3), 212–216.

By: V. Misra*, G. Lucovsky* & G. Parsons*

Contributors: V. Misra*, G. Lucovsky* & G. Parsons*

author keywords: gate stacks; high-dielectric-constant materials; high-kappa dielectrics; interface reactions; metal gates
Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 journal article

Extending the road beyond CMOS

IEEE CIRCUITS & DEVICES, 18(2), 28–41.

By: J. Hutchby*, G. Bourianoff*, . Zhirnov n & J. Brewer*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 article

Electronic states at the interface of Ti-Si oxide on Si(100)

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 20, pp. 1726–1731.

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Electrodeposition of tin needle-like structures

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 149(3), C150–C158.

By: C. Rinne*, J. Hren* & P. Fedkiw n

co-author countries: Australia 🇦🇺 United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 article

Anomalous field emission from Al2O3 coated Si tips

Zhirnov, VV, Alimova, A. N., & Hren, J. J. (2002, May 17). APPLIED SURFACE SCIENCE, Vol. 191, pp. 20–25.

By: . Zhirnov n, A. Alimova* & J. Hren n

co-author countries: United States of America 🇺🇸
author keywords: field emission; secondary emission; aluminum oxide
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Antiphase boundaries in GaP layers grown on (001) Si by chemical beam epitaxy

ACTA MATERIALIA, 50(6), 1275–1287.

By: V. Narayanan*, S. Mahajan*, K. Bachmann n, V. Woods n & N. Dietz n

co-author countries: United States of America 🇺🇸
author keywords: transmission electron microscopy (TEM); epitaxy; GaP; islands; antiphase domains
Source: Web Of Science
Added: August 6, 2018

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