Materials Science and Engineering

Film thickness effects in the Co-Si1-xGex solid phase reaction

JOURNAL OF APPLIED PHYSICS, 84(8), 4285–4291.

Co-deposition of cobalt disilicide on silicon-germanium thin films

THIN SOLID FILMS, 320(2), 206–210.

Characterization of zirconium nitride coatings deposited by cathodic arc sputtering

SURFACE & COATINGS TECHNOLOGY, 107(2-3), 115–124.

A unified chemical bonding model for defect generation in a-SiH: Photo-induced defects in photovoltaic devices and current-induced defects in TFTs

Yang, H., & Lucovsky, G. (1998, March). JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, Vol. 37, pp. 1082–1090.

X-ray photoelectron diffraction from (3X3) and (root 3X root 3)R30 degrees (001)(Si) 6H-SiC surfaces

JOURNAL OF APPLIED PHYSICS, 84(11), 6042–6048.

Virtual design and analysis of nanometer-scale sensor and device components

Journal of the British Interplanetary Society, 51(1998), 137–144.

Transient enhanced diffusion and defect microstructure in high dose, low energy As+ implanted Si

JOURNAL OF APPLIED PHYSICS, 84(11), 5997–6002.

Special issue on interfacial reactions, solid state transformations and thermal management - Foreword

Ghosh, G., Kang, S., Murty, K. L., & Notis, M. (1998, November). JOURNAL OF ELECTRONIC MATERIALS, Vol. 27, pp. 1137–1137.

Oxidation of a bis[Zn(II) porphyrin] yields a nondisjoint, exchange-coupled pi dication-biradical

Shultz, D. A., Lee, H. Y., & Gwaltney, K. P. (1998, October 30).

On the prediction of the shear stress of electrorheological suspensions

JOURNAL OF MATERIALS RESEARCH, 13(11), 3299–3303.

Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films

MRS Bulletin, 23(1), 33–42.

Multiscale modeling approach for calculating grain-boundary energies from first principles

PHYSICAL REVIEW B, 57(6), R3181–R3184.

Monolayer nitrogen atom incorporation at buried Si-SiO2 interfaces: Preparation by remote plasma oxidation/nitridation and characterization by on-line auger electron spectroscopy

Lucovsky, G., Niimi, H., Koh, K., & Green, M. L. (1998, February). SURFACE REVIEW AND LETTERS, Vol. 5, pp. 167–173.

Interface electronic transition observed by optical second-harmonic spectroscopy in beta-GaN/GaAs(001) heterostructures

PHYSICAL REVIEW B, 57(7), 3722–3725.

Discrete element investigation of stress fluctuation in granular flow at high strain rates

PHYSICAL REVIEW E, 57(2), 2053–2061.

Wear characteristics of a woodworking knife with a vanadium carbide coating only on the clearance surface (back surface)

ADVANCED CERAMIC TOOLS FOR MACHINING APPLICATION - III, 138-1, 479–520.

Thermoplastic elastomer gels. I. Effects of composition and processing on morphology and gel behavior

Journal of Polymer Science. Part B, Polymer Physics, 36(13), 2379–2391.

Reflectance difference spectroscopy spectra of clean (3 x 2), (2 x 1), and c(2 x 2) 3C-SiC(001) surfaces: New evidence for surface state contributions to optical anisotropy spectra

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 16, pp. 2355–2357.

Photon-induced localization and final-state correlation effects in optically absorbing materials

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 16, pp. 2367–2372.

Investigation of postoxidation thermal treatments of Si/SiO2 interface in relationship to the kinetics of amorphous Si suboxide decomposition

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 16(4), 2171–2176.