Materials Science & Engineering

College of Engineering

Works Published in 2008

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Displaying works 141 - 160 of 311 in total

Sorted by most recent date added to the index first, which may not be the same as publication date order.

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2008 journal article

Growth of biepitaxial zinc oxide thin films on silicon (100) using yttria-stabilized zirconia buffer layer

Applied Physics Letters, 93(25), 251905.

By: R. Aggarwal, C. Jin, P. Pant, J. Narayan  & R. Narayan

author keywords: electron diffraction; II-VI semiconductors; photoluminescence; point defects; pulsed laser deposition; semiconductor epitaxial layers; transmission electron microscopy; wide band gap semiconductors; X-ray diffraction; yttrium compounds; zinc compounds; zirconium compounds
Sources: Web Of Science, ORCID
Added: August 6, 2018

2008 journal article

Epitaxial growth and Ohmic contacts in MgxZn1-xO/TiN/Si(111) heterostructures

APPLIED PHYSICS LETTERS, 93(25).

By: C. Jin, W. Wei, H. Zhou, T. Yang & R. Narayan

author keywords: buffer layers; electrodes; elemental semiconductors; II-VI semiconductors; magnesium compounds; ohmic contacts; pulsed laser deposition; semiconductor epitaxial layers; semiconductor growth; semiconductor heterojunctions; semiconductor-insulator-semiconductor structures; silicon; titanium compounds; transmission electron microscopy; vapour phase epitaxial growth; wide band gap semiconductors; X-ray diffraction; zinc compounds
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Sublimation growth of an in-situ-deposited layer in SiC chemical vapor deposition on 4H-SiC(1 1 (2)over-bar 0)

JOURNAL OF CRYSTAL GROWTH, 311(1), 72–78.

By: S. Bishop, C. Reynolds n, Z. Liliental-Weber*, Y. Uprety *, C. Ebert*, F. Stevie, J. Park, R. Davis

author keywords: Characterization; Chemical vapor deposition processes; Hot-wall epitaxy; Silicon carbide; Semiconducting materials
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Impact of Cu contamination on the electrical properties of a direct silicon bonded (110)/(100) interfacial grain boundary

Journal of Applied Physics, 104(11).

By: X. Yu, J. Lu & G. Rozgonyi

Source: NC State University Libraries
Added: August 6, 2018

2008 journal article

Barrier layer mechanism engineering in calcium copper titanate thin film capacitors through microstructure control

JOURNAL OF APPLIED PHYSICS, 104(11).

By: E. Paisley, M. Losego, S. Aygun, H. Craft & J. Maria

Source: Web Of Science
Added: August 6, 2018

2008 journal article

Abnormal domain switching in Pb(Zr,Ti)O-3 thin film capacitors

Applied Physics Letters, 93(26).

By: A. Wu, P. Vilarinho, D. Wu & A. Gruverman

Source: NC State University Libraries
Added: August 6, 2018

2008 journal article

Surface water reactivity of polycrystalline MgO and CaO films investigated using x-ray photoelectron spectroscopy

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 26(6), 1507–1510.

By: H. Craft, R. Collazo , M. Losego, Z. Sitar & J. Maria

author keywords: annealing; calcium compounds; epitaxial layers; magnesium compounds; monolayers; surface chemistry; surface morphology; X-ray photoelectron spectra
Sources: Web Of Science, ORCID
Added: August 6, 2018

2008 journal article

Suppression of Ge-O and Ge-N bonding at Ge-HfO2 and Ge-TiO2 interfaces by deposition onto plasma-nitrided passivated Ge substrates

THIN SOLID FILMS, 517(1), 155–158.

By: S. Lee, J. Long, G. Lucovsky & J. Luening

author keywords: Ge/dielectric interfaces; Remote plasma nitridation of Ge; Band edge defects; Remote plasma deposition; Thermal annealing
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Pulsed Laser Deposition of Nanoporous Cobalt Thin Films

JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 8(11), 6043–6047.

By: C. Jin, S. Nori, W. Wei, R. Aggarwal, D. Kumar & R. Narayan

author keywords: Magnetization Curves; Epitaxial Films; Magnetic Nano-Networks
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Plastic deformation of ultrafine-grained 2.5Y-TZP exposed to a dc electric field with an air gap

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 496(1-2), 9–13.

By: H. Conrad, D. Yang & P. Becher*

author keywords: Electric field; Debye length; Grain growth; Plastic deformation; Zirconia
Source: Web Of Science
Added: August 6, 2018

2008 article

Focused in beam fabrication of metallic nanostructures on end faces of optical fibers for chemical sensing applications

Dhawan, A., Muth, J. F., Leonard, D. N., Gerhold, M. D., Gleeson, J., Vo-Dinh, T., & Russell, P. E. (2008, November). JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 26, pp. 2168–2173.

By: A. Dhawan, J. Muth, D. Leonard, M. Gerhold, J. Gleeson, T. Vo-Dinh, P. Russell

author keywords: chemical sensors; fibre optic sensors; focused ion beam technology; gold; metallic thin films; nanostructured materials; refractive index; silver; surface plasmon resonance
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Comparative Raman and HRTEM Study of Nanostructured GaN Nucleation Layers and Device Layers on Sapphire (0001)

JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 8(11), 5985–5992.

By: P. Pant, J. Narayan , A. Wushuer & M. Manghnani

author keywords: GaN; Nucleation Layer; Raman Spectroscopy; Stress
Sources: Web Of Science, ORCID
Added: August 6, 2018

2008 journal article

Chemical bonding and graded interfacial transition regions at transition metal, Hf(Zr),/high-k gate dielectric, Hf(Zr)O(2), interfaces

THIN SOLID FILMS, 517(1), 343–345.

By: G. Lucovsky & J. Whitten 

author keywords: High-k dielectrics; Hf(Zr)O(2); Transition metal; Chemical bonding; Graded interfacial regions; O-atom vacancies; Discrete band edge
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Characterization of Pd/gamma-Al2O3 Catalysts Prepared Using [Pd(hfac)(2)] in Liquid CO2

TOPICS IN CATALYSIS, 49(3-4), 178–186.

By: M. Kelly n, J. Kim, G. Roberts & H. Lamb

author keywords: Palladium-alumina catalysts; Palladium hexafluoroacetylacetonate; Catalyst preparation; CO pulse chemisorption; Diffuse-reflectance infrared spectroscopy; X-ray absorption fine structure spectroscopy
Source: Web Of Science
Added: August 6, 2018

2008 journal article

Bulk defects in nano-crystalline and in non-crystalline HfO2-based thin film dielectrics

THIN SOLID FILMS, 517(1), 437–440.

By: S. Lee, H. Seo, G. Lucovsky, L. Fleming  n, M. Ulrich & J. Luening

author keywords: Thin film high-k dielectrics; Non-crystalline transition metal oxides; Nano-crystalline transition metal oxides; Bulk defects; Intrinsic bonding defects; Divacancies
Source: Web Of Science
Added: August 6, 2018

2008 conference paper

Stress rupture characteristics of zirconium alloy cladding under closed-end internal pressurization

Proceedings of 16th International Conference on Nuclear Engineering-Volume 1, 385–388.

By: B. Marple, Y. Song, S. Gollapudi, K. Murty & I. Charit*

Source: NC State University Libraries
Added: August 6, 2018

2008 journal article

Molecular Simulation of the Influence of Interface Faceting on the Shock Sensitivity of a Model Plastic Bonded Explosive

JOURNAL OF PHYSICAL CHEMISTRY B, 112(47), 14898–14904.

By: Y. Shi  n & D. Brenner

Source: Web Of Science
Added: August 6, 2018

2008 journal article

Deep-level transient spectroscopy study on direct silicon bonded (110)/(100) interfacial grain boundary

Semiconductor Science and Technology, 23(12).

By: X. Yu, J. Lu & G. Rozgonyi

Source: NC State University Libraries
Added: August 6, 2018

2008 journal article

Composite Carbon Nanotube/Silica Fibers with Improved Mechanical Strengths and Electrical Conductivities

SMALL, 4(11), 1964–1967.

By: H. Peng *, M. Jain *, D. Peterson*, Y. Zhu  & Q. Jia *

author keywords: carbon nanotubes; composite fibers; hydrogen bonding; silica
Sources: Web Of Science, ORCID
Added: August 6, 2018

2008 journal article

Thickness inhomogenities in the organometallic chemical vapor deposition of GaP

APPLIED PHYSICS LETTERS, 93(20).

By: X. Liu & D. Aspnes 

author keywords: catalysis; desorption; diffusion; gallium compounds; III-V semiconductors; MOCVD; semiconductor growth; semiconductor thin films
Sources: Web Of Science, ORCID
Added: August 6, 2018