Analytical Instrumentation Facility - 2015 Lomenzo, P. D., Takmeel, Q., Zhou, C. Z., Chung, C. C., Moghaddam, S., Jones, J. L., & Nishida, T. (2015). Mixed Al and Si doping in ferroelectric HfO2 thin films. Applied Physics Letters, 107(24). Stevie, F. A. (2015). SRF Niobium Characterization Using SIMS and FIB-TEM. SCIENCE AND TECHNOLOGY OF INGOT NIOBIUM FOR SUPERCONDUCTING RADIO FREQUENCY APPLICATIONS, Vol. 1687. https://doi.org/10.1063/1.4935321 Lomenzo, P. D., Takmeel, Q., Zhou, C., Fancher, C. M., Lambers, E., Rudawski, N. G., … Nishida, T. (2015). TaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin films. JOURNAL OF APPLIED PHYSICS, 117(13). https://doi.org/10.1063/1.4916715 Mahaney, W. C., Krinsley, D. H., Allen, C. C. R., Ditto, J., Langworthy, K., Batchelor, A. D., … Hancock, R. G. V. (2015). Reassessment of the microbial role in Mn-Fe nodule genesis in Andean paleosols. Geomicrobiology Journal, 32(1), 27–41.