Analytical Instrumentation Facility

Works Published in 2006

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Displaying all 10 works

Sorted by most recent date added to the index first, which may not be the same as publication date order.

2006 journal article

Thermal stability of lanthanum scandate dielectrics on Si(100)

APPLIED PHYSICS LETTERS, 89(24).

By: P. Sivasubramani*, T. Lee*, M. Kim*, J. Kim*, B. Gnade*, R. Wallace*, L. Edge*, D. Schlom* ...

UN Sustainable Development Goal Categories
7. Affordable and Clean Energy (OpenAlex)
Sources: Web Of Science, ORCID
Added: August 6, 2018

2006 article

Diffusion profiles of low dosages chromium ions implanted into (100) crystalline silicon

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Vol. 9, pp. 62–65.

By: F. Salman*, P. Zhang*, L. Chow* & F. Stevie n

author keywords: Cr; Si; SIMS; diffusion; ion implantation
UN Sustainable Development Goal Categories
Source: Web Of Science
Added: August 6, 2018

2006 article

Diffusion behavior of implanted Li ions in GaN thin films studied by secondary ion mass spectrometry

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Vol. 9, pp. 375–379.

By: F. Salman*, L. Chow*, B. Chai* & F. Stevie n

author keywords: GaN; diffusion; SIMS
Source: Web Of Science
Added: August 6, 2018

2006 article

SIMS quantification of matrix and impurity species in AlxGa1-xN

Gu, C. J., Stevie, F. A., Hitzman, C. J., Saripalli, Y. N., Johnson, M., & Griffis, D. P. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7228–7231.

By: C. Gu*, F. Stevie*, C. Hitzman, Y. Saripalli*, M. Johnson & D. Griffis*

author keywords: SIMS; aluminum gallium nitride (AlGaN); quantification; calibration curve
Source: Web Of Science
Added: August 6, 2018

2006 article

SIMS depth profiling of deuterium labeled polymers in polymer multilayers

Harton, S. E., Stevie, F. A., Griffis, D. P., & Ade, H. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7224–7227.

By: S. Harton n, F. Stevie n, D. Griffis n & H. Ade n

author keywords: depth profiling; polymers; SIMS; thin films
UN Sustainable Development Goal Categories
Source: Web Of Science
Added: August 6, 2018

2006 journal article

Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry

JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 17(8), 1142–1145.

By: S. Harton n, F. Stevie n & H. Ade n

MeSH headings : Carbon Isotopes / chemistry; Isotope Labeling / methods; Organic Chemicals / chemistry; Polymethyl Methacrylate / chemistry; Polystyrenes / chemistry; Reproducibility of Results; Sensitivity and Specificity; Spectrometry, Mass, Electrospray Ionization / methods
TL;DR: Clear evidence is shown that deuterium labeling does introduce changes in the thermodynamic properties of the system, with the observation of segregation of dPS to an hPS:dPS/hPMMA interface. (via Semantic Scholar)
Source: Web Of Science
Added: August 6, 2018

2006 article

Back side SIMS analysis of hafnium silicate

Gu, C., Stevie, F. A., Bennett, J., Garcia, R., & GriffiS, D. P. (2006, July 30). APPLIED SURFACE SCIENCE, Vol. 252, pp. 7179–7181.

By: C. Gu n, F. Stevie n, J. Bennett*, R. Garcia n & D. GriffiS n

author keywords: SIMS; high-k dielectrics; back side analysis; hafnium silicate
Sources: Web Of Science, ORCID
Added: August 6, 2018

2006 journal article

Investigation of the effects of isotopic labeling, at a PS/PMMA interface using SIMS and mean-field theory

MACROMOLECULES, 39(4), 1639–1645.

By: S. Harton n, F. Stevie n & H. Ade n

UN Sustainable Development Goal Categories
7. Affordable and Clean Energy (OpenAlex)
Source: Web Of Science
Added: August 6, 2018

2006 journal article

Carbon-13 labeled polymers: An alternative tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry

ANALYTICAL CHEMISTRY, 78(10), 3452–3460.

By: S. Harton n, F. Stevie n, Z. Zhu n & H. Ade n

TL;DR: Through normalization of the 13C secondary ion yield to the total C (12C + 13C) ion yield, the observed effects through the PS/PMMA interface can be greatly minimized, thereby significantly improving analysis of polymer films and multilayers using SIMS. (via Semantic Scholar)
UN Sustainable Development Goal Categories
Source: Web Of Science
Added: August 6, 2018

2006 journal article

Growth and characterization of pendeo-epitaxial GaN(11(2)over-bar0) on 4H-SiC(11(2)over-bar0) substrates

JOURNAL OF CRYSTAL GROWTH, 290(2), 504–512.

By: B. Wagner*, Z. Reitmeier*, J. Park*, D. Bachelor*, D. Zakharov, Z. Liliental-Weber, R. Davis*

author keywords: atomic force microscopy; crystal morphology; surfaces; metalorganic chemical vapor deposition; pendeo-epitaxy; nitrides; semiconducting III-V materials
Source: Web Of Science
Added: August 6, 2018

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