Analytical Instrumentation Facility
College of Engineering
Works Published in 2006
Displaying all 10 works
Sorted by most recent date added to the index first, which may not be the same as publication date order.
2006 journal article
Thermal stability of lanthanum scandate dielectrics on Si(100)
APPLIED PHYSICS LETTERS, 89(24).
Sources: Web Of Science, ORCID
Added: August 6, 2018
2006 article
Diffusion profiles of low dosages chromium ions implanted into (100) crystalline silicon
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Vol. 9, pp. 62–65.
author keywords: Cr; Si; SIMS; diffusion; ion implantation
Source: Web Of Science
Added: August 6, 2018
2006 article
Diffusion behavior of implanted Li ions in GaN thin films studied by secondary ion mass spectrometry
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Vol. 9, pp. 375–379.
author keywords: GaN; diffusion; SIMS
Source: Web Of Science
Added: August 6, 2018
2006 article
SIMS quantification of matrix and impurity species in AlxGa1-xN
Gu, C. J., Stevie, F. A., Hitzman, C. J., Saripalli, Y. N., Johnson, M., & Griffis, D. P. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7228–7231.
author keywords: SIMS; aluminum gallium nitride (AlGaN); quantification; calibration curve
Source: Web Of Science
Added: August 6, 2018
2006 article
SIMS depth profiling of deuterium labeled polymers in polymer multilayers
Harton, S. E., Stevie, F. A., Griffis, D. P., & Ade, H. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7224–7227.
author keywords: depth profiling; polymers; SIMS; thin films
Source: Web Of Science
Added: August 6, 2018
2006 journal article
Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 17(8), 1142–1145.
MeSH headings : Carbon Isotopes / chemistry; Isotope Labeling / methods; Organic Chemicals / chemistry; Polymethyl Methacrylate / chemistry; Polystyrenes / chemistry; Reproducibility of Results; Sensitivity and Specificity; Spectrometry, Mass, Electrospray Ionization / methods
link.springer.com (publisher PDF)
Source: Web Of Science
Added: August 6, 2018
2006 article
Back side SIMS analysis of hafnium silicate
Gu, C., Stevie, F. A., Bennett, J., Garcia, R., & GriffiS, D. P. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7179–7181.
author keywords: SIMS; high-k dielectrics; back side analysis; hafnium silicate
Sources: Web Of Science, ORCID
Added: August 6, 2018
2006 journal article
Investigation of the effects of isotopic labeling, at a PS/PMMA interface using SIMS and mean-field theory
MACROMOLECULES, 39(4), 1639–1645.
Source: Web Of Science
Added: August 6, 2018
2006 journal article
Carbon-13 labeled polymers: An alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry
ANALYTICAL CHEMISTRY, 78(10), 3452–3460.
Source: Web Of Science
Added: August 6, 2018
2006 journal article
Growth and characterization of pendeo-epitaxial GaN(11(2)over-bar0) on 4H-SiC(11(2)over-bar0) substrates
JOURNAL OF CRYSTAL GROWTH, 290(2), 504–512.
author keywords: atomic force microscopy; crystal morphology; surfaces; metalorganic chemical vapor deposition; pendeo-epitaxy; nitrides; semiconducting III-V materials
Source: Web Of Science
Added: August 6, 2018
