Analytical Instrumentation Facility - 2000

Neves, B. R. A., Salmon, M. E., Leonard, D. N., Troughton, E. B., & Russell, P. E. (2000). Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy. In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 367–368). Bristol: Institute of Physics Publishing.

Hunter, J. L., Bates, T. B., Patel, S. B., Loesing, R., Guraynov, G., & Griffis, D. P. (2000). Optimization of SIMS analysis conditions for ultra-shallow phosphorus and arsenic implants. In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 327–328). Bristol: Institute of Physics Publishing.

Russell, P. E., Griffis, D. P., Shedd, G. M., Stark, T. J., & Vitarelli, J. (2000). Method for water vapor enhanced charged-particle-beam machining. Washington, DC: U.S. Patent and Trademark Office.

Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. (2000). Thermal stability study of self-assembled monolayers on mica.

Edwards, N. V., Bremser, M. D., Batchelor, A. D., Buyanova, I. A., Madsen, L. D., Yoo, S. D., … Monemar, B. (2000, March 27). Optical characterization of wide bandgap semiconductors. THIN SOLID FILMS, Vol. 364, pp. 98–106. https://doi.org/10.1016/S0040-6090(99)00903-7

Loesing, R., Guryanov, G. M., Hunter, J. L., & Griffis, D. P. (2000). Secondary ion mass spectrometry depth profiling of ultrashallow phosphorous in silicon. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 18, pp. 509–513. https://doi.org/10.1116/1.591222

Phillips, JR, Griffis, D. P., & Russell, P. E. (2000). Channeling effects during focused-ion-beam micromachining of copper. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 18, pp. 1061–1065. https://doi.org/10.1116/1.582300