Materials Science & Engineering

College of Engineering

Works Published in 1998

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Displaying works 161 - 180 of 234 in total

Sorted by most recent date added to the index first, which may not be the same as publication date order.

1998 journal article

Transient enhanced diffusion and defect microstructure in high dose, low energy As+ implanted Si

JOURNAL OF APPLIED PHYSICS, 84(11), 5997–6002.

By: V. Krishnamoorthy, K. Moller, K. Jones, D. Venables, J. Jackson & L. Rubin

Source: Web Of Science
Added: August 6, 2018

1998 article

Special issue on interfacial reactions, solid state transformations and thermal management - Foreword

Ghosh, G., Kang, S., Murty, K. L., & Notis, M. (1998, November). JOURNAL OF ELECTRONIC MATERIALS, Vol. 27, pp. 1137–1137.

By: G. Ghosh, S. Kang, K. Murty & M. Notis

Source: Web Of Science
Added: August 6, 2018

1998 personal communication

Oxidation of a bis[Zn(II) porphyrin] yields a nondisjoint, exchange-coupled pi dication-biradical

Shultz, D. A., Lee, H. Y., & Gwaltney, K. P. (1998, October 30).

Source: Web Of Science
Added: August 6, 2018

1998 journal article

On the prediction of the shear stress of electrorheological suspensions

JOURNAL OF MATERIALS RESEARCH, 13(11), 3299–3303.

Source: Web Of Science
Added: August 6, 2018

1998 journal article

Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films

MRS Bulletin, 23(1), 33–42.

By: O. Auciello, A. Gruverman, H. Tokumoto, S. Prakash, S. Aggarwal & R. Ramesh

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Multiscale modeling approach for calculating grain-boundary energies from first principles

PHYSICAL REVIEW B, 57(6), R3181–R3184.

By: O. Shenderova, D. Brenner, A. Nazarov*, A. Romanov* & L. Yang*

Source: Web Of Science
Added: August 6, 2018

1998 article

Monolayer nitrogen atom incorporation at buried Si-SiO2 interfaces: Preparation by remote plasma oxidation/nitridation and characterization by on-line auger electron spectroscopy

Lucovsky, G., Niimi, H., Koh, K., & Green, M. L. (1998, February). SURFACE REVIEW AND LETTERS, Vol. 5, pp. 167–173.

By: G. Lucovsky, H. Niimi, K. Koh & M. Green*

Source: Web Of Science
Added: August 6, 2018

1998 journal article

Interface electronic transition observed by optical second-harmonic spectroscopy in beta-GaN/GaAs(001) heterostructures

PHYSICAL REVIEW B, 57(7), 3722–3725.

By: G. Lupke*, O. Busch*, C. Meyer*, H. Kurz*, O. Brandt*, H. Yang, A. Trampert*, K. Ploog*, G. Lucovsky

Source: Web Of Science
Added: August 6, 2018

1998 journal article

Discrete element investigation of stress fluctuation in granular flow at high strain rates

PHYSICAL REVIEW E, 57(2), 2053–2061.

By: O. Schwarz, Y. Horie & M. Shearer

Source: Web Of Science
Added: August 6, 2018

1998 journal article

Wear characteristics of a woodworking knife with a vanadium carbide coating only on the clearance surface (back surface)

ADVANCED CERAMIC TOOLS FOR MACHINING APPLICATION - III, 138-1, 479–520.

By: C. Kato & J. Bailey

author keywords: wood cutting; orthogonal cutting; up milling; vanadium carbide coated tool; chromium coated tool; self-sharpening
Source: Web Of Science
Added: August 6, 2018

1998 journal article

Thermoplastic elastomer gels. I. Effects of composition and processing on morphology and gel behavior

Journal of Polymer Science. Part B, Polymer Physics, 36(13), 2379–2391.

By: J. Laurer, J. Mulling, S. Khan, R. Spontak & R. Bukovnik

Sources: NC State University Libraries, ORCID
Added: August 6, 2018

1998 article

Reflectance difference spectroscopy spectra of clean (3 x 2), (2 x 1), and c(2 x 2) 3C-SiC(001) surfaces: New evidence for surface state contributions to optical anisotropy spectra

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 16, pp. 2355–2357.

By: U. Rossow, K. Lindner, M. Lubbe, D. Aspnes & D. Zahn

Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 article

Photon-induced localization and final-state correlation effects in optically absorbing materials

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 16, pp. 2367–2372.

By: D. Aspnes, L. Mantese, K. Bell & U. Rossow

Sources: Web Of Science, ORCID
Added: August 6, 2018

1998 journal article

Investigation of postoxidation thermal treatments of Si/SiO2 interface in relationship to the kinetics of amorphous Si suboxide decomposition

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 16(4), 2171–2176.

By: B. Hinds, F. Wang, D. Wolfe, C. Hinkle & G. Lucovsky

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Interface formation and thermal stability of advanced metal gate and ultrathin gate dielectric layers

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 16(4), 2154–2158.

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Heterointerface dipoles: Applications to (a) Si-SiO2, (b) nitrided Si-N-SiO2, and (c) SiC-SiO2 interfaces

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 16(4), 2191–2198.

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Electrical properties of (Ba, Sr)TiO3 thin films prepared by liquid delivery MOCVD

Journal of the Korean Physical Society, 32 pt.4(suppl.), 1652–1656.

By: W. Lee, R. Woolcott, C. Basceri, H. Lee, S. Streiffer, A. Kingon, D. Yang

Source: NC State University Libraries
Added: August 6, 2018

1998 article

Differences between silicon oxycarbide regions at SiC-SiO(2) prepared by plasma-assisted oxidation and thermal oxidations

Lucovsky, G., Niimi, H., Golz, A., & Kurz, H. (1998, January). APPLIED SURFACE SCIENCE, Vol. 123, pp. 435–439.

By: G. Lucovsky, H. Niimi, A. Golz* & H. Kurz*

Source: Web Of Science
Added: August 6, 2018

1998 journal article

Dielectric properties and microstructure of thin BST films

Journal of the Korean Physical Society, 32 pt.4(suppl.), 1591–1594.

By: S. Bilodeau, R. Carl, P. VanBuskirk, J. Roeder, C. Basceri, S. Lash, C. Parker, S. Streiffer, A. Kingon

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Coupled electron-hole dynamics at the Si/SiO2 interface

PHYSICAL REVIEW LETTERS, 81(19), 4224–4227.

By: W. Wang, G. Lupke, M. Di Ventra, S. Pantelides, J. Gilligan, N. Tolk, I. Kizilyalli, P. Roy, G. Margaritondo, G. Lucovsky

Source: Web Of Science
Added: August 6, 2018