Materials Science and Engineering

Works Published in 1998

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Displaying works 81 - 100 of 240 in total

Sorted by most recent date added to the index first, which may not be the same as publication date order.

1998 journal article

A numerical study of shock-induced particle velocity dispersion in solid mixtures

JOURNAL OF APPLIED PHYSICS, 84(3), 1292–1298.

By: K. Yano n & Y. Horie n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1998 journal article

A free electron laser-photoemission electron microscope system (FEL-PEEM)

SURFACE REVIEW AND LETTERS, 5(6), 1257–1268.

By: H. Ade n, W. Yang n, S. English n, J. Hartman n, R. Davis n, R. Nemanich n, V. Litvinenko*, . Pinayev*, Y. Wu*, J. Madey*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1998 journal article

The effects of PbTiO3 thin template layer and Pt/RuO2 hybrid electrode on the ferroelectric properties of sol-gel derived PZT thin film

THIN SOLID FILMS, 325(1-2), 72–78.

By: S. Kim n, Y. Choi*, C. Kim* & D. Yang*

co-author countries: Korea (Republic of) 🇰🇷 United States of America 🇺🇸
author keywords: ferroelectric thin film; hybrid electrode; template layer; sol-gel method; PZT; fatigue degradation
Source: Web Of Science
Added: August 6, 2018

1998 article

Systematic differences among nominal reference dielectric function spectra for crystalline Si as determined by spectroscopic ellipsometry

Bell, K. A., Mantese, L., Rossow, U., & Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 161–166.

By: K. Bell n, L. Mantese n, U. Rossow n & D. Aspnes n

co-author countries: United States of America 🇺🇸
author keywords: ellipsometry; optical modeling; dielectric function; silicon
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Stability of Si-O-F low-K dielectrics: Attack by water molecules as function of near-neighbor Si-F bonding arrangements

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 16, pp. 1525–1528.

By: H. Yang n & G. Lucovsky n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1998 article

Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films

Edwards, N. V., Yoo, S. D., Bremser, M. D., Horton, M. N., Perkins, N. R., Weeks, T. W., … Aspnes, D. E. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 187–192.

By: N. Edwards*, S. Yoo*, M. Bremser*, M. Horton, N. Perkins, T. Weeks*, H. Liu, R. Stall ...

author keywords: GaN; spectroscopic ellipsometry; reflectance; valence bands; excitons; reciprocal space analysis
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Silane consumption and conversion analysis in amorphous silicon and silicon nitride plasma deposition using in situ mass spectroscopy

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 16, pp. 1852–1856.

co-author countries: United States of America 🇺🇸

Contributors: A. Chowdhury n, T. Klein n, T. Anderson n & G. Parsons n

Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 journal article

Plasma enhanced selective area microcrystalline silicon deposition on hydrogenated amorphous silicon: Surface modification for controlled nucleation

Journal of Vacuum Science &Amp; Technology a-Vacuum Surfaces and Films, 16(3), 1316–1320.

By: L. Smith n, W. Read n, C. Yang n, E. Srinivasan n, C. Courtney n, H. Lamb n, G. Parsons n

co-author countries: United States of America 🇺🇸

Contributors: L. Smith n, W. Read n, C. Yang n, E. Srinivasan n, C. Courtney n, H. Lamb n, G. Parsons n

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 personal communication

Photoelectrochemical capacitance-voltage measurements in GaN

Stutz, C. E., Mack, M., Bremser, M. D., Nam, O. H., Davis, R. F., & Look, D. C. (1998, May).

By: C. Stutz, M. Mack*, M. Bremser n, O. Nam n, R. Davis n & D. Look*

co-author countries: United States of America 🇺🇸
author keywords: carrier concentration depth profile; GaN; photoelectrochemical etching
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Phonon density of states of bulk gallium nitride

APPLIED PHYSICS LETTERS, 73(1), 34–36.

By: J. Nipko*, C. Loong*, C. Balkas n & R. Davis n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1998 patent

Oriented diamond film structures on nondiamond substrates

Washington, DC: U.S. Patent and Trademark Office.

By: W. Zhu, P. Yang & J. Glass

Source: NC State University Libraries
Added: August 6, 2018

1998 article

Optimization of nitrided gate dielectrics by plasma-assisted and rapid thermal processing

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 16, pp. 1721–1729.

By: G. Lucovsky n, H. Niimi n, Y. Wu n, C. Parker n & . Hauser n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Optical characterization of lateral epitaxial overgrown GaN layers

APPLIED PHYSICS LETTERS, 72(23), 2990–2992.

By: J. Freitas*, O. Nam n, R. Davis n, G. Saparin* & S. Obyden*

co-author countries: Russian Federation 🇷🇺 United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Nuclear electric quadrupole moment of Li-6

PHYSICAL REVIEW A, 57(4), 2539–2543.

By: J. Cederberg*, D. Olson*, J. Larson*, G. Rakness*, K. Jarausch*, J. Schmidt*, B. Borovsky*, P. Larson*, B. Nelson*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1998 article

Multiple sample analysis of spectroscopic ellipsometry data of semi-transparent films

Jarrendahl, K., & Arwin, H. (1998, February). THIN SOLID FILMS, Vol. 313, pp. 114–118.

co-author countries: Sweden 🇸🇪 United States of America 🇺🇸
author keywords: spectroscopic ellipsometry; multiple sample analysis; Ta2O5; ScN; CeO2
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Morphological and isothermal diffusive probe analyses of low-molecular-weight diblock copolymers

MACROMOLECULES, 31(7), 2174–2184.

By: S. Hong n, J. Laurer n, J. Zielinski n, J. Samseth n, S. Smith n, J. Duda n, R. Spontak n

co-author countries: Norway 🇳🇴 United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 journal article

Microporous, responsive hydroxypropyl cellulose gels. 1. Synthesis and microstructure

MACROMOLECULES, 31(7), 2166–2173.

By: B. Kabra n, S. Gehrke n & R. Spontak n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 journal article

Low-field bulk defect generation during uniform carrier injection into the gate insulator of insulated gate field effect transistors at various temperatures

JOURNAL OF ELECTRONIC MATERIALS, 27(7), 908–914.

By: H. Kim n, C. Williams n & A. Reisman n

co-author countries: United States of America 🇺🇸
author keywords: electron trapping; oxide defects; trap generation
Source: Web Of Science
Added: August 6, 2018

1998 article

Interface studies of tungsten nitride and titanium nitride composite metal gate electrodes with thin dielectric layers

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 16, pp. 1757–1761.

By: B. Claflin n, M. Binger n & G. Lucovsky n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Influence of an electric field on grain growth in extruded NaCl

SCRIPTA MATERIALIA, 38(9), 1443–1448.

By: D. Yang n & H. Conrad n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

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