Analytical Instrumentation Facility - 2008

Stevie, F. A., & Griffis, D. P. (2008). Quantification in dynamic SIMS: Current status and future needs. APPLIED SURFACE SCIENCE, 255(4), 1364–1367. https://doi.org/10.1016/j.apsusc.2008.05.041

Bishop, S. M., Reynolds, C. L., Jr., Liliental-Weber, Z., Uprety, Y., Ebert, C. W., Stevie, F. A., … Davis, R. F. (2008). Sublimation growth of an in-situ-deposited layer in SiC chemical vapor deposition on 4H-SiC(1 1 (2)over-bar 0). JOURNAL OF CRYSTAL GROWTH, 311(1), 72–78. https://doi.org/10.1016/j.jcrysgro.2008.09.200

Zhu, Z. M., Stevie, F. A., & Griffis, D. P. (2008). Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam. Applied Surface Science, 254(9), 2708–2711. https://doi.org/10.1016/j.apsusc.2007.10.008