Materials Science & Engineering

College of Engineering

Works Published in 2008

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Displaying works 101 - 120 of 310 in total

Sorted by most recent date added to the index first, which may not be the same as publication date order.

2008 journal article

New deformation twinning mechanism generates zero macroscopic strain in nanocrystalline metals

PHYSICAL REVIEW LETTERS, 1(9).

Source: ORCID
Added: November 17, 2019

2008 journal article

Nanolayeired carbon/silica superstructures via organosilane assembly

ADVANCED MATERIALS, 20(6), 1199-+.

By: H. Peng*, Y. Zhu*, D. Peterson* & . al.

Source: ORCID
Added: November 17, 2019

2008 chapter

Long-length ultrafine-grained titanium rods produced by ECAP-Conform

In Nanomaterials By Severe Plastic Deformation Iv, Pts 1 and 2 (Vol. 584-586, pp. 80–85).

By: G. Raaba, R. Valiev, D. Gunderov, T. Lowe, A. Misra & Y. Zhu

Source: ORCID
Added: November 17, 2019

2008 journal article

Influence of stacking-fault energy on microstructural characteristics of ultrafine-grain copper and copper-zinc alloys

ACTA MATERIALIA, 56(4), 809–820.

By: L. Balogh*, T. Ungar*, Y. Zhao* & . al.

author keywords: copper alloys; high-pressure torsion; severe plastic deformation; stacking-fault energy; X-ray diffraction
Source: ORCID
Added: November 17, 2019

2008 journal article

High tensile ductility and strength in bulk nanostructured nickel

ADVANCED MATERIALS, 20(16), 3028–3033.

By: Y. Zhao, T. Topping, J. Bingert & . al.

Source: ORCID
Added: November 17, 2019

2008 journal article

High ductility of ultrafine-grained steel via phase transformation

JOURNAL OF MATERIALS RESEARCH, 23(6), 1578–1586.

Source: ORCID
Added: November 17, 2019

2008 journal article

Evolution of defect structures during cold rolling of ultrafine-grained Cu and Cu-Zn alloys: Influence of stacking fault energy

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 474(1-2), 342–347.

By: Y. Zhao*, Z. Horita*, T. Langdon* & . al.

author keywords: copper; copper-zinc alloys; high-pressure torsion; severe plastic deformation; stacking fault energy; ultrafine-grained materials
Source: ORCID
Added: November 17, 2019

2008 journal article

Determining the optimal stacking fault energy for achieving high ductility in ultrafine-grained Cu-Zn alloys

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 493(1-2), 123–129.

By: Y. Zhao*, X. Liao*, Z. Horita* & . al.

author keywords: copper alloys; ductility; high-pressure torsion; severe plastic deformation; stacking fault energy
Source: ORCID
Added: November 17, 2019

2008 chapter

SYNTHESIS OF CERAMIC EUTECTICS USING MICROWAVE PROCESSING

In Advances in Ceramic Armor Iii (Vol. 28, pp. 127–133). http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000284980300011&KeyUID=WOS:000284980300011

By: A. Polotai, J. Cheng, D. Agrawal, E. Dickey & S. Cytron

Source: ORCID
Added: September 12, 2019

2008 chapter

Stability of Ni Electrodes and Ni-BaTiO3 Interface Evolution in Ultrathin BME MLCCs

In 2008 17th Ieee International Symposium on the Applications of Ferroelectrics (pp. 3–4). http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000270584000002&KeyUID=WOS:000270584000002

By: A. Polotai, D. Shay, G. Yang, E. Dickey & C. Randall

Source: ORCID
Added: September 12, 2019

2008 journal article

Raman scattering from Si1-xGex alloy nanowires

Journal of Physical Chemistry C, 112(9), 3209–3215.

By: Q. Lu*, K. Adu*, H. Gutierrez*, G. Chen*, K. Lew*, P. Nimmatoori*, X. Zhang*, E. Dickey*, J. Redwing*, P. Eklund*

Source: ORCID
Added: September 12, 2019

2008 journal article

Laser Surface Processing of B4C-TiB2 Eutectic

International Journal of Applied Ceramic Technology, 5(6), 610–617.

By: A. Polotai*, J. Foreman*, E. Dickey* & K. Meinert*

Source: ORCID
Added: September 12, 2019

2008 journal article

Interface Stoichiometry and Structure in Anodic Niobium Pentoxide

Microscopy and Microanalysis, 14(5), 451–458.

author keywords: electrolytic capacitor; niobium; niobium oxide; amorphous oxide; dielectric; HRTEM; EELS
Sources: ORCID, Crossref
Added: September 12, 2019

2008 journal article

Equilibrium strain-energy analysis of coherently strained core-shell nanowires

Journal of Crystal Growth, 310(12), 3084–3092.

By: T. Trammell*, X. Zhang*, Y. Li*, L. Chen* & E. Dickey*

author keywords: stresses; solid phase epitaxial; semiconductor materials; field effect transistors
Source: ORCID
Added: September 12, 2019

2008 journal article

Effects of a compositionally graded buffer layer on stress evolution during GaN and AlxGa1-xN MOCVD on SiC substrates

Journal of Crystal Growth, 310(7-9), 2314–2319.

By: J. Acord*, X. Weng*, E. Dickey*, D. Snyder* & J. Redwing*

author keywords: stresses; metalorganic vapor phase epitaxy; nitrides; semiconducting III-V materials
Source: ORCID
Added: September 12, 2019

2008 journal article

Effect of Heating Rates during Sintering on the Electrical Properties of Ultra-Thin NiBaTiO3 Multilayer Ceramic Capacitors

Journal of the American Ceramic Society, 91(8), 2540–2544.

Sources: ORCID, Crossref
Added: September 12, 2019

2008 journal article

Diameter Dependent Growth Rate and Interfacial Abruptness in Vapor–Liquid–Solid Si/Si1−xGex Heterostructure Nanowires

Nano Letters, 8(4), 1246–1252.

By: T. Clark, P. Nimmatoori*, K. Lew*, L. Pan*, J. Redwing* & E. Dickey*

Sources: ORCID, Crossref
Added: September 12, 2019

2008 journal article

Analysis of Si1-xGex : H thin films with graded composition and structure by real time spectroscopic ellipsometry

Physica Status Solidi a-Applications and Materials Science, 205(4), 892–895.

By: N. Podraza*, J. Li*, C. Wronski*, E. Dickey*, M. Horn* & R. Collins*

Source: ORCID
Added: September 12, 2019

2008 chapter

Analysis of Compositionally and Structurally Graded Si:H and Si1-xGex:H Thin Films by Real Time Spectroscopic Ellipsometry

In Amorphous and Polycrystalline Thin-Film Silicon Science and Technology-2008 (Vol. 1066, pp. 253–258). http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000261398700036&KeyUID=WOS:000261398700036

By: N. Podraza, J. Li, C. Wronski, M. Horn, E. Dickey & R. Collins

Source: ORCID
Added: September 12, 2019

2008 journal article

Theoretical studies of defects states in GaSe and GaTe

Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X, 7079.

By: Z. Rak*, S. Mahanti*, K. Mandal*, N. Fernelius*, A. Burger, L. Franks, R. James

author keywords: defects; wide gap semiconductors; ab initio calculations; electronic structure
Source: ORCID
Added: September 11, 2019