College of Engineering
Displaying all 7 works
Sorted by most recent date added to the index first, which may not be the same as publication date order.
2000 chapter
Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy
In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 367–368). Bristol: Institute of Physics Publishing.
Ed(s): D. Williams & R. Shimizu
2000 chapter
Optimization of SIMS analysis conditions for ultra-shallow phosphorus and arsenic implants
In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 327–328). Bristol: Institute of Physics Publishing.
Ed(s): D. Williams & R. Shimizu
2000 patent
Method for water vapor enhanced charged-particle-beam machining
Washington, DC: U.S. Patent and Trademark Office.
2000 personal communication
Thermal stability study of self-assembled monolayers on mica
2000 article
Optical characterization of wide bandgap semiconductors
Edwards, N. V., Bremser, M. D., Batchelor, A. D., Buyanova, I. A., Madsen, L. D., Yoo, S. D., … Monemar, B. (2000, March 27). THIN SOLID FILMS, Vol. 364, pp. 98–106.
2000 article
Secondary ion mass spectrometry depth profiling of ultrashallow phosphorous in silicon
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 18, pp. 509–513.
2000 article
Channeling effects during focused-ion-beam micromachining of copper
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 18, pp. 1061–1065.
