Analytical Instrumentation Facility - 2006

Sivasubramani, P., Lee, T. H., Kim, M. J., Kim, J., Gnade, B. E., Wallace, R. M., … Griffis, D. P. (2006). Thermal stability of lanthanum scandate dielectrics on Si(100). APPLIED PHYSICS LETTERS, 89(24). https://doi.org/10.1063/1.2405418

Salman, F., Zhang, P., Chow, L., & Stevie, F. A. (2006). Diffusion profiles of low dosages chromium ions implanted into (100) crystalline silicon. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Vol. 9, pp. 62–65. https://doi.org/10.1016/j.mssp.2006.01.010

Salman, F., Chow, L., Chai, B., & Stevie, F. A. (2006). Diffusion behavior of implanted Li ions in GaN thin films studied by secondary ion mass spectrometry. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Vol. 9, pp. 375–379. https://doi.org/10.1016/j.mssp.2006.01.020

Gu, C. J., Stevie, F. A., Hitzman, C. J., Saripalli, Y. N., Johnson, M., & Griffis, D. P. (2006, July 30). SIMS quantification of matrix and impurity species in AlxGa1-xN. APPLIED SURFACE SCIENCE, Vol. 252, pp. 7228–7231. https://doi.org/10.1016/j.apsusc.2006.02.148

Harton, S. E., Stevie, F. A., Griffis, D. P., & Ade, H. (2006, July 30). SIMS depth profiling of deuterium labeled polymers in polymer multilayers. APPLIED SURFACE SCIENCE, Vol. 252, pp. 7224–7227. https://doi.org/10.1016/j.apsusc.2006.02.146

Harton, S. E., Stevie, F. A., & Ade, H. (2006). Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry. JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 17(8), 1142–1145. https://doi.org/10.1016/j.jasms.2006.03.018

Gu, C., Stevie, F. A., Bennett, J., Garcia, R., & GriffiS, D. P. (2006, July 30). Back side SIMS analysis of hafnium silicate. APPLIED SURFACE SCIENCE, Vol. 252, pp. 7179–7181. https://doi.org/10.1016/j.apsusc.2006.02.099

Harton, S. E., Stevie, F. A., & Ade, H. (2006). Investigation of the effects of isotopic labeling, at a PS/PMMA interface using SIMS and mean-field theory. MACROMOLECULES, 39(4), 1639–1645. https://doi.org/10.1021/ma052236z

Harton, S. E., Stevie, F. A., Zhu, Z., & Ade, H. (2006). Carbon-13 labeled polymers: An alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry. ANALYTICAL CHEMISTRY, 78(10), 3452–3460. https://doi.org/10.1021/ac060133o

Wagner, B. P., Reitmeier, Z. J., Park, J. S., Bachelor, D., Zakharov, D. N., Liliental-Weber, Z., & Davis, R. F. (2006). Growth and characterization of pendeo-epitaxial GaN(11(2)over-bar0) on 4H-SiC(11(2)over-bar0) substrates. JOURNAL OF CRYSTAL GROWTH, 290(2), 504–512. https://doi.org/10.1016/j.jcrysgro.2006.02.011