Analytical Instrumentation Facility

Works Published in 2000

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Displaying all 7 works

Sorted by most recent date added to the index first, which may not be the same as publication date order.

2000 chapter

Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy

In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 367–368). Bristol: Institute of Physics Publishing.

By: B. Neves, M. Salmon, D. Leonard, E. Troughton & P. Russell

Ed(s): D. Williams & R. Shimizu

Source: NC State University Libraries
Added: August 6, 2018

2000 chapter

Optimization of SIMS analysis conditions for ultra-shallow phosphorus and arsenic implants

In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 327–328). Bristol: Institute of Physics Publishing.

By: J. Hunter, T. Bates, S. Patel, R. Loesing, G. Guraynov & D. Griffis

Ed(s): D. Williams & R. Shimizu

Source: NC State University Libraries
Added: August 6, 2018

2000 patent

Method for water vapor enhanced charged-particle-beam machining

Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis, G. Shedd, T. Stark & J. Vitarelli

Source: NC State University Libraries
Added: August 6, 2018

2000 personal communication

Thermal stability study of self-assembled monolayers on mica

By: B. Neves, M. Salmon, P. Russell & E. Troughton

Source: NC State University Libraries
Added: August 6, 2018

2000 article

Optical characterization of wide bandgap semiconductors

Edwards, N. V., Bremser, M. D., Batchelor, A. D., Buyanova, I. A., Madsen, L. D., Yoo, S. D., … Monemar, B. (2000, March 27). THIN SOLID FILMS, Vol. 364, pp. 98–106.

By: N. Edwards*, M. Bremser n, A. Batchelor n, I. Buyanova *, L. Madsen*, S. Yoo n, T. Welhkamp, K. Wilmers* ...

author keywords: GaN; strain; valence bands; reflectance; excitons; reciprocal space analysis; spectroscopic ellipsometry
Source: Web Of Science
Added: August 6, 2018

2000 article

Secondary ion mass spectrometry depth profiling of ultrashallow phosphorous in silicon

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 18, pp. 509–513.

By: R. Loesing n, G. Guryanov n, J. Hunter & D. Griffis n

UN Sustainable Development Goal Categories
7. Affordable and Clean Energy (OpenAlex)
Source: Web Of Science
Added: August 6, 2018

2000 article

Channeling effects during focused-ion-beam micromachining of copper

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 18, pp. 1061–1065.

By: . Phillips n, D. Griffis n & P. Russell n

Source: Web Of Science
Added: August 6, 2018

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