Materials Science & Engineering

Secondary electron emission patterning of diamond with hydrogen and oxygen plasmas

APPLIED PHYSICS LETTERS, 72(20), 2580–2582.

Phase coarsening and crack growth rate during thermo-mechanical cycling of 63Sn37Pb solder joints

JOURNAL OF ELECTRONIC MATERIALS, 27(8), 941–947.

Nondestructive determination of tensile properties and fracture toughness of cold worked A36 steel

INTERNATIONAL JOURNAL OF PRESSURE VESSELS AND PIPING, 75(11), 831–840.

Multi-coated spheres: recommended electrorheological particles

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 31(22), 3312–3315.

Microstructural factors influencing the properties of high surface area molybdenum nitride films converted from molybdenum trioxide films deposited via solution spray pyrolysis

JOURNAL OF MATERIALS RESEARCH, 13(8), 2237–2244.

Mechanical properties, ductility, and grain size of nanocrystalline iron produced by mechanical attrition

Malow, T. R., & Koch, C. C. (1998, September). METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, Vol. 29, pp. 2285–2295.

Frequency-resolved microwave reflection photoconductance

JOURNAL OF APPLIED PHYSICS, 83(12), 7730–7735.

Finite element modeling of thermal residual stress in Tungsten/Tungsten-carbide composites

Ceramic Engineering and Science Proceedings, 19(4), 177–184.

Endpoint uniformity sensing and analysis in silicon dioxide plasma etching using in situ mass spectrometry

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 16(6), 2996–3002.

Electron emission from diamond films

MRS BULLETIN, 23(9), 42–48.

Electron affinity and Schottky barrier height of metal-diamond (100), (111), and (110) interfaces

JOURNAL OF APPLIED PHYSICS, 83(4), 2072–2082.

Dependence of (0001) GaN/AlN valence band discontinuity on growth temperature and surface reconstruction

JOURNAL OF APPLIED PHYSICS, 84(4), 2086–2090.

Cold photoconductivity in a system of interacting charge-transfer excitons at a donor-acceptor interface

CHEMICAL PHYSICS, 238(3), 365–372.

Behavior of molybdenum nitrides as materials for electrochemical capacitors - Comparison with ruthenium oxide

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 145(6), 1882–1888.

A numerical study of shock-induced particle velocity dispersion in solid mixtures

JOURNAL OF APPLIED PHYSICS, 84(3), 1292–1298.

A free electron laser-photoemission electron microscope system (FEL-PEEM)

SURFACE REVIEW AND LETTERS, 5(6), 1257–1268.

The effects of PbTiO3 thin template layer and Pt/RuO2 hybrid electrode on the ferroelectric properties of sol-gel derived PZT thin film

THIN SOLID FILMS, 325(1-2), 72–78.

Systematic differences among nominal reference dielectric function spectra for crystalline Si as determined by spectroscopic ellipsometry

Bell, K. A., Mantese, L., Rossow, U., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 161–166.

Stability of Si-O-F low-K dielectrics: Attack by water molecules as function of near-neighbor Si-F bonding arrangements

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 16, pp. 1525–1528.

Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films

Edwards, N. V., Yoo, S. D., Bremser, M. D., Horton, M. N., Perkins, N. R., Weeks, T. W., … Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 187–192.