Materials Science and Engineering

Works Published in 2002

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Displaying works 121 - 140 of 215 in total

Sorted by most recent date added to the index first, which may not be the same as publication date order.

2002 journal article

Strain and crystallographic tilt in uncoalesced GaN layers grown by maskless pendeoepitaxy

APPLIED PHYSICS LETTERS, 80(6), 953–955.

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 article

Simplified bond-hyperpolarizability model of second harmonic generation: Application to Si-dielectric interfaces

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 20, pp. 1699–1705.

By: J. Wang n, G. Powell n, R. Johnson n, G. Lucovsky n & D. Aspnes n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 journal article

Nanoscale observation of photoinduced domain pinning and investigation of imprint behavior in ferroelectric thin films

JOURNAL OF APPLIED PHYSICS, 92(5), 2734–2739.

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Mechanical properties of cyromilled nanocrystalline Zn studied by the miniaturized disk bend test

ACTA MATERIALIA, 50(13), 3527–3533.

co-author countries: United States of America 🇺🇸
author keywords: miniaturized disk bend tests; yield stress; hardening; softening; ductility
Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 journal article

Lithium/V6O13 cells using silica nanoparticle-based composite electrolyte

ELECTROCHIMICA ACTA, 47(24), 3853–3861.

By: Y. Li n, P. Fedkiw n & S. Khan n

co-author countries: United States of America 🇺🇸
author keywords: lithium cell; composite gel electrolyte; silica nanoparticle; lithium dendrite; vanadium oxide
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Interface electronic structure of Ta2O5-Al2O3 alloys for Si- field-effect transistor gate dielectric applications

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1732–1738.

By: M. Ulrich, R. Johnson, J. Hong, J. Rowe, G. Lucovsky, J. Quinton, T. Madey

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Integration of single crystal La0.7Sr0.3MnO3 films with Si(001)

SOLID STATE COMMUNICATIONS, 121(12), 679–682.

By: A. Tiwari n, A. Chug n, C. Jin n, D. Kumar n & J. Narayan n

co-author countries: United States of America 🇺🇸
author keywords: thin films; laser processing; epitaxy; scanning and transmission electron microscopy; electron-electron interactions
Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 journal article

Imaging and engineering the nanoscale-domain structure of a Sr0.61Ba0.39Nb2O6 crystal using a scanning force microscope

APPLIED PHYSICS LETTERS, 81(11), 2044–2046.

By: K. Terabe*, S. Takekawa*, M. Nakamura*, K. Kitamura*, S. Higuchi*, Y. Gotoh*, A. Gruverman n

co-author countries: Japan 🇯🇵 United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Getter requirements for a cathode ray tube with a diamond coated field emitter electron source

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1379–1383.

By: V. Nemanic, M. Zumer, B. Zajec & T. Tyler

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Epitaxial growth of ZnO films on si(111)

JOURNAL OF MATERIALS RESEARCH, 17(10), 2480–2483.

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 journal article

Electronic structure of high-k transition metal oxides and their silicate and aluminate alloys

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1739–1747.

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Electronic structure of SiO2: Charge redistribution contributions to the dynamic dipoles/effective charges of the infrared active normal modes

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1710–1719.

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Electrical, structural and microstructural characteristics of as-deposited and annealed Pt and Au contacts on chemical-vapor-cleaned GaN thin films

JOURNAL OF APPLIED PHYSICS, 91(4), 2133–2137.

By: E. Preble n, K. Tracy n, S. Kiesel n, H. McLean n, P. Miraglia n, R. Nemanich n, R. Davis n, M. Albrecht*, D. Smith*

co-author countries: Germany 🇩🇪 United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Current-voltage and imaging of TiSi2 islands on Si(001) surfaces using conductive-tip atomic force microscopy

JOURNAL OF APPLIED PHYSICS, 92(6), 3326–3331.

By: J. Oh n & R. Nemanich n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Cross-sectional imaging of pendeo-epitaxial GaN using continuous-wave two-photon microphotoluminescence

APPLIED PHYSICS LETTERS, 81(11), 1984–1986.

By: P. Schuck*, R. Grober*, A. Roskowski n, S. Einfeldt n & R. Davis n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Copper diffusion characteristics in single-crystal and polycrystalline TaN

APPLIED PHYSICS LETTERS, 81(8), 1453–1455.

By: H. Wang n, A. Tiwari n, X. Zhang n, A. Kvit n & J. Narayan n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 journal article

Chemical, electrical, and structural properties of Ni/Au contacts on chemical vapor cleaned p-type GaN

JOURNAL OF APPLIED PHYSICS, 91(11), 9151–9160.

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Aspects of the surface relief definition of bainite

SCRIPTA MATERIALIA, 47(3), 207–212.

By: H. Aaronson, J. Rigsbee*, B. Muddle & J. Nie

author keywords: phase transformations; bainite; martensitic growth; diffusional growth
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Application of Nomarski interference contrast microscopy as a thickness monitor in the preparation of transparent, SiG-based, cross-sectional TEM samples

ULTRAMICROSCOPY, 92(3-4), 265–271.

By: E. Preble n, H. McLean n, S. Kiesel n, P. Miraglia n, M. Albrecht* & R. Davis n

co-author countries: Germany 🇩🇪 United States of America 🇺🇸
author keywords: Nomarski; transmission electron microscopy; silicon carbide; transparent samples
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Analysis of Ti-silicide formation with a thin Ta interlayer on Si (100)

Journal of the Korean Physical Society, 40(5), 903–907.

By: H. Jeon, H. Won, Y. Kim, J. Lee & R. Nemanich

Source: NC State University Libraries
Added: August 6, 2018

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