Analytical Instrumentation Facility - 2010

Penley, C., Stevie, F. A., Griffis, D. P., Siebel, S., Kulig, L., & Lee, J. (2010). Secondary ion mass spectrometry characterization of anomalous behavior for low dose ion implanted phosphorus in silicon. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 28(3), 511–516. https://doi.org/10.1116/1.3406141

Shi, M., Lane, B., Mooney, C. B., Dow, T. A., & Scattergood, R. O. (2010). Diamond tool wear measurement by electron-beam-induced deposition. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 34(4), 718–721. https://doi.org/10.1016/j.precisioneng.2010.03.009

Wong, K. C., Haslauer, C. M., Anantharamaiah, N., Pourdeyhimi, B., Batchelor, A. D., & Griffis, D. P. (2010). Focused Ion Beam Characterization of Bicomponent Polymer Fibers. MICROSCOPY AND MICROANALYSIS, 16(3), 282–290. https://doi.org/10.1017/s1431927610000115

Ciovati, G., Myneni, G., Stevie, F., Maheshwari, P., & Griffis, D. (2010). High field Q slope and the baking effect: Review of recent experimental results and new data on Nb heat treatments. PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS, 13(2). https://doi.org/10.1103/physrevstab.13.022002