Analytical Instrumentation Facility

College of Engineering

Works Published in 2000

Sorted by most recent date added to the index first, which may not be the same as publication date order.

2000 chapter

Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy

In Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 367–368). Bristol: Institute of Physics Publishing.

By: B. Neves, M. Salmon, D. Leonard, E. Troughton & P. Russell

Source: NC State University Libraries
Added: August 6, 2018

2000 chapter

Optimization of SIMS analysis conditions for ultra-shallow phosphorus and arsenic implants

In Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 327–328). Bristol: Institute of Physics Publishing.

By: J. Hunter, T. Bates, S. Patel, R. Loesing, G. Guraynov & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2000 patent

Method for water vapor enhanced charged-particle-beam machining

Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis, G. Shedd, T. Stark & J. Vitarelli

Source: NC State University Libraries
Added: August 6, 2018

2000 personal communication

Thermal stability study of self-assembled monolayers on mica

By: B. Neves, M. Salmon, P. Russell & E. Troughton

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Optical characterization of wide bandgap semiconductors

Thin Solid Films, 364(1-2), 98–106.

By: N. Edwards, M. Bremser, A. Batchelor, I. Buyanova, L. Madsen, S. Yoo, T. Welhkamp, K. Wilmers ...

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Secondary ion mass spectrometry depth profiling of ultrashallow phosphorous in silicon

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 18(1), 509–513.

By: R. Loesing, G. Guryanov, J. Hunter & D. Griffis

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Channeling effects during focused-ion-beam micromachining of copper

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 18(4), 1061–1065.

Source: NC State University Libraries
Added: August 6, 2018