Displaying works 101 - 120 of 239 in total
Sorted by most recent date added to the index first, which may not be the same as publication date order.
1999 journal article
High-energy cryogenic blending and compatibilizing of immiscible polymers
ADVANCED MATERIALS, 11(15), 1277-+.
1999 patent
High surface area molybdenum nitride electrodes
Washington, DC: U.S. Patent and Trademark Office.
1999 journal article
High optical quality AlInGaN by metalorganic chemical vapor deposition
APPLIED PHYSICS LETTERS, 75(21), 3315–3317.
1999 journal article
Germanium segregation in the Co/SiGe/Si(001) thin film system
JOURNAL OF MATERIALS RESEARCH, 14(11), 4372–4384.
1999 journal article
Field emission properties of nitrogen-doped diamond films
JOURNAL OF APPLIED PHYSICS, 86(7), 3973–3982.
1999 journal article
Ferroelectricity in thin films: The dielectric response of fiber-textured (BaxSr1-x)Ti1+yO3+z thin films grown by chemical vapor deposition
JOURNAL OF APPLIED PHYSICS, 86(8), 4565–4575.
1999 article
Experimental study of the yield stress of electrorheological suspensions under AC field: Comparison with a theoretical model
Boissy, C., Wu, C. W., Fahmy, Y., & Conrad, H. (1999, June 30). INTERNATIONAL JOURNAL OF MODERN PHYSICS B, Vol. 13, pp. 1775–1782.
1999 journal article
Evidence for localized Si-donor state and its DX-like properties in AlGaN: Errata (vol 74, pg 3833, 1999)
Applied Physics Letters, 75(20), 3225A.
1999 article
Evaluating the effect of oxygen content in BN interfacial coatings on the stability of SiC/BN/SiC composites
COMPOSITES PART A-APPLIED SCIENCE AND MANUFACTURING, Vol. 30, pp. 463–470.
1999 journal article
Estimating oxide thickness of tunnel oxides down to 1.4 nm using conventional capacitance-voltage measurements on MOS capacitors
IEEE ELECTRON DEVICE LETTERS, 20(4), 179–181.
1999 article
Electrorheology of suspensions of si particles with an oxide film in silicone oil
Wu, C. W., & Conrad, H. (1999, June 30). INTERNATIONAL JOURNAL OF MODERN PHYSICS B, Vol. 13, pp. 1713–1720.
1999 journal article
Dislocation structure of low-angle grain boundaries in YBa2Cu3O7-delta/MgO films
JOURNAL OF MATERIALS RESEARCH, 14(7), 2764–2772.
Contributors: S. Oktyabrsky *, R. Kalyanaraman n, K. Jagannadham n & J. Narayan n
1999 article
Conductivity in electrorheology
Conrad, H., Wu, C. W., & Tang, X. (1999, June 30). INTERNATIONAL JOURNAL OF MODERN PHYSICS B, Vol. 13, pp. 1729–1738.
1999 article
Comment on "Ab initio calculation of excitonic effects in the optical spectra of semiconductors"
Cardona, M., Lastras-Martinez, L. F., & Aspnes, D. E. (1999, November 8). PHYSICAL REVIEW LETTERS, Vol. 83, pp. 3970–3970.
1999 journal article
Cobalt nanoparticle formation in the pores of hyper-cross-linked polystyrene: Control of nanoparticle growth and morphology
CHEMISTRY OF MATERIALS, 11(11), 3210–3215.
1999 journal article
Analysis of capacitor breakdown mechanisms due to crystal-originated pits
IEEE ELECTRON DEVICE LETTERS, 20(10), 504–506.
1999 journal article
An optimized process for fabrication of SrBi2Ta2O9 thin films using a novel chemical solution deposition technique
JOURNAL OF MATERIALS RESEARCH, 14(11), 4395–4401.
1999 article
Thermochemical stability of silicon-oxygen-carbon alloy thin films: A model system for chemical and structural relaxation at SiC-SiO2 interfaces
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 17, pp. 2170–2177.
1999 article
The wear characteristics of some cemented tungsten carbides in machining particleboard
Sheikh-Ahmad, J. Y., & Bailey, J. A. (1999, April). WEAR, Vol. 225, pp. 256–266.
1999 journal article
Room temperature growth of cubic boron nitride
APPLIED PHYSICS LETTERS, 74(11), 1552–1554.
Citation Index includes data from a number of different sources. If you have questions about the sources of data in the Citation Index or need a set of data which is free to re-distribute, please contact us.
Certain data included herein are derived from the Web of Science© and InCites© (2024) of Clarivate Analytics. All rights reserved. You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.