Power Semiconductor Research Center

Works Published in 2011

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Displaying all 4 works

Sorted by most recent date added to the index first, which may not be the same as publication date order.

2011 journal article

Finite-Zone Argon Implant Edge Termination for High-Voltage GaN Schottky Rectifiers

IEEE ELECTRON DEVICE LETTERS, 32(10), 1361–1363.

By: A. Ozbek n & B. Baliga  n

co-author countries: United States of America πŸ‡ΊπŸ‡Έ
author keywords: Breakdown voltage; edge termination; gallium nitride (GaN); Schottky diode
Source: Web Of Science
Added: August 6, 2018

2011 personal communication

Tunneling coefficient for GaN Schottky barrier diodes

Ozbek, A. M., & Baliga, B. J. (2011, August).

By: A. Ozbek n & B. Baliga  n

co-author countries: United States of America πŸ‡ΊπŸ‡Έ
author keywords: Tunneling coefficient; GaN; Leakage current; Schottky barrier; Defects
Source: Web Of Science
Added: August 6, 2018

2011 journal article

A New Edge Termination Technique for High-Voltage Devices in 4H-SiC-Multiple-Floating-Zone Junction Termination Extension

IEEE ELECTRON DEVICE LETTERS, 32(7), 880–882.

By: W. Sung n, E. Van Brunt n, B. Baliga n & A. Huang n

co-author countries: United States of America πŸ‡ΊπŸ‡Έ
author keywords: Edge termination; junction termination extension (JTE); PiN diode; 4H-SiC
Source: Web Of Science
Added: August 6, 2018

2011 journal article

Planar Nearly Ideal Edge-Termination Technique for GaN Devices

IEEE ELECTRON DEVICE LETTERS, 32(3), 300–302.

By: A. Ozbek n & B. Baliga  n

co-author countries: United States of America πŸ‡ΊπŸ‡Έ
author keywords: Breakdown voltage; edge termination; GaN; Schottky diode
Source: Web Of Science
Added: August 6, 2018