Analytical Instrumentation Facility - 2013

Santeufemio, C., Gorman, B. P., Zhou, C., Giannuzzi, L. A., & Stevie, F. A. (2013). TOF SIMS analyses of stray Ga during FIB milling. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 31(6). https://doi.org/10.1116/1.4825403

ChiuHuang, C.-K., Zhou, C., & Huang, H.-Y. S. (2013). Exploring lithium-ion intensity and distribution via a Time-of-Flight Secondary Ion Mass Spectroscopy. ASME 2013 International Mechanical Engineering Congress & Exposition. https://doi.org/10.1115/imece2013-63013

Stevie, F. A., Maheshwari, P., Pierce, J. M., Adekore, B. T., & Griffis, D. P. (2013, January). SIMS analysis of zinc oxide LED structures: quantification and analysis issues. SURFACE AND INTERFACE ANALYSIS, Vol. 45, pp. 352–355. https://doi.org/10.1002/sia.4919

Wang, H.-N., Dhawan, A., Du, Y., Batchelor, D., Leonard, D. N., Misra, V., & Vo-Dinh, T. (2013). Molecular sentinel-on-chip for SERS-based biosensing. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 15(16), 6008–6015. https://doi.org/10.1039/c3cp00076a

LeCompte, M. A., Batchelor, D., Demitroff, M. N., Vogel, E. K., Mooney, C., Rock, B. N., & Seidel, A. W. (2013). Reply to Boslough: Prior studies validating research are ignored.